Test & Measurement

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Next generation LabVIEW accelerates measurement automation

Next generation LabVIEW accelerates measurement automation
LabVIEW NXG 1.0, the first release of the next generation of NI’s LabVIEW engineering system design software has been unveiled at NIWeek in Austin. NI says It bridges the gap between configuration-based software and custom programming languages with an innovative new approach to measurement automation that empowers domain experts to focus on what matters most – the problem, not the tool. 
23rd May 2017

Network analyser solution delivers system-level accuracy to 120GHz

Network analyser solution delivers system-level accuracy to 120GHz
A broadband millimeter-wave network analyser solution that delivers system-level accuracy up to 120GHz has been announced by Keysight Technologies. The N5290/91A solutions produce metrology-grade results that enable leading-edge developers to confidently characterise their millimeter-wave designs.
23rd May 2017

Digital video and audio test added to RF tooolkits

Digital video and audio test added to RF tooolkits
Averna has announced a strategic partnership with MaxEye Technologies to distribute its digital video and audio signal generation toolkits. This partnership will allow Averna to add full digital video and audio testing capability to its Averna Signal Tester (AST-1000) RF Signal Source platform, in addition to its existing RF toolkits such as AM/FM, HD Radio and Sirius XM as well as full GNSS simulation.
22nd May 2017


Multirate module creates field solution for 100G testing

Multirate module creates field solution for 100G testing
A 100G Multirate Module for its Network Master Pro MT1000A all-in-one tester has been released by Anritsu. It supports interface rates from 10Mbps to 100Gbps, and technologies including Ethernet, Optical Transport Networks (OTN), SDH/SONET, Fibre Channel, and CPRI/OBSAI.
22nd May 2017

Isolated measurements system enhanced with higher input impedance

Isolated measurements system enhanced with higher input impedance
The IsoVu portfolio at Tektronix has been strengthened with new products offering a large differential voltage range and a higher input impedance. Featuring six new models, the IsoVu family portfolio now includes products with both large differential and common mode voltage ranges.
18th May 2017

Oscilloscope's integrated generator takes on complex tests

Oscilloscope's integrated generator takes on complex tests
An integrated arbitrary waveform and pattern generator enables R&S RTO2000 and R&S RTE oscilloscopes to deliver test signals on two analogue and eight digital channels, making it possible to test complex circuits in a minimum of space using a single instrument. Even fully automated compliance tests can be performed. The RTO-B6/R&S RTE-B6 arbitrary waveform and pattern generator options from Rohde & Schwarz operate via controls that are completely integrated into the oscilloscope GUI.
17th May 2017

Transmitter test solution supports DisplayPort 1.4 spec

Enhancements have been made to the Tektronix DisplayPort and Type-C transmitter test solution offering full support for the latest DisplayPort 1.4 specification. The solution includes support for the HBR3 data rate (8.1 Gb/s) and delivers the fastest compliance test times in the industry – less than 7 hours for data rates up to HBR2 and less than 11 hours for HBR3.
17th May 2017

Averaging function enhances digitiser range

Averaging function enhances digitiser range
A new function has been added to Spectrum’s range of modularly designed digitisers.  The Boxcar averaging function smooths out high frequency noise to give a clear signal.  It is most useful in situations where signals have been oversampled and it can be used to increase vertical resolution, lower noise and improve dynamic characteristics such as signal-to-noise ratio (SNR) and spurious free dynamic range (SFDR). 
15th May 2017

RF communications system cuts the cost of IoT test

The KT-RFCT 2400 Gen II – an RF communications test system from Konrad Technologies is designed with convenience in mind. The low price point creates a cost effective means for testing wireless communication units, while generating a favourable cost to performance ratio. The test system has a small footprint, integrating seamlessly into test system infrastructures via a single Ethernet connection. GPIOs can control the DUT and peripherals.
15th May 2017

PXI Express digital I/O modules expand ATE platform

PXI Express digital I/O modules expand ATE platform
AMETEK VTI Instruments has introduced the EMX-75XX Series of PXI Express (PXIe) Digital Input/Output (I/O) Modules, the latest addition to its Core Automated Test Equipment (Core ATE) PXIe functional test solutions. The EMX-75XX Series is a family of high-performance PXIe modules that support multiple I/O configurations and logic levels.
11th May 2017


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SENSOR+TEST 2017
30th May 2017
Germany Nuremberg
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