Test & Measurement

Displaying 321 - 3469 of 3149

Rohde & Schwarz, Broadcom agree Bluetooth test license

Rohde & Schwarz, Broadcom agree Bluetooth test license
Rohde & Schwarz has signed a Manufacturing Test License (MTL) agreement with Broadcom. Through the MTL agreement, Rohde & Schwarz can provide certified verification test solutions to Broadcom WLAN and Bluetooth customers. The Broadcom Manufacturing Test License agreement is a license and validation program that gives test equipment vendors access to Broadcom WLAN and Bluetooth software tools and Broadcom technical support resources.
3rd September 2014

Test solutions on parade at electronica India

Test solutions on parade at electronica India
GOEPEL electronics will showcase complete solutions for electrical test at this year’s electronica India trade show in Bangalore (Sept 23-25). Key focus is laid on Embedded System Access (ESA) technology. As part of it, GOEPEL electronic will present the ESA Coach, a special evaluation and training kit supporting the ESA technology.
3rd September 2014

VoLTE challenge met with robust methodology

Spirent Communicationshas unveiled its VoLTE Launch Readiness solution. The solution addresses a critical challenge operators launching VoLTE voice and video calling services face - ensuring new VoLTE devices and services will deliver an experience as good or better than legacy and over-the-top (OTT) services.
3rd September 2014


Facility accredited for mobile payment testing

Essen-based CETECOM says that its Milpitas, California facility has been accredited to offer Visa certification testing for payment-enabled cellular phones and other mobile devices. It is the first test lab in the US to be recognised by Visa.
3rd September 2014

Development tools optimised for Qorivva SoCs

Development tools optimised for Qorivva SoCs
Following the launch by Freescale of its latest Qorivva derivates, PLS Programmierbare Logik & Systeme is providing system developers with its Universal Debug Engine (UDE) for the multicore System-on-Chips (SoCs) MPC5746M, MPC5777M, MPC5748G, MPC5746C, MPC77xK and MPC574xP. PLS is one of the first tool suppliers to offer development tools specifically optimised for the features and functions of these multicore SoCs.
3rd September 2014

Femto/picoammeter, electrometer enhance R&D into new materials

Femto/picoammeter, electrometer enhance R&D into new materials
The B2980A Series of graphical femto/picoammeters and electrometers from Keysight Technologies can confidently measure down to 0.01fA which is 0.01 x 10-15A, and up to 10 petaohms (PΩ) which is 10 x 1015Ohms. In recent years, research and development into new materials, such as nanomaterial, graphene, polymers and dielectric material, has increased significantly.
2nd September 2014

EuMW: Microwave T&M range readied for Rome outing

EuMW: Microwave T&M range readied for Rome outing
For Rohde & Schwarz all roads lead to Rome and European Microwave Week (Oct7-9). On its stand just off the Appian Way the German T&M company will demonstrate its expertise across many technologies from signal generation and analysis in the microwave range to power measurement and vector network analysis in the highest frequency ranges. In addition, Rohde & Schwarz specialists will hold 16 workshops and seminars at the event.
2nd September 2014

Spectrum analyser platform extends to 3.2GHz and 7.5GHz

Spectrum analyser platform extends to 3.2GHz and 7.5GHz
Two new high performance high frequency spectrum analysers have enhanced the Rigol Technologies DSA800 series platform. The DSA832 and DSA875 expand the family to 3.2GHz and 7.5 GHz respectively. The new instruments enable direct measurements of higher performance signals and systems.
2nd September 2014

Peak detection added to digitiser cards

Using hardware-based data analysis and reduction technology, Spectrum has created new firmware options that allow its high-speed M4i series digitiser cards to perform peak detection and output the corresponding statistical data. The M4i series cards offer real-time sampling rates of up to 500 MS/s with 14 bit resolution and 250 MS/s with 16 bit resolution. 
1st September 2014

Test system upgrades impedance control on high-speed pcbs

Test system upgrades impedance control on high-speed pcbs
Polar Instruments will preview its next-generation CITS880s Controlled Impedance Test System (CITS) at PCB West 2014 in Santa Clara, California (Sept 10).  The system introduces Launch Point Extrapolation (LPE), enabling PCB fabricators to improve impedance control for the latest high-speed PCBs which use finer trace widths and thinner coppercompared to conventional boards.
1st September 2014


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