Test & Measurement

Displaying 351 - 3281 of 2931

63GHz model heads 10-strong oscilloscope family

63GHz model heads 10-strong oscilloscope family
Agilent Technologies has introduced its Infiniium Z-Series oscilloscopes, which can be synchronised to measure up to 40 channels simultaneously with a maximum 63GHz real-time oscilloscope bandwidth (on up to 10 oscilloscopes). With industry-leading noise and jitter measurement floors, the new oscilloscopes enable engineers to effectively test devices that incorporate the newest technologies and achieve new performance milestones.
11th March 2014

Optical spectrum analyser functions sharpened for 600-1700nm wavelength range

Optical spectrum analyser functions sharpened for 600-1700nm wavelength range
The Yokogawa AQ6370D bench top optical spectrum analyser, the successor to the company’s AQ6370C, incorporates a number of new functions designed to enhance its accuracy and analysis capabilities in the 600-1700 nm wavelength range. Newly added functions include data logging, gate sampling, resolution calibration, an advanced marker function and an enhanced auto-sweep mode.
11th March 2014

Programmable pattern generator completes BERT solution

Programmable pattern generator completes BERT solution
Tektronix has unveiled a fully integrated 40Gb/s Programmable Pattern Generator (PPG). This 40Gb/s PPG, along with the previously announced 40Gb/s Programmable Error Detector now comprise a complete 40 Gb/s BERT solution.  With 200 fs Random Jitter (RJ) and 8 ps risetime performance, the Tektronix PPG4001 delivers the performance and signal quality critical for serial data testing at 40Gb/s.
11th March 2014


Versatile LTE analyser adds 2G, 3G, 4G network simulation

GL Communications has enhanced its LTE protocol analysis and emulation tools. The LTE Analyser is capable of capturing, decoding and performing various test measurements across various interfaces over LTE and IMS networks. GL's MAPS - multi-protocol and multi-interface simulation software can be used to simulate almost all elements in the wireless 2G, 3G, and 4G networks.
11th March 2014

100G test module supports CFP4 transceiver modules

Spirent Communications has launched the4-port Spirent dX2 100G test module with support for CFP4 transceiver interfaces. CFP4 refers to the form factor of a new generation of optical transceivers, defined under the CFP Multi-Source Agreement (MSA), supporting the 40Gbit/s and 100Gbit/s interfaces needed to address the ultra-high bandwidth requirements of today and tomorrow’s communication networks.
11th March 2014

Software, debugger collaboration enhances hardware testing

Software, debugger collaboration enhances hardware testing
Tests directly on target hardware with PikeTec‘s TPT model-based software tool are now possible as a result of coupling with the PLS (Programmierbare Logik & Systeme) Universal Debug Engine (UDE). The UDE provides the necessary functionality such as connection to the target system, FLASH programming, process control and reading and writing programme data etc. via the standard Component Object Model (COM) interface.
10th March 2014

Test modules meet wide-range modulation challenges

Test modules meet wide-range modulation challenges
Advantest has introduced two new test modules for high-speed, cost-efficient testing of radio-frequency (RF) ICs used in cell phones and wireless LAN devices built to meet 802.11ac and LTE-Advanced mobile communication standards. Both the 32-port WLS32-A module and the 16-port WLS16-A module are fully compatible with Advantest’s T2000 platform.
10th March 2014

Mid-speed 16-bit digitisers cover PCI, PCI Express

Spectrum GmbH has released two new models of its mid-speed 16 bit digitiser line. The new versions M2i.4960 and M2i.4961 are available for PCI/PCI-X and PCI Express and offer two or four synchronous channels with 60 MS/s sampling speed and a bandwidth of 30 MHz. Each channel can be individually switched between single-ended and true differential input mode.
7th March 2014

Probe microphone fits into tight spaces

Probe microphone fits into tight spaces
PCB Piezotronics has launched its new probe microphone for R&D engineers who need to measure sound pressure in confined areas. The probe tip diameter is extremely small measuring 0.050in. (1.3mm) which enables white goods, telephone, headphone, loudspeaker and musical instrument manufacturers to make measurements in small, confined and difficult-to-access areas that cannot be accessed using traditional microphones, which are typically larger.
7th March 2014

Ethernet interface testing extends oscilloscope applications

Ethernet interface testing extends oscilloscope applications
Rohde & Schwarz has expanded the application field of its R&S RTO oscilloscopes to include Ethernet interface testing. The new R&S RTO-K22 and R&S RTO-K23 Ethernet compliance options allow users to perform standard-compliant automated tests on 10/100/1000BASE-T and 10GBASE-T Ethernet interfaces. All compliance tests meet IEEE and ANSI Ethernet test specifications.  
6th March 2014


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