Test tool enhances analysis veracity for ICT users
FailSim is a new test tool from Digitaltest developed to ensure the quality of a test program when using In-CircuitTesting or Flying Probe Test. The tool simulates defects, providing the real-world test coverage on a live board, and identifying program, debug or, fixture issues that could be reducing fault coverage.
Human error, BOM changes, incorrect data, version errors can all cause reduction in fault coverage. If just one component value has been measured with the wrong parameters, defects can be missed. Other test conditions such as noise produced from surrounding devices can also cause problems and the test quality can no longer be guaranteed.
The FailSim tool eliminates this problem for ICT and Flying Probe users.
FailSim verifies that an existing ICT test detects failures on an UUT by simulating component defects (wrong value) by using HW simulation, by placing additional resistors/capacitors in parallel/series to the DUT (Device Under Test) while checking that the actual test statement detects the failure condition.
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