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Tektronix to showcase innovative technology solutions at electronica

5th October 2016
Lanna Deamer
0

Tektronix will be showcasing a wide range of applications, from IoT, power analysis, education and research, semiconductor design and RF test at electronica 2016 (Stand 438, Hall A1), which takes place from 8-11th November in Munich.

Visitors to the Tektronix stand will be able to get hands-on demonstrations and technical advice to help them solve their individual test and measurement challenges.

Highlights on the Tektronix stand will include:

  • The TBS2000, a next generation basic oscilloscope featuring the longest record length and largest display in its class for faster signal evaluation and troubleshooting. This latest addition to the Tektronix portfolio puts expanded capabilities, including the ability to use a wide range of Tektronix probes, into the hands of budget-constrained design engineers and educators.
  • The IsoVu Measurement System with its revolutionary IsoVu technology uses optical communications and power-over-fibre for complete galvanic isolation. When combined with an oscilloscope equipped with the TekVPI interface, it is the first, and only, measurement system capable of accurately resolving high bandwidth, differential signals, in the presence of large common mode voltage.
  • The industry’s first 3-in-1 arbitrary waveform generator, the AWG4000 series. With basic, advanced and digital modes, the portable signal generator can be easily shared across design teams and can meet a wide variety of signal generation needs ranging from radar and wireless communications to embedded systems design and research applications.
  • The RSA500 all in-one field installation and maintenance tool for spectrum analysis: Fast and light, the RSA500 is ideal for portable spectrum, vector signal and distance to fault analysis, interference hunting, mapping and network management applications. It's rugged, road ready package offers tremendous performance at a competitive price.
  • The customisable and fully integrated Keithley 4200A-SCS parametre analyser that accelerates semiconductor device, materials and process insights by reducing characterisation complexity for new or sporadic users, simplifying test setup, and delivering clear, precise results.

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