Test solutions and technical papers on display at SEMICON West
Semiconductor test equipment supplier, Advantest, will showcase its innovative test solutions, present three technical papers and sponsor several activities at the SEMICON West 2017 trade show, taking place 11th to 13th July to Moscone Center in San Francisco. “As a global leader in semiconductor test solutions, we are uniquely positioned to deliver end-to-end solutions for the connected world,” said Judy Davies, Vice President of Global Marketing Communications at Advantest.
“Our deep involvement in the automotive electronics and IoT sectors makes activities such as sponsoring the new SMART Journey pavilion at this year’s show a natural fit for Advantest,” Davies continued.
In booth 5868 in North Hall, Advantest will have exhibits on several of its product platforms for testing and measuring all aspects of semiconductor devices.
The versatile V93000 single scalable platform along with the proven Wave Scale RF channel card and the new Wave Scale MX-HR card for testing high-resolution converters and IoT devices will be on display. These cards enable the V93000 to conduct high-efficiency testing of radio-frequency (RF) and mixed-signal ICs used throughout wireless communications and other applications.
In addition, Advantest will feature its broad-coverage T2000 platform, whose ability to meet advanced device and module testing needs at a low cost of test has helped semiconductor manufacturers quickly address the quality and performance requirements of automotive ICs and MCUs.
The EVA100 system, designed to cost-effectively evaluate and measure analogue, mixed-signal and digital devices, will be shown as well as the new T5822 memory tester, which provides a low-cost solution for high-volume, wafer-level testing of multiple memory devices used throughout portable electronic devices.
Advantest’s booth also will feature digital displays on its system-level test (SLT) and nanotechnology solutions as well as its service and support offerings.
Paper presentations
Advantest technology experts will present three technical papers during the Test Vision 2020 programme – for which Advantest is a platinum sponsor – at the Marriott Marquis Hotel. On Wednesday 12th July at 1:25pm, Dave Armstrong of Advantest will present a paper on Contact Resistance Challenges and a Solution. Then on Thursday 13th July, at 9:20am, Advantest’s Roger McAleenan will discuss 'mmWave Test Challenges'. That same afternoon at 2:25pm, Kotaro Hasegawa of Advantest will speak on 'The Challenges of Testing IoT Modules for Mass Production'.
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