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EuMW 2017: Spectrum analysers to debut in Nuremberg

28th September 2017
Mick Elliott
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The latest Spectrum Analyser/Signal Analysers and Vector Network Analysers will be presented by Anritsu at European Microwave Week in Nuremberg (10-12 October). During the show, Anritsu will be displaying up-coming and new additions to the Spectrum Master and ShockLine product families, and demonstrating just some of the latest developments in test and measurement.

mmWave Spectrum Monitoring in 3D using a Drone is possible thanks to the ultra-lightweight (300g) MS2760A Spectrum Master – Ultraportable Spectrum Analyser operating up to 110GHz. This is just one option for measuring propagation, coverage and beamforming in space, essential measurements for many applications such as 802.11ax, FMCW car radar and 5G.

Analyse 5G signals using the MS2850A Signal Analyser with a maximum analysis bandwidth of 1GHz by performing analysis of an 8-carrier simultaneously (100MHz x 8 = 800MHz total) signal output from the demonstration signal source. This demonstration will generate a 8 x 100MHz 5GTF waveform at 28GHz and detailed resource block level analysis of the signals.

Anritsu will be demonstrating several Spectrum Monitoring and Signal Analysis solutions including using VISION and SpectraVision Software with a High-Speed Port Scanner, a live demonstration of TDOA geolocation with a testbed in Munich and demodulation of Satellite Communication signals with SpectraVision.

A demonstration of an integrated compact solution for mmW banded Power Measurements based on a real-world application from Fraunhofer Institute for High Frequency Physics and Radar Techniques FHR, where Power Expert SW is run on the same laptop as Spectrum Monitoring.

Anritsu NLTL technology enables tightly integrated mmWave measurement systems for accuracy and stability. The VectorStar ME7838A provides fully corrected on-wafer VNA measurements from 70kHz to 110GHz, while the MS2760A Spectrum Master enables spectrum analysis from 10GHz to 110GHz using 1mm modules and couplers with on-wafer probes.

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