Advantest Europe GmbH
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Germany - +49-89-99312-131
- https://www.advantest.com/
- +49-89-99312-108
Advantest Europe GmbH Articles
Duo develop STT-MRAM testing module
A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems (pictured), led by Tetsuo Endoh has successfully developed a high-speed, high-precision module that can measure the switching currents in the memory arrays of spin-transfer torque magnetic random access memory (STT-MRAM) in units of microamperes and nanoseconds, using an Advantest memory test system.
Duo ally on semiconductor test software initiative
Test Systems Strategies (TSSI), and Advantest CloudTesting Service (CTS), have announced a new software module to convert electronic design automation (EDA) formats (e.g., VCD, EVCD, WGL, STIL) to the Advantest CTS CX1000 platform.
Parametric tester meets 28nm to 3nm process node needs
Leading semiconductor test equipment supplier Advantest has released its V93000 SMU8 parametric tester to meet chip makers’ process-characterisation and monitoring needs for the exacting measurements required on the 28nm to 3nm process nodes and beyond.
Parallel testing for NAND flash memories gets a boost
Two additional members of its next-generation B6700 family of burn-in memory testers have been announced by Advantest. The B6700L and B6700S models are designed to lower the cost of test while boosting the parallel testing capacity for NAND flash memories now in high demandfor server and mobile data-storage applications.
Comprehensive test solutions on parade at ITC 2018
Hardware, software and online test solutions will be showcased by Advantest at the 2018 International Test Conference (ITC) in Phoenix (October 28-November 2). Demonstrations of its on-demand CloudTesting Service, the latest capabilities of its EVA100 analogue/mixed-signal IC test solution, a novel facial-recognition tool that combines cloud and real-time edge-computing artificial intelligence (AI) and a new tool for power profiling devices under...
Market demand prompts next-generation memory tester
A next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle has been unveiled by Advantest. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test.
VOICE 2019 opens Call for Papers
Advantest has opened the call for papers for the international VOICE 2019 Developer Conference, focusing on innovative test solutions and best practices using the V93000 and T2000 system-on-chip (SoC) test platforms as well as Advantest memory testers and handler solutions.
Smart Scale Tester for upcoming generation of server processors
Semiconductor test equipment supplier, Advantest Corporation, has installed its 3,000th V93000 Smart Scale test system for use by its long-term customer AMD, in evaluating AMD Ryzen, AMD Radeon and AMD EPYC compute, graphics and data centre products.
E-beam lithography system features at MNE show
Leading semiconductor test equipment supplier Advantest will feature its F7000 EB (electron beam) lithography system and other nanotechnology-ready equipment at the Micro and Nanoengineering (MNE) show in Copenhagen (September 25-27). The MNE program and exhibition covers current and relevant activities in micro- and nanoengineering.
Expanded global attendance breaks conference records
The VOICE 2018 Developer Conference staged by Advantest has set new records with 177 submitted abstracts representing contributions from 13 countries. In addition to more than 90 technical presentations, VOICE 2018 featured informative Partners’ Expos, highly rated keynote speakers, 25 interactive technology kiosks and multiple networking opportunities.
Holistic test solution streamlines SSD transition
A fully integrated test solution for developing, debugging and mass producing PCIe Gen 4 solid-state drives (SSD) has been launched by Advantest on the MPT3000 platform. This is the same tester used by manufacturers of PCIe Gen 3, SATA and SAS SSDs. The all-inclusive test solution enables SSD manufacturers to accelerate their newest products’ time to market.
Advantest participates on all fronts at SEMICON West
Leading semiconductor test equipment supplier Advantest will be active on the exhibit floor, in the technical program and in the classroom at SEMICON West 2018 in San Francisco (July 10-12). Advantest will showcase its new FVI16 floating power VI source, which gives the V93000 single scalable platform the industry’s best VI signal performance.
Scanning electron microscope features in Grenoble
The E3640Multi Vision Metrology Scanning Electron Microscope (MVM-SEM) will be showcased by Advantest at the upcoming European Mask and Lithography Conference in Grenoble (June 18-20). This advanced tool supports pattern measurement for photomasks and other patterned media at dimensions as small as 1Xnm.
Cloud testing service showcased at Malaysia event
Advanced products and services will be featured by Advantest at SEMICON Southeast Asia in Kuala Lumpur, Malaysia (May 22-24). Advantest is a silver sponsor of SEMICON Southeast Asia. Advantest will showcase its evolutionary EVA100 measurement system, which can be used anywhere from engineering to volume-production environments.
Floating power source extends IC test capabilities
Leading semiconductor test equipment supplier Advantest has extended the performance of its V93000 single scalable platform with the FVI16 floating power VI source for testing power and analogue ICs used in automotive, industrial and consumer mobile-charging applications such as the growing e-mobility and rapid charger market.
Memory tester supports DDR5 and LP-DDR5 devices
Semiconductor test equipment supplier Advantest has introduced its T5503HS2 memory tester, a test solution for the fastest memory devices available today as well as next-generation, super-high-speed DRAMs. The new system’s flexibility extends the capabilities of the T5503 product family in the current “super cycle,” of skyrocketing memory market growth.
ADAS sensor test system tops bill at Detroit show
An innovative test solution for semiconductor-based pressure sensors used in advanced driver-assistance systems (ADAS) will be presented by Advantest at SAE’s WCX World Congress in Detroit (April 10-12). Rugged, on-board sensors are in high demand for automotive applications, where their usage ranges from reducing carbon-dioxide emissions to enabling ADAS-enabled vehicles.
Keynote speakers revealed for VOICE 2018
The technical programme and keynote speakers have been announced for Advantest’s VOICE 2018 Developer Conference. The conference will return to San Diego, California (May 15-16) and Hsinchu, Taiwan (May 23) under the unifying theme "Measure the Connected World and Everything in It.”
Automotive sensors test system heads to Detroit
An advanced test solution for microelectronic pressure sensors used in making advanced driver-assistance systems (ADAS) for the global automotive market will be exhibited by Advantest during the ADAS Sensors 2018 conference in Detroit-Dearborn (April 4-5).
Silicon validation alternative ready for Dresden DATE
CloudTesting Services (CTS) will be showcased by Advantest at DATE 2018, the European event for electronic systems design and test in Dresden (March 19-23). The CTS test solution offers the latest high-quality test methods utilising on-demand IPs, characterisation tools, analysis and more.