Source measure unit cuts test costs
National Instruments NI PXIe-4139 system source measure unit (SMU) is a high-performance addition to the company’s SMU portfolio. This SMU can reduce overall cost of test and accelerate time to market for test engineers in a broad range of industries, from semiconductor to automotive and consumer electronics.
The SMU features NI SourceAdapt technology to help engineers produce optimal SMU response to any load by customising the SMU control loop. This protects devices under test and improves system stability.
Additionally, the NI PXIe-4139 system SMU can take measurements at 1.8 MS/s, which is 100X faster than traditional SMUs. This helps reduce test time and offers engineers the ability to capture transient device behaviour without an external scope.Key Features include a 100 fA current measurement sensitivity to precisely characterise high-performance semiconductor devices, and up to 17 SMU channels in 4U 19 in. rack space to minimise test system footprint for high-channel-count systems.
“With the NI PXIe-4139, engineers and scientists get broad IV boundaries, including extended range pulsing capability up to 500 W and sensitivity down to 100 fA, to test a wide range of devices with a single instrument,” said Luke Schreier, Senior Group Manager of Test Systems for National Instruments. “The compact size of the NI PXIe-4139 is also critical. It can reduce system footprint significantly compared with legacy box instrument SMUs.”
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