has issued a Work Item (WI-133) to verify SWP and HCI functionality in mobile handsets. The process of introducing SWP/HCI tests into the GCF certification scheme has been finalised making the test cases available for validation. WI-133 covers test cases specified by ETSI TC SCP WG TEST in TS 102 694-1 (SWP) and TS 102 695-1 (HCI).
Some SWP and HCI test cases defined by ETSI require capabilities for emulating contactless/NFC communication. With its contactless simulation abilities, the UT³ Platform is also prepared to work as a contactless test tool and will also cover test specifications created by the NFC Forum. The advantage of the UT³ Platform is that it combines all necessary contact-based (SWP/HCI) and contactless (NFC) simulation modes in a single device. Thus, the UT³ Platform is COMPRION’s platform for NFC testing according to the NFC Forum Certification Program and is listed as test platform TP 118 for SWP/HCI conformance testing according to GCF and PTCRB certification requirements.
With the validation of the first SWP/HCI test cases by GCF and PTCRB the building blocks for secure NFC applications such as payment have been laid. “We would like to contribute our part to ensuring interoperable NFC services.” says Andreas Bertling, Chairman of ETSI TC SCP WG TEST and Product Manager at COMPRION.