EuMW 2014: PXI advance speeds load pull tests
European Microwave Week is the platform for Mesuro with support from National Instruments to demonstrate its latest advance in the utilisation of PXI to improve the speed of test for today’s technical demands. The two organisations will demonstrate a load pull set up that uses a traditional passive tuner for fundamental tuning and adds the RAPID PXI digital tuner to provide a high speed harmonic tuning capability.
The demonstration and launch of this expanded capability is designed to provide additional test data for device characterisation customers, whilst improving test time and maximising utilization of existing capital equipment.
The solution uses an ultra low loss diplexer to add the 2nd Harmonic signal to be presented to the device under test, maximising the gamma available at the fundamental frequency provided by the passive tuner.
The demonstration will show how a simple external up/down conversion process can be employed with the RAPID concept, allowing for measurements to be performed at higher frequencies than that offered directly through the PXI hardware.
This architecture offers huge potential benefits to existing device characterisation test customers. The high speed nature of the PXI platform is demonstrated further with 100 second harmonic load points being measured for a single fundamental load in <5 seconds, >20 measurements per second.
Product Spotlight
APV1111GVY
Panasonic
Panasonic PhotoMOS® Photovoltaic MOSFET High-Power Drivers
| SKU: | |
|---|---|
| Stock: | 3490 |
| Cost: | $3.95 |
