Test & Measurement

Displaying 351 - 3835 of 3485

Processor family gets software debug solution

Engineers designing microserver and other hyperscale workload systems based on the new Intel microarchitecture codenamed Broadwell-DE will be able to debug software and validate high-speed communications interconnects with ASSET InterTech’s SourcePoint and ScanWorks platforms. The first generation of the Intel Xeon Processor D family is based on the microarchitecture previously referred to as Broadwell-DE.
22nd April 2015

Fixture interface expands boundary scan portfolio

Fixture interface expands boundary scan portfolio
A new boundary-scan fixture interface has been added to the Peak Group’s portfolio of automatic test systems based on its partnerships with National Instruments (NI), GOEPEL electronic and Virginia Panel Corporation (VPC).  The new PXI 1149/VPC(x) Pull-Thru receiver ensures an outstanding signal quality in the interface between GOEPEL electronic's PXI/PXIe SCANFLEX Boundary Scan controllers and test fixtures, and completely eliminates the complication of any kind of manual wiring in the configuration of the interface.
22nd April 2015

Software launch expands test library

The latest version of Intepro Systems’ PowerStar test software, PowerStar 6 includes a number of new features designed to make testing even easier including an expanded test library that allows users to “program without coding” Using a simple drag and drop method to create a test program with the convenience and ease of fill-in-the-blank test screens
22nd April 2015


Strain gauges target transducer manufacturers

Strain gauges target transducer manufacturers
To address the growing demand for the sensors needed to manufacture precision transducers, Micro-Measurements has released a series of products built using its Advanced Sensors strain gauge technology. The strain gauges offer a tighter resistance tolerance, improved gauge-to-gauge repeatability and better stability than standard strain gauges, while their advanced fabrication process helps to significantly reduce lead times.
21st April 2015

DOCSIS 3.1 test setups aided by signal generator

 DOCSIS 3.1 test setups aided by signal generator
Transmitting high-definition 4K UHD contents to consumers' households requires large bandwidths. Capacity requirements for IP based services are also on the rise. Enter new broadband technologies such as DOCSIS 3.1. The new DOCSIS 3.1 standard enables data rates of several Gbit/s for IP-based transmissions in cable networks. Rohde & Schwarz is offering the R&S CLGD signal generator for network component development and receiver tests.
20th April 2015

RF analysers target spectrum monitoring applications

RF analysers target spectrum monitoring applications
The NRA series of compact rack-mount RF analysers has been expanded by Narda Safety Test Solutions with the introduction of two new ‘RX’ models, which have been specifically designed for spectrum-monitoring applications. The analysers are ideal for short- and long-term observation of all types of RF signals, including pulsed and sporadic transmissions, and will attract oraganisations including communications authorities, broadcast companies, air-traffic control operators and military intelligence.
20th April 2015

Spectrum analyser measures signals in real-time

Spectrum analyser measures signals in real-time
A full-featured spectrum analyser designed to analyse wireless signals in real-time (not progressively scanned) has been unveiled by Saelig. The feature is essential for seeing intermittent and frequency-hopped signals. The RTSA7500 has all the standard features of a sophisticated, expensive bench-top spectrum analyser, but at lower cost as it uses a PC for the display and processing power.
20th April 2015

Trigger/analysis options upgrade oscilloscopes

Trigger/analysis options upgrade oscilloscopes
Trigger and analysis options have been added by Yokogawa to its DLM2000 (4-channel) and DLM4000 (8-channel) Mixed Signal Oscilloscopes (MSOs) for testing the latest generation of in-vehicle serial buses. The options are specifically designed to address the measurement challenges posed by the CAN FD (CAN with Flexible Data Rate) and SENT (Single Edge Nibble Transmission) bus systems.
17th April 2015

Current probes supply measurements down to 1 mA/div

Current probes supply measurements down to 1 mA/div
The CP030A and CP031A high sensitivity current probes from Teledyne LeCroy provide sensitivity down to 1mA/div allowing users to measure current from the mA range up to a continuous current of 30Arms and peak current of 50A all with the same probe. The probes provide a small form factor for today’s crowded boards.
16th April 2015

Universities to benefit from wireless lab solution

Universities to benefit from wireless lab solution
A wireless lab instrument management solution for quickly setting up and efficiently managing basic electronics engineering laboratories at colleges and universities is available from Farnell element14. The Tektronix TekSmartLab TSL3000A solution supports up to 120 instruments (30 test benches) on a single platform.
16th April 2015


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