Test & Measurement

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SO-DIMM sockets suit production applications

SO-DIMM sockets suit production applications
With the new CN111S and CN112S series, Yamaichi is bringing new socket versions for DDR2 and DDR3 SO-DIMM memory modules to the market.  The introductions expand Yamaichi’s family of production use and Test & Burn-in sockets. The two new sockets are for production usage. The CN111S socket was developed especially for modules that meet the DDR2 (Double Data Rate) standard in the SO-DIMM version (Small Outline Dual Inline Memory Module).
18th March 2014

Open top contactor offers manual and automated IC insertion

Open top contactor offers manual and automated IC insertion
Yamaichi Electronics presents the new OpenTop Test Contactor in the YED274 series for BGA/CSP, SOP and QFP IC components.  The new OpenTop Test Contactor from Yamaichi Electronics can be used for manual and automated insertion of semiconductor components. A typical application is the programming of memory ICs.  
18th March 2014

Python programming course targets test engineers

Feabhas has launched a new course for the training of test engineers in the use of the Python programming language for system testing. Python is an easy to learn programming language that is easily readable and has a syntax that allows programmers to express concepts in fewer lines of code than conventional C code.
17th March 2014


Data logger houses DMM with gauge head selector switch

Data logger houses DMM with gauge head selector switch
Rigol Technologies has added a new data acquisition/data logger switch to its product line-up. The M300 combines a digital multimeter (DMM) with a gauge head selector switch. The system can be extended with five plug-ins and optionally with a six and a half digit DMM, 10 different switch and control modules of bipolar switches to matrix cards. For direct connection to a PC or notebook, all relevant interfaces such as LAN (LXI), USB, RS232 and GPIB are available.
17th March 2014

Analyser dispels flicker noise problems

Agilent Technologies has developed the new EEsof EDAE4727A advanced low-frequency noise analyser. It is a next-generation hardware and software system for measurement and analysis of flicker noise, long considered a critical characteristic of electronic devices, and random telegraph noise (RTN).
14th March 2014

Power supply unit extends memory IC test options

Advantest has extended its V93000 capabilities with the DPS128HV module, a high-density device power supply (DPS) unit designed to handle a wide range of operating voltages for testing devices such as eFlash memory ICs. With the new module, Advantest’s V93000 test platform can be easily scaled from low-channel to high-channel configurations to provide the most economical test solution for each specific device under test.
14th March 2014

Handheld analysers cut cost of radar testing

Handheld analysers cut cost of radar testing
Agilent Technologies says that its FieldFox handheld combination analysers offer an easier, more cost-effective solution than benchtop instruments, with the accuracy and functionality required for performing precision radar system performance validation, including maintenance and repair in the field. FieldFox analyser have been developed to reduce cost-of-test while increasing the uptime of mission-critical systems—critical capabilities for modern radar systems.
13th March 2014

63GHz model heads 10-strong oscilloscope family

63GHz model heads 10-strong oscilloscope family
Agilent Technologies has introduced its Infiniium Z-Series oscilloscopes, which can be synchronised to measure up to 40 channels simultaneously with a maximum 63GHz real-time oscilloscope bandwidth (on up to 10 oscilloscopes). With industry-leading noise and jitter measurement floors, the new oscilloscopes enable engineers to effectively test devices that incorporate the newest technologies and achieve new performance milestones.
11th March 2014

Optical spectrum analyser functions sharpened for 600-1700nm wavelength range

Optical spectrum analyser functions sharpened for 600-1700nm wavelength range
The Yokogawa AQ6370D bench top optical spectrum analyser, the successor to the company’s AQ6370C, incorporates a number of new functions designed to enhance its accuracy and analysis capabilities in the 600-1700 nm wavelength range. Newly added functions include data logging, gate sampling, resolution calibration, an advanced marker function and an enhanced auto-sweep mode.
11th March 2014

Programmable pattern generator completes BERT solution

Programmable pattern generator completes BERT solution
Tektronix has unveiled a fully integrated 40Gb/s Programmable Pattern Generator (PPG). This 40Gb/s PPG, along with the previously announced 40Gb/s Programmable Error Detector now comprise a complete 40 Gb/s BERT solution.  With 200 fs Random Jitter (RJ) and 8 ps risetime performance, the Tektronix PPG4001 delivers the performance and signal quality critical for serial data testing at 40Gb/s.
11th March 2014


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