OpenATE announces the PE16A and the PEMU32 self-contained IC tester modules

The PE16A offers 16 programmable input or output channels, along with 2 PMU and 2 DPS resources. Programmable I/O levels per channel range from -1V to +7V, with test rates up to 50MHz, 16 timing sets, 16 formatter sets, 2 driver edges and 2 strobe edges. For test circuit control, 16 relay control bits are provided. In addition, the PE16A has a deep pattern memory of 64M to support the data volume required for testing complex devices. A single PE16A module installed in a PXI chassis can serve as a complete IC test system in the engineering lab or for production. Possible applications include consumer electronic functional testing, automatic test equipment (ATE), digital pattern generation, power management device testing, hybrid, digital IC testing and many others.

The PEMU32 is a combo module with a high voltage PMU, a DPS, and a dynamic digital pin electronic card. I/O levels range from -1V to +10V per channel, with 32 PMU or 4 DPS channels per board. The PMUs may be ganged in groups as large as 8 channels, to serve as a high current DPS. Test rates can run as high as 10 MHz. The PEMU32 offers 4 timing sets, 1 formatter set, 2 driver TG edges and 2 Strobe TG edges. These provide the flexibility necessary for creation of complex bus cycles and waveforms need for board test and black-box test. In addition, the PEMU32 offers 32M of on-board vector memory and 32M of digital capture memory, useful for ADC testing, KGD (known good die) data capture, or fail data capture.

Engineers can use one PEMU32 module in a PXI chassis to implement a complete IC tester for engineering lab or production use. The applications of PEMU32 include consumer digital functional test, open and shorts testing, automatic test equipment (ATE), digital pattern generation, power management device testing, hybrid and digital IC testing.