Test & Measurement
Measurement system replicated by chip maker
A highly sensitive measurement system for the performance of nanoscale magnetic devices, invented and developed at NIST, was successfully replicated recently by Intel Corporation, enhancing the company's ability to evaluate the tiny structures' suitability for use in future computing. Now scientists from Intel and Stanford University have published their first results from the NIST-model system in the Journal of Applied Physics.
CAT II & III safety measuring leads ensure optimal connection & long life
Schukat supplies Schützinger leads for rated current of 32A and rated voltage of 1000V in protection classes CAT II (VSKF5000 andVSKF5001 series) and CAT III (VSKF6000 and VSKF6001). The ''fixed sleeve principle'' favoured by Schützinger prevents inadvertent contact with the connecting elements, guaranteeing greater safety than with the sliding-sleeve principle more usual on the market.
100G advanced multichannel testing speeds OTN switch development
Advanced Multichannel OTN testing at 100G has been announced by RXFO to support network equipment manufacturers (NEMs) who are developing high-speed OTN packet transport solutions. The new, advanced Multichannel OTN capability, which helps NEMs speed up testing and development of OTN switches, is available on the FTB/IQS-85100G and FTBx-88200NGE.
Portable analyser can test HDMI, HDBaseT devices
A new member of the quantumdata 780 series handheld test instruments has been introduced by Teledyne LeCroy. The 780E Multi-Protocol Analyser / Generator is equipped with DisplayPort input and output ports making it capable of testing HDMI, HDBaseT and DisplayPort devices and distribution networks including HDCP 2.2 verification.
Datalogger monitors temperature-sensitive products & processes
Monitoring cold chain and other temperature sensitive products or processes for longer duration sessions is now possible with the DS1925 iButton data logger from Maxim Integrated Products. Temperature sensitive products and processes can be damaged when exposed to temperatures that are too high or too low.
Pre-tested solution analyses sensor data
A collaboration between NI and Hewlett Packard Enterprise (HPE) has produced pre-tested Big Analog Data solutions based on NI DataFinder Server Edition software and HPE Moonshot Systems. Engineers must collect and manage sensor data that is fundamentally different than what traditional big data solutions typically tackle.
PXIe 18-slot chassis offers 24GB/s system bandwidth
A Gen 3 PXIe chassis and set of Gen 3 system components designed for complex, high-performance applications have been introduced by Keysight Technologies. Doubling the system bandwidth, the new products improve data streaming for capture/playback applications, such as 5G and electronic warfare.
Die-level handler tests ICs for high-growth applications
The HA1000 die-level handler is a cost-efficient test solution for determining known good dies (KGD) prior to IC packaging announced by Advantest. Economics is a driving factor in die-level testing. Determining a semiconductor device’s viability prior to packaging or building memory stacks is critical to avoiding rework, achieving high yields and lowering costs.
StudentDAQ version adds 350Ω & 1kΩ quarter-bridge inputs
As part of its continued focus on the classroom, Micro-Measurements, a Vishay Precision Group brand, has introduced a recent version of its popular StudentDAQ pocket-sized, USB-powered data acquisition device for use with resistive strain sensors. Originally available with 120Ω quarter-bridge inputs, the version offers additional 350Ω and 1kΩ quarter-bridge inputs for more precise measurement in a variety of applications.
Mirtec to present at the California Reliability Workshops
MIRTEC has just announced its sponsorship and participation in the Northern and Southern California Reliability Workshops. The Northern CA workshop is scheduled to take place Thursday, June 9th at the Embassy Suites by Hilton Milpitas Silicon Valley. The Southern CA workshop will take place Tuesday, June 7th at the Green Dragon Tavern and Museum in Carlsbad, CA. Brian D’Amico will present “The Electronics Manufacturing Industry R...