Test & Measurement

Displaying 321 - 3390 of 3070

Floating power source opens way to test high voltage ICs

Advantest has extended the capabilities of its V93000 test platform for high-voltage and high-current testing of embedded power devices. It has launched the PVI8 floating power source, which gives the V93000 sufficient power and enough analogue and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs.
3rd July 2014

Hand-held anemometer runs on 9V battery

Hand-held anemometer runs on 9V battery
The newly-released ATS-0345 portable vane anemometer from Advanced Thermal Solutions measures air flow speed, volumetric flow rate, and temperature. The hand-held anemometer provides precise measurements for automotive, aerospace and HVAC studies, fume hoods, air ducts, wind tunnels, and marine applications.
2nd July 2014

Integrated feature enables faster flash programming

Integrated feature enables faster flash programming
XJTAG has pepped up flash programming. XJFlash allows engineers to automatically generate customised programming solutions that can overcome the speed limitations generally associated with using boundary scan to program flash memories connected to FPGAs. It enables up to 50 times faster flash programming.
2nd July 2014


Analyser eases path to power circuit design

Analyser eases path to power circuit design
Agilent Technologies has developed a power device capacitance analyser that automatically characterises power device junction capacitances using real operating voltages. With the increasing use of power devices fabricated from emerging materials like SiC and GaN, switching power supplies are now operating at increasingly higher frequencies.
2nd July 2014

eBook examines JTAG TAP flaws

Visibility into the operations and data stored on circuit boards and in semiconductors is the goal of test and debug. Unfortunately, this is often at odds with the goals of circuit board security. A new eBook published by ASSET InterTech addresses the inherent weaknesses in the IEEE 1149.1 Boundary-Scan (JTAG) standard’s Test Access Port (TAP) found on many circuit boards and chips.
1st July 2014

In-system programming upgraded with AFPG tool

GOEPEL electronic has extended the AFPG (Automated Flash Program Generator) to support all ISP options (In-System Programming) in one tool. The AFPG is a tool for the automatic generation of scripts for universal in-system programming of non-volatile memory such as flash devices, and also microcontrollers with integrated flash, via boundary scan.
1st July 2014

Sound source enables scale model measurements

Sound source enables scale model measurements
A battery-powered speech sound source, designated the Echo Speech Source Type 4720, has been launched by Bruel & Kjaer. The device enables users to measure acoustics within any room or space, make comparisons between one room and another, validate sound systems and perform scale model measurements.  
1st July 2014

Oscilloscopes feature MAUI advanced user interface

Oscilloscopes feature MAUI advanced user interface
Teledyne LeCroy’s new WaveSurfer 3000 series of oscilloscopes feature the MAUI advanced user interface,previously available only on higher-end oscilloscopes. It seamlessly integrates a deep measurement toolset and multi-instrument capabilities into a cutting edge user experience centered on a large 10.1in touch screen, the largest display and only touch screen in this class of oscilloscope.
30th June 2014

USB data acquisition modules boast galvanic isolation

USB data acquisition modules boast galvanic isolation
Data Translation’s DT9626 USB data acquisition series features a 24-bit A/D resolution and a high measurement accuracy along with all the advantages of a dedicated A/D converter for each channel as well as galvanic isolation. The modules are available with 4, 8 or 16 analogue inputs, each providing sampling rates of up to 41.6 kHz.
30th June 2014

Simulation-measurement challenge solved by test bench

Semiconductor companies developing DDR controller IP, those developing DRAM chips and DIMMs, and OEMs integrating the controller and DIMM into a system using PCB technology can now use Agilent Technologies’ Advanced Systems DDR4 Compliance Test Bench for a complete workflow from simulation of a candidate to measurement of the finished prototype.
30th June 2014


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