Test & Measurement

Displaying 1 - 3299 of 3299

50GHz handheld analyser replaces multiple instruments

50GHz handheld analyser replaces multiple instruments
Six millimetre-wave models have been added to its family of FieldFox handheld analysers by Keysight Technologies. The flagship model is the industry’s first handheld combination analyser to provide coverage to 50GHz. With more built-in capabilities than similar analysers, FieldFox can replace three or four single-function instruments – benchtop or handheld – that are typically used for maintenance and troubleshooting of systems that operate at or above Ka-band frequencies.
2nd September 2015

Higher accuracy enhances power meter performance

Higher accuracy enhances power meter performance
An enhanced version of its best-selling WT300 Series of compact 5th generation digital power meters has been unveiled by Yokogawa. It features higher accuracy, new measurement functionality and improved connectivity including Modbus/TCP capability to aid integration into production environments.
2nd September 2015

DC power supplies enable reliable bench testing

DC power supplies enable reliable bench testing
A series of compact DC power supplies that offer LAN and USB interfaces and accurate, reliable power for testing and validating designs has been introduced by Keysight Technologies. The E36100 series adds five new models with up to 100V or 5A output to Keysight’s extensive portfolio of bench power supplies.
2nd September 2015


Keysight buys UK calibration company

Keysight buys UK calibration company
Keysight Technologies has acuired Electroservices Enterprises, a U.K. company specialising in test equipment service and solutions. Based in Telford, Electroservices provides a broad range of electrical, mechanical and physical calibration, repair and asset management services to a large number of defense, telecom and industrial customers.
2nd September 2015

Pre-amplifiers boost signal levels

Pre-amplifiers boost signal levels
For applications where low-level electronic signals need to be acquired and analysed, Spectrum has added a range of pre-amplifiers that can be used to boost signal levels. When combined with a Spectrum digitiser these low noise pre-amplifiers can greatly increase the measurement systems overall dynamic range and sensitivity.
2nd September 2015

Test suite provides convergence platform

Test suite provides convergence platform
The IP Multimedia Subsystem Network Simulation referred to as MAPS SIP IMS test suite has been unveiled by GL Communications. Internet Protocol (IP) Multimedia Subsystem, popularly known as “IMS”, is built on Session Initiation Protocol (SIP) as the base to further support packaging of voice, video, data, fixed, and mobile services on a single platform to end users.
2nd September 2015

Pre-amplifiers extend digitisers dynamic range & sensitivity

Pre-amplifiers extend digitisers dynamic range & sensitivity
For applications where low level electronic signals need to be acquired and analysed, Spectrum has added a range of pre-amplifiers that can be used to boost signal levels. When combined with a Spectrum digitiser, these low noise pre-amplifiers can greatly increase the measurement systems overall dynamic range and sensitivity. 
1st September 2015

Position-tracking system improves sports teams’ performance

A precise position-tracking system that allows teams to measure and analyse player movement in three dimensions and provide immediate feedback to improve performance has been introduced by BeSpoon SAS.
1st September 2015

Hand-held spectrum analyser measures up to 40GHz

Hand-held spectrum analyser measures up to 40GHz
A hand-held spectrum analyser that is not much larger than a smartphone and yet is able to carry out measurements on microwave signals at frequencies as high as 40GHz is in stock at Link Microtek. Manufactured by SAF Tehnika, the versatile Spectrum Compact instrument is primarily aimed at field engineers dealing with commercial mobile-phone infrastructure, satellite communications links or military communications systems.
28th August 2015

Semiconductor test probe for high end digital devices

A new member of the ZIP semiconductor test probe family has been launched by Everett Charles Technologies. The Z-080YHJ is designed to meet the many challenges associated with testing High End Digital (HED) devices. ZIP probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.
27th August 2015


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