Test & Measurement
Embedded databases make grids smarter
Electrical supply grids are having to become smarter so that they can self-optimise and improve their overall efficiency. Steinar Sande, CEO of database technology specialist company, Raima, explores how embedding controllers around a grid can help measure power flows, demand requirements etc. and leads to real-time management for best performance.
Automotive processors get enhanced debugging support
AUTOSAR is being adopted more and more in automotive electronics. The processors used for executing the AUTOSAR applications and services are more powerful and more complex. Thus there is an increased challenge to manage application complexity, debugging, and function freedom from interference.
electronica to host PCI Express BERT extension demo
A new option for Bit Error Rate Test (BERT) of PCI Express compatible high-speed bus systems was launched at the International Test Conference in Seattle by Goepel Electronic. The option will also be demonstrated at the upcoming electronica exhibition which takes place in Munich (Nov 11-14).
High power interface panel improves connectivity
Trial and error is never a happy path for test engineers to follow, especially so in the case of characterising high power semiconductor devices. It can be time consuming, expensive and unsafe given the high outputs involved in testing power devices. Enhancements to Keithley Instruments’ Parametric Curve Tracer (PTC) configurations that incorporate high power SourceMeter Source Measure Unit (SMU) instruments indicate a new way forward.
Thermal simulation tool cuts product development time
Thermal performance is crucial in electronics designs and getting it wrong can mean a redesign or even a product recall that costs an awful lot of money and damage to reputation. A solution which heads off these problems has been enhanced in Release 9 of 6Sigma ET, a powerful, intuitive and easy-to-learn thermal simulation tool for use by designers of electronic components and products.
I/O cards help speed data logger design
Time to market is the sine qua non for the electronics market – get there before the competition. It is one of the reasons Rapita Systems chose Spectrum I/O cards to create its new RTBx real time, high-speed digital data logger. Dr Guillem Bernat, Chief Executive Officer of Rapita Systems was also attracted by the Spectrum M2i.7000 cards flexibility.
System takes accurate aim at mobile interference
Field engineers and technicians are frequently called upon to identify sources of interference and these can be difficult to pinpoint accurately. Anritsu claims to have made the task easier by introducing mobile interference hunting system that will locate sources of interference more accurately, efficiently, and economically.
High speed data connectors target high speed test
A range of VTAC High Speed Data (HSD) Connectors for the Mass InterConnect systems produced by Virginia Panel Corporation (VPC) target applications including high-speed testing in industries such as telecommunications, military and medical electronics. Designed for use in high-speed testing, the new connectors, and now being made available in the UK by Peek Group, offer data transfer rates of over 10 Gbit/s per differential pair.
Single slot backplane addresses AMC testing
The VT072 single slot backplane from VadaTech is a simple tool for benchtop testing of AMCs. It prevents the requirement of a full MicroTCA chassis for simple power-up and de-bug. Although the backplane is typically used without a chassis, it does come with mounting holes for use within an enclosure.
CyberOptics brings SPI & AOI to Matelec
CyberOptics will exhibit with its representative, Accelonix Iberica, in Booth 4D04 at Matelec 2014, scheduled to take place 28th-31st October at Ifema - Parque Ferial Juan Carlos I in Madrid, Spain. CyberOptics’ flagship 3D SPI system, the SE600, and high-performance QX600 AOI system will be demonstrated at the show.