Test & Measurement

Anritsu PCT system gets standards body thumbs-up

30th October 2013
Mick Elliott
0

Anritsu says that industry testing standards body the GCF has validated its Protocol Conformance Test system for Rel-10 carrier aggregation, a crucial function in LTE Advanced network operations. Anritsu now has GCF approval for both its Protocol Conformance Test and RF/RRM Conformance Test systems for carrier aggregation.

LTE Advanced is the latest 4G high-speed mobile standard, and is now being deployed by global network operators. It uses carrier aggregation to support higher data rates.

The carrier aggregation function uses several frequency bands as a single band to speed up both peak and average communications speeds, achieving 300 Mbps download speeds, and with the potential to reach 1 Gbps in the future. Global network operators are already deploying LTE services using carrier aggregation in South Korea and the USA in 2013, and other countries will begin implementing the technology soon.

Development of commercial mobile terminals for new LTE Advanced networks requires objective verification that devices satisfy the LTE Advanced standards. This is achieved by running RF/RRM Conformance and Protocol Conformance tests using systems approved for such testing by the GCF and (for North America) the PTCRB test standards body.

Anritsu’s ME7873L RF Conformance Test System and ME7834 Protocol Conformance Test System added support for carrier aggregation earlier in 2013. Now, both have been approved for use in conformance testing by both the GCF and the PTCRB.

In addition to the GCF position, Anritsu has also received the most PTCRB test case approvals for Band2_17 and Band4_17 as used in North America.  Anritsu will continue expanding its number of GCF/PTCRB Carrier Aggregation test case validations to build on the established market leadership position in GCF and PTCRB approvals in protocol, RF and RRM conformance testing for LTE and LTE Advanced.

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier