Test/Measurement

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Agilent Unveils 28.4Gb/s Multiplexer With Optional De-Emphasis

Agilent Unveils 28.4Gb/s Multiplexer With Optional De-Emphasis
Agilent Technologies introduced a 28.4-Gb/s multiplexer featuring optional de-emphasis with up to eight taps for R&D and test engineers who need to characterise receivers for next-generation servers, storage systems and data-centre networks. The multiplexer expands the pattern generator bit rate of the J-BERT N4903B high-performance bit error ratio tester.
16th July 2013

Satellite System Simulator Runs On Vector Signal Generator

Satellite System Simulator Runs On Vector Signal Generator
Rohde & Schwarz has developed a global navigation satellite system (GNSS) simulator, which runs on its SMBV100A vector signal generator. The SMBV-K101 option allows developers in the automotive and wireless communications industries to test GNSS receivers for specific effects such as obscuration and multipath propagation.
16th July 2013

Agilent DMM Bolsters Premier Farnell Global Instrument Offering

Premier Farnell has added to its Agilent range of digital multimeters (DMM) with the next generation 6½ digit Truevolt. The DMM allows engineers to see their measurement data in new ways, get actionable information faster, and document their results more easily. The Truevolt technology reduces extraneous factors such as noise, injected current and input bias current for increased measurement confidence.
11th July 2013


Advanced Triggering Capability Added to Test Card

Advanced Triggering Capability Added to Test Card
Data Device Corporation (DDC) has added enhanced test and simulation functionality to the BU-67210T cPCI/PXI MIL-STD-1553 test card. In addition to variable output voltage, variable intermessage gap time, and error injection, it now offers enhanced triggering capability that can be used to trigger external devices in real time based on user defined events, making it a highly adaptable solution for production test labs.
10th July 2013

Livingston Offers Calibration Solution For SMEs

Test equipment sourcing specialist Livingston is to rent calibrators from its inventory allowing their customers to calibrate their test equipment. Livingston says that for smaller companies, involved in installation work or serving the industrial space, it is often hard to justify the heavy investment needed for acquiring calibration equipment, as the stock of test instrumentation being held is not enough to ensure regular utilisation of the calibrator.
10th July 2013

Multi-Site Testing Solution Targets Mobile Power-Management ICs

Advantest has entered the market for testing system-on-chip (SoC) mobile power-management ICs (PMIC) using the V93000 platform. Compatible with Advantest’s base of V93000 systems, the new solution can perform multi-site testing of complex SoC devices and single in-line packages (SiP) with embedded power-management cores.
8th July 2013

Anritsu unveil the MS2027C and MS2037C

Anritsu unveil the MS2027C and MS2037C
The MS2027C and MS2037C, the latest two members of the VNA Master handheld vector network analyzer family have been introduced by Anritsu. The new VNA Masters are ideal for demanding field use environments, including aerospace and defense, Satellite Communications, commercial wireless backhaul, and research.
8th July 2013

PC-Based Oscilloscope Competes on Price, Portability

PC-Based Oscilloscope Competes on Price, Portability
The PicoScope 9300 Series Sampling Oscilloscopes can perform pre-compliance tests, fault-finding, design, debug and margin testing on serial communications signals such as 10 Gb Ethernet, SONET/SDH STM64 and FEC1071, 10x Fibre Channel, and InfiniBand and PCI Express. These two-channel oscilloscopes will replace traditional, full-sized bench-top instruments without compromising on usability, analysis features or accuracy.
1st July 2013

Free Seminar Tackles Curve Tracing Challenges in Power Semiconductors

Keithley Instruments is to offer a free, web-based seminar titled “Testing Modern Power Semiconductor Devices Requires a Modern Curve Tracer.” This event, which is available for on-demand viewing, will discuss the curve tracing challenges posed by today’s power semiconductor devices and will teach viewers how to perform both I-V and high voltage C-V measurements with a modern parametric curve tracer.
27th June 2013

Probe Overcomes Flat Blade Connector Contact Problem

Probe Overcomes Flat Blade Connector Contact Problem
The new P762/G from Peak Test Services is a test probe specifically designed for applications requiring high-current contacting with flat blade connectors. The new probe overcomes the difficulties previously encountered in contacting flat blade connectors with high currents, which result from the fact that the front face does not provide enough contact surface area.
26th June 2013


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