Bruker has announced the release of its next-generation benchtop ContourX 3D Optical Profilometers for gage-capable surface texture and roughness metrology in R&D and manufacturing environments. The white light interferometry (WLI) platform features Bruker’s new USI mode, a universal scanning mode that automatically determines the optimal measurement parameters for best metrology results, as well as Advanced PSI mode for lower-noise mea...

Bruker Corporation and Digital Surf today announced that Bruker Nano Surfaces is offering Vision64 Mapdata analysis and reporting software with its entire line of 3D optical microscope systems. Vision64 Mapis is an extension to Bruker’s Vision64 instrument control and analysis software, and is based on Digital Surf’s Mountains Technology software platform. 

Bruker Corporation and Digital Surf have announced that Bruker Nano Surfaces is offering Vision64 Mapdata analysis and reporting software with its entire line of 3D optical microscope systems. Vision64 Mapis an extension to Bruker’s industry-leading Vision64 instrument control and analysis software and is based on Digital Surf’s Mountains Technology software platform.

Bruker announced today that it has already received more than $7 million in orders for its new Bruker SP9900+ high-throughput high density interconnect (HDI) substrate metrology system, and has begun shipping the product in volume. The SP9900+ Large Format 3D Optical Microscope is specially designed for the semiconductor packaging industry and offers major advantages over previous generations of optical microscope technology. Dramatic improvement...

Bruker announced today at the 2012 Materials Research Society (MRS) Fall Meeting the release of the unique NanoLens Atomic Force Microscope (AFM) accessory for ContourGT 3D optical microscopes. Designed for fast installation on a new five-position, fully automated turret, the compact NanoLens delivers unprecedented high-resolution imaging capabilities without sacrificing measurement speed in optical modes. With NanoLens, users can perform nanomet...

Bruker Nano Surfaces Division has shipped a Dimension Icon Atomic Force Microscope to the European Technical Centre of the global glass manufacturer NSG Group. The Dimension Icon system is equipped with Bruker’s self-optimizing ScanAsyst Imaging Mode and PeakForce TUNA module to enable unprecedented ease of use in conductivity mapping and other difficult materials characterization.

Bruker announced today that a leading semiconductor supplier has purchased multiple Bruker ContourGT-X 3D optical microscope systems for their packaging factories in Asia and North America to support copper wire bond inspection and process control needs.

Bruker today announced the release of the first turnkey solution for Li battery electrochemical atomic force microscopy research. The new EC-AFM accessory adds a sealed electrochemical cell specifically designed for battery research and turnkey 1 parts per million environmental control to the industry-leading Dimension IconR AFM platform to enable long-term in situ studies of Li battery electrodes.