Test & Measurement
High-performance oscilloscopes offer 16-bit vertical resolution
Now available from Link Microtek are the latest Rohde & Schwarz RTO-series high-performance digital oscilloscopes, which offer high-definition signal analysis with a vertical resolution of up to 16 bits, clear and simple touchscreen operation, and the world’s first real-time digital trigger system.
IJTAG interoperability demos at ITC in Anaheim
At the International Test Conference (ITC) in Anaheim, ASSET InterTech and Cadence Design Systems are demonstrating the interoperability of their IEEE 1687 Internal JTAG (IJTAG) tools, which enable the re-use of embedded intellectual property (IP) both internally on chips and externally onto system boards.
Sensor enables smartphone app to check temperatures
The new PyroNFC from Calex Elecronics is a small, low-cost infrared temperature sensor that lets engineers and machine operators use a smartphone app to check temperature measurements on the production line. The PyroNFC sensor measures the temperature of surfaces in industrial processes without contact, and at just 29 mm in length, it is the smallest sensor that Calex has ever produced.
Reliable, compact test & assembly solutions
JOT Automation has enhanced its position as a preferred automation partner by introducing compact test and assembly solutions meeting high capacity and reliability requirements. The company is introducing the JOT M10 Test Solution, JOT V4 Assembly Cell, JOT F1C Laser Marker and JOT Odd Shape Assembly Cell at the productronica show in Germany at Hall A3, Stand 415.
Nordson DAGE, Crest Group agree distribution pact
Nordson DAGE, a division of Nordson Corporation has announced a strategic partnership with the Crest Group for distribution of their market leading Bond Test and X-ray systems in Malaysia and Thailand. Crest also will distribute the Company’s X-ray systems in China. Part of the Advanced Technology - Electronics Systems Group of the Nordson Corporation, Nordson DAGE offers a wide portfolio of Bond Test, Materials Test, Wafer X-ray Metrology ...
LTE conformance tests get 100% automated solution
A solution to automate the execution of all 3GPP TS 36.523 LTE Conformance tests required for certification and pre-certification of mobile devices has been announced by Anritsu and COMPRION. Until now, achieving complete automation of GCF and PTCRB conformance tests was not possible as a number of tests required specific USIM profiles.
ATPG technology delivers faster test pattern generation
A new ATPG and diagnostics technology that delivers 10X faster run time and 25 percent fewer test patterns has been introduced by Synopsys. It will shorten schedules, accelerate silicon debug and reduce test time and cost. Innovative, memory-efficient engines for test generation, fault simulation and diagnosis execute finely segmented threads on all available server cores, maximising throughput while minimising the number of patterns required to ...
Flying probe tester handles larger, heavier boards
A flying probe tester from Digitaltest will make its debut at productronica in Munich (November 10-13). The Condor, MTS 505 is the latest generation of flying probe test system from Digitaltest. The system now provides support for larger and heavier boards. When combined with the company’s latest measurement hardware it can provide even higher test coverage while keeping maintenance requirements extremely low.
IoT test devices on parade at SEMICON Europa
A full line of test solutions for automotive, communications and consumer devices will be shown by Advantest together with its metrology and advanced E-beam lithography systems at SEMICON Europa Dresden (October 6-8). Visitors will be able to learn more about the V93000 platform’s capabilities in improving time to quality (TTQ) in multi-site radio-frequency (RF) applications and testing IoT devices.
Communication adapter acts as LINbus interface
LIN-I/O is a communication adapter designed as an interface between automated production lines and a LINbus product available from Saelig. Designed for fixed installation on a DINrail or in a control cabinet, LIN I/O communicates remotely with a controller either via high-speed CAN and/or 24V digital I/O. Using the LIN I/O, a test device can be communicated via the LIN I/O communications in a safe, short-circuit protected manner.