Module lowers cost of advanced CMOS image testing
Advantest’s T2000 ISS IPE2 image-processing test module has been developed to apply greater image-processing capabilities to test today’s CMOS image sensors at higher throughput and lower cost. Advanced CMOS image sensors (CIS) are used extensively in today’s smart phones, tablet computers, digital cameras, video camcorders and other high-volume electronic products.
The trend among is toward larger pixel sizes and higher quality images. To improve the cost competitiveness of the consumer electronics using CIS devices, semiconductor test equipment must be able to conduct full test coverage of these devices in less time, resulting in a lower cost of test.
The module is fully compatible with Advantest’s T2000 platform, and it is equipped with a quad-core CPU. This allows the system to dedicate an autonomous image-processing engine to each DUT and reduce test times by up to 46 per cent for leading-edge CIS devices.
The unit is optimised for handling the large pixels and high-quality images inherent in today’s CIS devices. By leveraging high-performance quadcore CPUs and a dedicated data bus architecture, the new unit offers better functionality than its predecessor and the flexibility to test advanced CMOS image sensors. These capabilities enable this test module to address a current industry need and give the system the extendibility to handle future device generations.
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Panasonic PhotoMOS® Photovoltaic MOSFET High-Power Drivers
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