Agilent Technologies Announces LTE Wireless Communications Test Set for Manufacturing

18th February 2011
Written by : ES Admin
Agilent Technologies Announces LTE Wireless Communications Test Set for Manufacturing
Agilent Technologies Inc. (NYSE: A) today announced the Agilent EXT wireless communications test set for wireless device manufacturing. The new Agilent EXT includes X-Series Measurement Applications and Sequence Studio software along with enhanced Signal Studio software to support the required testing of existing and emerging communication technologies such as LTE.

Today's explosion in smart phones is driving wireless manufacturers to accelerate their deployment of LTE devices to fulfill increasing user demand for the data capabilities of 3G and 4G.

The EXT wireless communications test set works seamlessly with test modes built into wireless chipsets. This eliminates signaling overhead from the manufacturing test process. It also increases throughput while maintaining the integrity of the test and the quality of the finished product. The EXT offers a revolutionary high-speed measurement sequencer that gives the fastest approach to both calibration and verification of devices in manufacturing test.

Reducing the cost of test while minimizing time from pre-production to full-scale manufacturing is essential for wireless device manufacturers, said Guy Séné, vice president and general manager of Agilent's Microwave and Communications Division. The new EXT test solution plays a pivotal role in helping manufacturers control cost and meet their time-to-market goals.

The Agilent EXT uses Agilent's proven X-Series Measurement Applications which simplify the creation of calibration and verification routines. The Sequence Studio software application, exclusive to the EXT, dramatically reduces the time it takes to develop and troubleshoot the advanced fast-sequencing test code used in non-signaling test techniques. Signal Studio allows test engineers to quickly create standards-compliant waveform files to test the receiver and stimulate the chipset to test the transmitter of wireless devices.

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