Test/Measurement

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JTAG/Boundary Scan hardware interface stars at Autotestcon

JTAG/Boundary Scan hardware interface stars at Autotestcon
JTAG Technologies will be showcasing the new JTAG/boundary-scan hardware interface product compatible with the Virginia Panel (VPC) mass interconnect system at Autotestcon 2014 in St. Louis (Sept 15-18) The JT 2147/VPC is a signal conditional module that allows ‘ideal world’ connections from JTAG Technologies PXI and PXIe DataBlasters to the VPC connection system.
28th July 2014

Component model libraries offered free to new users

Agilent Technologies says that the Modelithics COMPLETE Library of RF and microwave component model libraries is available free of charge for six months to Genesys 2014 users new to Modelithics. The Modelithics COMPLETE Library contains Global Models that represent entire RLC component families as compact models with layout attributes, pad de-embedding capability, and offer scaling of part-value, substrate type and thickness, and solder pad geometries.
28th July 2014

Power semiconductor test platform meets JEDEC standard

Power semiconductor test platform meets JEDEC standard
An automated test system that meets the requirements of JEDEC standards and may be used for product development characterisation has been launched by Intepro. The system is a solution for reliability and extended lifetime testing of power semiconductors including IGBT, MOSFET, SCR, diode and bipolar parts and modules. The SemTest system is comprised of a test system, thermal oven and test software with optional chiller and cold plates.
28th July 2014


Digitising linear measurement for greater accuracy

A novel approach to digitally measuring analogue current could deliver greater accuracy at ultra-low powers. By Johann Zipperer & Peter Weber, Texas Instruments.
28th July 2014

Speed-to-answer - differentiating instrument design

Speed-to-answer - differentiating instrument design
Industry studies have recently highlighted significant changes in the test market, including shrinking product design cycles (down by 13% over the last three years) and fewer dedicated test engineers with in-depth T&M backgrounds. In fact, one in five electrical engineers now working started his or her career within the last decade. By Jonathan Tucker, Keithley Instruments.
25th July 2014

All-in-one transport tester solves network problems

All-in-one transport tester solves network problems
The new MT1000A Network Master Pro from Anritsu is an all-in-one optical network field tester that supports the multiple communications protocols used in today’s converged telecom networks. The tester is portable, compact and user-friendly and it is aimed at technicians who install and maintain mobile-access, fixed-access, metro and core transmission telecoms networks.
24th July 2014

Arbitrary/function generators feature intuitive operation

Arbitrary/function generators feature intuitive operation
A range of arbitrary/function generators that feature isolated output channels which allows their use in the development of floating circuits in power electronics applications have been launched by Yokogawa. The FG400 Series combines intuitive operation with comprehensive sweep and modulation facilities. The instruments allow the creation of basic, application specific and arbitrary waveforms.
24th July 2014

Rapid debug delivers 64-bit ARM server motherboard

ASSET InterTech has collaborated with SoftIron to quickly debug and bring up the industry’s first 64-bit ARM server motherboard based on AppliedMicro’s X-Gene Server on a Chip. SoftIron’s 64-0800 is an ultra-low power, high-performance server motherboard for the enterprise computing and data center market.
23rd July 2014

AOI import option cuts test program generation time

AOI import option cuts test program generation time
The AOI systems of GOEPEL electronics now offer an import option for test programs of other system providers. The conversion shortens time for generation of test programs significantly compared to the use of CAD and pick & place data. This process is underpinned by the extensive AOI component library of the systems.
23rd July 2014

Time stamp feature enhances system performance analysis

Lauterbach has added a new feature to its Trace 32 trace tools that enable recorded program/data flow to be time stamped to allow an overall analysis of the system performance, as well as quality assurance features such as code coverage, cache analysis and timing analysis. 
23rd July 2014


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