Test solution meets MIPI Alliance D-PHY v.2.0 spec

15th February 2017
Source: Tektronix
Posted By : Mick Elliott
Test solution meets  MIPI Alliance D-PHY v.2.0 spec

What is claimed to be the industry’s first receiver test solution with 100 percent coverage of the MIPI Alliance’s recently released D-PHY v.2.0 specification along with full support for the C-PHY v1.1 receiver test specification has been released by Tektronix. MIPI designers, such as those working on autonomous driving systems or in-vehicle infotainment, can now access simplified PHY receiver test set up and faster test execution combined with industry leading signal fidelity and flexible support for in-depth debug and margin testing.

This solution expands Tektronix’ extensive portfolio of MIPI PHY transmitter and receiver and protocol test solutions for its industry leading real-time oscilloscopes, arbitrary waveform generators and BERTScope bit error rate testers. 

MIPI standards continue to evolve quickly to support consumer demands for ever more powerful devices.

In addition, the latest high-speed MIPI standards are seeing broad adoption in the automotive sector for applications ranging from self-driving cars to vehicle telematics. Receiver testing has emerged as one of the more difficult challenges due to increased complexity, higher speeds, different data rates and modes (HS, LP, HS-LP) and backward compatibility requirements.

“In highly competitive sectors like automotive and mobile, engineering teams face uncommon challenges to bring highly differentiated solutions to market while demonstrating compliance to increasingly complex standards,” said Brian Reich, general manager, Performance Oscilloscopes, Tektronix. “With our industry leading signal generators and oscilloscopes and advanced software support for the latest MIPI standards, we are giving our customers the compliance testing and debug tools they need to meet these challenges.”

The latest Tektronix MIPI receiver test solutions consist of DPHYXpress and CPHXpress software packages running on AWG70000 Series arbitrary waveform generators.

These solutions offer excellent signal fidelity with up to 50 GS/s sampling rate and 10-bit vertical resolution.

The software gives users full control to change receiver test parameters such as rise time, amplitude, jitter, setup/hold time for CLK, skew, noise, duty cycle distortion and more. It also allows users to de-embed cable effects using a direct synthesis method.

To reduce test times, the applications offer a batch mode for receiver margin testing to easily create and replay libraries of complied stress waveforms with different jitter and noise parameters.

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