Test & Measurement

DDR4 BGA probe interposer solution enhances scopes

3rd September 2014
Mick Elliott
0

Keysight Technologies has introduced DDR4 ball-grid array (BGA) probe interposer solutions for its Infiniium Series oscilloscopes. Engineers can use the probes and oscilloscopes for debugging and characterising DDR4 memory designs and testing device compliance with the JEDEC DDR4 standard.

With the introduction of DDR4 memory technology, dynamic random access memory (DRAM) data rates can now reach 3.2 gigatransfers per second. These high data rates make probing memory signals challenging for engineers working on high-speed memory system designs. Keysight’s new DDR4 BGA interposer provides direct access to the balls of the DRAM with low loading and minimal impact on signal integrity allowing engineers to accurately measure DDR4 signals.

The Keysight DDR4 BGA interposers provide signal access points to clock, strobe, data, address and command signals of the DDR4 DRAM for true compliance testing with an oscilloscope.

The DDR4 BGA interposers support different packages. The N2114A x4/x8 BGA interposer provides support for x4 and x8 DRAM packages. The N2115A x16 BGA interposer provides support for x16 DRAM packages. Both models allow connection to the oscilloscopes with high-bandwidth solder-in InfiniiMax II/III probes.

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