Test & Measurement

Insertion Loss Test System Upgraded To Meet SET2DIL Enhancement

11th June 2013
ES Admin
0
Polar Instruments says that its Atlas Si SET2DIL (Single Ended TDR to Differential > Insertion Loss) insertion loss test system will be upgraded to support Bidirectional SET2DIL from June 2013. This upgrade follows the recent IPC proposal for SET2DIL insertion loss testing to be enhanced with Bidirectional SET2DIL. Polar Instruments’ customers using previous versions of the Atlas Si test system will be offered an upgrade, at no cost, to support Bidirectional SET2DIL testing.
Polar Instruments says that its Atlas Si SET2DIL insertion loss test system will be upgraded to support Bidirectional SET2DIL from June 2013. This upgrade follows the recent IPC proposal for SET2DIL insertion loss testing to be enhanced with Bidirectional SET2DIL. Polar Instruments’ customers using previous versions of the Atlas Si test system will be offered an upgrade, at no cost, to support Bidirectional SET2DIL testing.

“The addition of Bidirectional SET2DIL testing will enable customers to increase the repeatability of microstrip and stripline trace testing,” explains Martyn Gaudion, CEO of Polar Instruments. “The upgraded version of the Atlas test system is also fully compatible with the recent introduction of the Atlas 800 intelligent ESD protection unit, which features both dynamic probe sensing (DPS) and automatic discharge monitoring (ADM) for maximum protection against TDR ESD and EOS.”

The Polar Atlas Si insertion-loss test system enables PCB fabricators to achieve multi-GHz performance using the most economic PCB laminates and enables accurate testing to be carried out, in a fraction of the time of traditional frequency domain testing, by either QA or production-line operators. Atlas Si can be used as a standalone test system or in conjunction with other Polar tools such as the Si9000e for end-to-end management of insertion loss.

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier