Test & Measurement

Displaying 1 - 3131 of 3131

Trigger/analysis options upgrade oscilloscopes

Trigger/analysis options upgrade oscilloscopes
New trigger and analysis options have been added by Yokogawa to its DLM2000 (4-channel) and DLM4000 (8-channel) mixed-signal oscilloscopes (MSOs) for testing the latest generation of in-vehicle serial buses. The new options are specifically designed to address the measurement challenges posed by the CAN FD (CAN with Flexible Data Rate) and SENT (Single Edge Nibble Transmission) bus systems.
17th April 2015

Current probes supply measurements down to 1 mA/div

Current probes supply measurements down to 1 mA/div
The CP030A and CP031A high sensitivity current probes from Teledyne LeCroy provide sensitivity down to 1mA/div allowing users to measure current from the mA range up to a continuous current of 30Arms and peak current of 50A all with the same probe. The probes provide a small form factor for today’s crowded boards.
16th April 2015

Universities to benefit from wireless lab solution

Universities to benefit from wireless lab solution
A wireless lab instrument management solution for quickly setting up and efficiently managing basic electronics engineering laboratories at colleges and universities is available from Farnell element14. The Tektronix TekSmartLab TSL3000A solution supports up to 120 instruments (30 test benches) on a single platform.
16th April 2015


Cooled cameras cope with demanding applications

Cooled cameras cope with demanding applications
Three new science-grade thermal cameras, the A6200sc NIR, A8300sc HD MWIR, and A6700sc LWIR** have been unveiled by FLIR Systems. Designed for demanding science and research, the applications include electronics development, university research, and non-destructive testing. The cooled cameras deliver exceptional image quality, standardised interfaces and MATLAB integration making them powerful, efficient tools for gathering thermal data.
16th April 2015

I/O module enhances testability of assemblies

I/O module enhances testability of assemblies
GOEPEL electronics has added the SFX-5296LX, a next generation mixed signal I/O module to its JTAG/Boundary Scan hardware platform SCANFLEX. It offers a powerful solution to make even non-scannable partitions testable through boundary scan. This, for example, allows testing of assemblies with just one Boundary Scan IC.
16th April 2015

Accreditation laboratory installs LTE test solution

A leading accredited laboratory for wireless testing and certification has enhanced the testing capabilities it offers its customers by using the Spirent 8100 LTE solution with support for hVoLTE, Voice over IP (VoIP), Video Telephony, and Carrier Aggregation. SGS will use the test solution to assess the audio, video, signalling, and data throughput performance of mobile devices to ensure they meet the complex carrier requirements of next-generation LTE networks.
16th April 2015

Scanners slash antenna testing times

Scanners slash antenna testing times
Designers of antennas and high speed printed circuit boards can cut testing times drastically by using scanners introduced by MDL Technologies. The benchtop scanners from EMSCAN provide real-time images of EMI and antenna emissions, enabling designs to be evaluated in seconds.
15th April 2015

Analyser tests performance of Dante-enabled devices

Support for audio performance testing of Dante-enabled devices is now available with Audio Precision’s APx500 Series analysers and software. The capability aids engineers in verifying the audio performance of their designs as they integrate Dante and strive to meet the growing demand for networked pro audio components, products and systems.
15th April 2015

Protocol decoders speed up networking debug

Protocol decoders speed up networking debug
The 10BASE-T/100BASE-TX Ethernet protocol decoders have been unveiled by Keysight Technologies. The Keysight N8825A (for 90000A, 90000 X-, 90000 Q-, Z- and V-Series oscilloscopes) and N8825B (for S-Series oscilloscopes) 10BASE-T/100BASE-TX Ethernet protocol decoders help network design engineers accelerate turn-on and debug of 10BASE-T/100BASE-TX Ethernet networking systems.
15th April 2015

Software update increases test flexibility

Software update increases test flexibility
The focus of the latest software update from XJTAG is on increasing the flexibility of JTAG chain control to make it easier for engineers to access the full JTAG capabilities of their boards and so achieve maximum test coverage. Dynamic chain profiling makes it easier to initialise boards with multiple JTAG chains, in which a device in one JTAG chain controls power supplies or reset lines for JTAG devices in the other chains.
15th April 2015


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