Test & Measurement

ULx for NI LabVIEW and 64-bit drivers Enhance Productivity for Measurement Computing Data Acquisition Users

9th March 2010
ES Admin
0
Measurement Computing Corporation (MCC), the market leader of value-priced data acquisition hardware and software, today announced the release of MCC DAQ Software CD version 6.0 with 64-bit drivers and ULx (Universal Library Extensions) for National Instruments LabVIEW.
Measurement Computing Corporation (MCC), the market leader of value-priced data acquisition hardware and software, today announced the release of MCC DAQ Software CD version 6.0 with 64-bit drivers and ULx (Universal Library Extensions) for National Instruments LabVIEW.



LabVIEW programmers using Measurement Computing data acquisition devices will benefit from a new library of virtual instruments (VIs) and example programs for application development. The new ULx for LabVIEW offers easy-to-use support for LabVIEW versions 8.2.1 and later.



Additional Software Included

Measurement Computing provides complimentary installation, configuration, and measurement software so that customers can get up and running quickly and easily. The MCC DAQ Software CD version 6.0 includes:



* InstaCal – Installation, calibration and test utility

* Universal Library™ – Programming libraries and components for developing 32-bit applications using Windows programming languages. Includes 64-bit driver support for Microsoft™ Windows® 7 and Vista™

* TracerDAQ® – Virtual instrument application suite with strip chart, oscilloscope, function generator, and rate generator. Provides easy export to Excel®

* ULx for LabVIEW – Library of virtual instruments (VIs) and example programs for use with National Instruments LabVIEW Version 8.2.1 and later. UL for LabVIEW is available for LabVIEW Version 6.0 through 8.2



The complimentary MCC DAQ Software CD version 6.0 is available for download from the Measurement Computing website ( www.mccdaq.com) and ships with most Measurement Computing hardware products.

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier