Test & Measurement

Multitest to Exhibit New Test Solutions at BiTS 2011

15th February 2011
ES Admin
0
Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, will exhibit its leading test solutions in Booth A45 at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, AZ.
At the show, Multitest will showcase the most comprehensive portfolio of contactors on the market. The test socket portfolio covers the widest scope of applications for the full temperature range from -60° to 200°C:

• Bandwidth up to 40 GHz
• High power / high current up to 1,000 A
• KELVIN contactors

The portfolio includes contacting solutions for:
• All handler types
• Leaded and lead-free packages
• Array and in-line packages
• Small-pitch devices down to 0.25 mm
• Singulated test, strip test and WLCSP

The company also will highlight its ATE printed circuit board (PCB) design, fabrication and assembly resources. State-of-the-art production equipment and Multitest’s long-term experience ensure reliable on-time delivery and industry-leading quality for advanced applications such as 0.4 mm pitch. The company’s well-established production process avoids sequential lamination, even for high-layer count boards.

Multitest’s burn-in boards provide the best performance for challenging applications. The burn-in board product line completes Multitest´s portfolio and offers additional cost savings through advanced burn-in test capabilities that simplify costly final test.

Multitest’s Plug & Yield® program ideally leverages the unique, comprehensive product portfolio and the in-depth understanding of the industry’s needs. Total project management, concurrent engineering, as well as engineering and quality control on the system level — rather than on test cell components — result in the best time to market, optimum performance of the overall test cell and highest yield.

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