Test & Measurement

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MOI supports USB 2.0 connector, cable assembly test

MOI supports USB 2.0 connector, cable assembly test
Keysight Technologies has published its Method of Implmentation (MOI) document for USB 2.0 connector and cable assembly compliance testing using the ENA Series network analyser’s enhanced time domain analysis option (E5071C-TDR). Developed in the mid-1990s, the USB standard features a number of variants including SuperSpeed USB, also known as USB 3.0, which supports a 5 Gbps transfer rate and offers up to a 10 times performance increase over its predecessor USB 2.0 (Hi-Speed USB).
13th October 2014

Strain gauge can be configured for specific applications

Strain gauge can be configured for specific applications
Aptifirst has the LCA20, an intelligent, rugged, field-mounting strain gauge & load cell amplifier for use in weighing and similar operations. It produces both 4 to 20mA and 0 to 10V analogue outputs from any standard strain gauge input. Ease of calibration and setting of the analogue output range make the unit extremely user-friendly.
13th October 2014

USB data logger handles up to 252.000 temperature readings

A new standalone USB data logger can provide users with more real-time information than any comparable data logger range on the market says Lascar Electronics. The EL-GFX-TC has an on-board dot-matrix display, and it is capable of measuring and storing up to 252,000 temperature readings. The information is resolved to the nearest 0.1 digit, processing data from a single J, K or T-type thermocouple input.
10th October 2014


Vector network analysers cover up to 40GHz

Vector network analysers cover up to 40GHz
“It does what it says on the tin”. That’s how Jonathan Borrill, Anritsu’s Director of Market, EMEA described the company’s new ShockLine family of Vector Network Analysers (VNAs). “We took a step back and decided less is more,” says Borrill. The result is a family of mid-range VNAs at a much lower cost that will handle the basic RF test requirements of an engineer.
10th October 2014

JTAG, AOI solutions readied for electronica showing

JTAG, AOI solutions readied for electronica showing
electronica will provide the platform for a wide range of optical and electrical measuring and testing technologies from GOEPEL electronic. Taking centre stage will be the AOI division, represented by two systems: the solution for high-end inspection in large scale production which bears the name TurboLine. Double-sided inspection without assembly turning and rotatable angled-view are the factors for an even faster testing.
10th October 2014

Oscilloscope probe meets DC power-rail measurement demands

Oscilloscope probe meets DC power-rail measurement demands
Keysight Technologies has launched a high bandwidth, low noise oscilloscope probe for making power integrity measurements to characterise DC power rails. The N7020A power-rail probe specifications are tailored for a wide variety of DC power-rail measurements. Probe specifications include very low noise, a large ± 24-V offset range and 2-GHz bandwidth.
10th October 2014

Vector signal analyser offers up to 765MHz bandwidth

Vector signal analyser offers up to 765MHz bandwidth
NI arrived at European Microwave Week brandishing a new high-performance 26.5 GHz microwave vector signal analyser (VSA) and a fast tuning 20 GHz continuous wave signal generator. The two instruments combine to complement NI’s modular instruments offering and expand the measurement capabilities of the PXI platform.
10th October 2014

VTAC high speed data insert debuts at NIDays

VTAC high speed data insert debuts at NIDays
Peak Group, a National Instruments Alliance Partner, will be participating at NIDay in London (November 4) and will highlight its latest developments in automated test systems as well as test solutions using mass interconnect products from Virginia Panel Corporation (VPC).
9th October 2014

TESSY tool supports LabWindows/CVI

Hitex Development Tools says TESSY version V3.1.9 now supports National Instruments LabWindows/CVI (version 2013 and later). TESSY is a tool for automated unit / module / integration testing of embedded software. Unit and module tests are usually required for safety-critical software according to safety-related standards like IEC 61508.
9th October 2014

electronica 2014: Spectrum analysers, scopes on launch pad

electronica 2014: Spectrum analysers, scopes on launch pad
Rigol Technologies EU will deploy a full range of its products at the upcoming electronica exhibition in Munich. The lineup will include new products including two models of the DSA800 Spectrum Analyser Series. Mixed Signal Oscilloscopes (MSO) and a PC Software to perform standard measurements for example on switching power supplies will also premiere at the show.
9th October 2014


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