4060 double-sided flying probe tester now has the ability to test connections on nets that are not completely testable using conventional means by providing “virtual” test points on nets without full access. Test time is reduced due to fewer required probe movements since boundary scan test points can be used to reduce the number of required probe points. Nets that are covered by boundary scan can be excluded from the SPEA test run.
The integration combines the best of in-circuit testing, boundary scan testing and flying probe testing. The system has been optimized in a manner that provides the benefits of a single software interface. The automatic test program generation is able to combine in-circuit and boundary scan test, avoiding any redundancy in the test coverage, thereby further optimizing test time. All of the tests that are covered by boundary scan are no longer performed during in-circuit testing.
With the integration of the 4060 Flying Probe with GOEPEL JTAG/Boundary Scan, the 4060 now supports probe-level integration of GOEPEL’s JTAG/Boundary Scan technology. The boundary scan cells are connected with the 4060 Flying Prober’s digital channels through the test points. During the test, the contacting probe works as an additional, virtual boundary scan cell, enabling the detection of a non-soldered pin. This provides a system approach that supports the test needs for UUTs with both analog and digital test requirements, and results in optimum test coverage.
Datest is a GOEPEL Center of Expertise for engineering and application of JTAG/Boundary scan test solutions.