Test & Measurement

Collaboration delivers pull-thru adapter

4th May 2015
Mick Elliott
0

The PXI 1149/VPC(x) is a pull-thru adapter, developed by a collaboration between Goepel Electronics and the Peak Group. It ensures outstanding signal quality in the interface between Goepel’s PXI/PXIe SCANFLEX Boundary Scan controllers and test fixtures. It completely eliminates the complication of any kind of manual wiring in the configuration of the interface.

The adapters are designed to improve the integration quality and seamless combination of structural test technologies with functional test in volume manufacturing. As well as the actual JTAG signals the new Pull-Thru adapter offers additional connections for Goepel’s dynamic I/O signals for enhanced handling of all Embedded System Access (ESA) technologies.

It provides the ability to test and program highly complex boards, including on-chip flash programming, with significantly reduced test points, in some cases without the use of traditional test points or probes at all.

The range of 18 different types of supported SCANFLEX controllers extends up to a high performance 4 TAP/80MHz version with Single Ended or Differential Pair Interfaces, so there is one to suit all application requirements.

This new option for the powerful PXI and PXIe based SCANFLEX controllers is fully compatible with the scalable Mass InterConnect system from Virginia Panel Corporation using Pull-Thru Receiver series G20, G20x, G40 and G14x.

With this option, users can combine JTAG/Boundary Scan with the PXI Interface Test Adapter (ITA) solutions from Virginia Panel to create a high performance reliable fixture interface.

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