Test & Measurement

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Software-designed controller simplifies control systems

Software-designed controller simplifies control systems
NI’s CompactRIO software-designed controller uses the latest embedded technologies from Intel and Xilinx and is fully supported by LabVIEW 2014 and NI Linux Real-Time. It is ideal for advanced control and applications in harsh, industrial environments and provides high-performance processing, custom timing and triggering, and data transfer from modular C Series I/O.
8th August 2014

Boundary scan tools feature at automotive test event

Acculogic is taking its powerful suite of PC-based hardware and software tools specially designed for testing of electronic devices, boards and systems using the IEEE1149.1 and IEEE1149.6 standards to the IEEE AUTOTEST 2014 exhibition in St Louis (Sept 15-18).
8th August 2014

Semiconductor test system cuts cost, boosts throughput

PXI-based automated test systems that reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI modules in semiconductor production test environments have been unveiled at NIWeek. The Semiconductor Test Series (STS) can increase throughput and perform both characterisation and production with the same hardware and software tools. This decreases data correlation time and time to market.
7th August 2014


TQPs cover variety of architectures and cross compilers

TQPs cover variety of architectures and cross compilers
PLS Programmierbare Logik & Systeme and Razorcat have a range of optimised, so-called Tool Qualification Packages (TQPs) for the TESSY test platform for various architectures and cross compilers. These TQPs will in future allow embedded system developers even easier and more reliable automated testing of application software written in the programming language C.
7th August 2014

Compact DAQ controller cuts measurement system costs

NI has unveiled a next generation CompactDAQ 4-slot controller. By integrating the processor, signal conditioning and I/O into a single CompactDAQ system, engineers and scientists get reduced overall system cost and complexity and inreased measurement accuracy, says NI. Integrated measurement systems reduce the number of components, connections and wiring needed, where noise and additional costs are often introduced, to ensure high-accuracy measurements and cost-optimised systems.
6th August 2014

Engineering station enhances SSD test support

Advantest has added to its MPT3000 family for testing advanced solid-state drives (SSDs) by launching the MPT3000ES engineering station. The new station features a small footprint configured to test up to eight SSDs in parallel. The system’s small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
6th August 2014

Software designed instruments cover swathe of applications

NI has unleashed a new wave of software designed instrumentation encompassing new instrument types and automated test applications, further freeing, says the company, engineers and organisations from the costs and limitations of vendor-defined instruments. These latest software-designed instruments address automated test and research applications across wireless and mobile devices, semiconductor, automotive and aerospace/defence industries.
5th August 2014

Programmable DC power supplies measure standby current levels

Programmable DC power supplies measure standby current levels
The Series 2280S Precision Measurement, Low Noise, Programmable DC Power Supplies from Kethley Instruments are also sensitive measurement instruments with the speed and dynamic range for measuring standby current loads and load current pulses that battery-powered wireless, medical, and industrial devices produce.
5th August 2014

Triaxial IEPE accelerometer undergoes redesign

A revised version of the AT/10 miniature triaxial IEPE accelerometer has been launched by DJB Instruments UK. Using the industry standard ¼-28 UNF single 4-pin connector the AT/10 has been through a redesign to enable it to be produced to the full high temperature specification of 185°C.
5th August 2014

LabVIEW 2014 speeds data acquisition, analysis

The month of August always sees National Instruments usher in the latest version of its LabView systems design software. LabVIEW 2014 standardises the way users interact with hardware through reuse of the same code and engineering processes across systems, which scales applications for the future. This saves time and money as technology advances, requirements evolve and time-to-market pressure increases.
4th August 2014


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