Test/Measurement

Displaying 311 - 3080 of 2770

High-performance test handler for SoC devices

High-performance test handler for SoC devices
Advantest have unveiled the field-upgradable M4871 pick-and-place system. The company's latest test handler for system-on-chip devices, it integrates Advantest’s proven technology from existing product lines with advanced, new functionality including visual alignment with high throughput, and active thermal control using Advantest’s Tri-Temp capability.
27th November 2013

Prospects for software-defined oscilloscopes

The hard economic environment means test engineers have to make the most of what they already have, but how can software help? By Geoff Kempster, Inventory Manager for Livingston UK, & Mike McHale, Livingston's International Sales Director.
27th November 2013

Automated Test Equipment in the Cloud

A revolutionary pay-per-use solution combines semiconductor test with cloud computing technology, offering semiconductor companies access to test capabilities while minimising investment and effort. Stephane Cavazzini, Advantest’s Sales Account Manager for SOC IDM, explores further in this ES Design magazine article.
27th November 2013


Tips to make accurate rise/fall time measurements for radar signals

Output power measurement is one of the basic measurements for a radar system as it determines the performance, range and resolution of the radar system. The most common output power measurements are pulse power, pulse repetition interval, pulse width, and rise and fall times. By: Sook Hua Wong, Product Planner, Agilent Technologies 
26th November 2013

VNA test technology achieves improved antenna performance

The basic principles of, and methods for, measuring antenna performance were established decades ago. So it might appear reasonable for engineers developing or installing RF equipment to assume there is nothing new for them to learn in this field. By Jean-Pierre Guillemet Field Applications Engineer, Anritsu (France)
26th November 2013

Low-cost accelerometer targets many applications

Low-cost accelerometer targets many applications
Measurement Specialties has unveiled the Model 8101, a compact, low-cost accelerometer designed for general purpose vibration measurement. The new plug-and-play piezoelectric linear accelerometer is available in two dynamic ranges, ±40 g and ±160 g, for use in a wide number of applications, as well as in two measurement directions, either an X- or Z-axis configuration.
25th November 2013

High-speed digitiser samples up to 2GS/s

Agilent Technologies has extended its next generation of high-speed digitisers supporting custom on-board signal processing capability with the U5309A 8-bit PCIe digitiser sampling up to 2GS/s. The digitiser and the U5340A FPGA development kit were announced six months ago to address the needs of OEM applications such as mass spectrometry time-of-flight, lidar ranging, pulsed radar and ultrasonic imaging.
25th November 2013

BeiDou/Compass capability added to vector signal generator

Rohde & Schwarz ‘s R&S SMBV100A vector signal generator now has BeiDou/Compass capability in its integrated GNSS simulator. With this option the simulator now covers the BeiDou standard as well as the GPS, Galileo and Glonass satellite navigation systems. With this option the simulator now covers the BeiDou standard as well as the GPS, Galileo and Glonass satellite navigation systems.  
25th November 2013

Peak, Simplicity AI supply test solutions on NI platforms

Peak, Simplicity AI supply test solutions on NI platforms
The Peak Group and Simplicity AI have formed a collaborative partnership to provide integrated test solutions based on National Instruments industry-standard platforms along with Peak’s test hardware and fixturing technology and Simplicity AI’s advanced test & measurement software. Both companies are NI Alliance Partners.
22nd November 2013

PIM analyser covers frequency bands from 698MHz to 2690MHz

PIM analyser covers frequency bands from 698MHz to 2690MHz
The PIM S1L analyser from Link Microtek has been designed to provide R&D laboratories and quality assurance departments with a straightforward means of testing components for passive intermodulation (PIM), which is a particular concern to telecoms companies as it can cause signal degradation and loss of capacity in network infrastructure.
22nd November 2013


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