Events News

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JTAG, AOI solutions readied for electronica showing

JTAG, AOI solutions readied for electronica showing
electronica will provide the platform for a wide range of optical and electrical measuring and testing technologies from GOEPEL electronic. Taking centre stage will be the AOI division, represented by two systems: the solution for high-end inspection in large scale production which bears the name TurboLine. Double-sided inspection without assembly turning and rotatable angled-view are the factors for an even faster testing.
10th October 2014

VTAC high speed data insert debuts at NIDays

VTAC high speed data insert debuts at NIDays
Peak Group, a National Instruments Alliance Partner, will be participating at NIDay in London (November 4) and will highlight its latest developments in automated test systems as well as test solutions using mass interconnect products from Virginia Panel Corporation (VPC).
9th October 2014

electronica 2014: Spectrum analysers, scopes on launch pad

electronica 2014: Spectrum analysers, scopes on launch pad
Rigol Technologies EU will deploy a full range of its products at the upcoming electronica exhibition in Munich. The lineup will include new products including two models of the DSA800 Spectrum Analyser Series. Mixed Signal Oscilloscopes (MSO) and a PC Software to perform standard measurements for example on switching power supplies will also premiere at the show.
9th October 2014


EuMW 2014: Radar target simulator eyes automotive market

EuMW 2014: Radar target simulator eyes automotive market
Rohde & Schwarz chose European Microwave Week to take the wraps off an agreement to sell the ARTS turnkey radar target simulator from ITS and miro-sys. The market target is automotive radar now being installed in advanced driver assistance systems (ADAS), to quickly and precisely measure the speed and distance of multiple objects, regardless of weather conditions.
8th October 2014

EuMW 2014: PXI advance speeds load pull tests

European Microwave Week is the platform for Mesuro with support from National Instruments to demonstrate its latest advance in the utilisation of PXI to improve the speed of test for today’s technical demands. The two organisations will demonstrate a load pull set up that uses a traditional passive tuner for fundamental tuning and adds the RAPID PXI digital tuner to provide a high speed harmonic tuning capability.
6th October 2014

EuMW 2014: Network analyser extension unit launched

At European Microwave Week Rohde & Schwarz has introduced an extension unit for its R&S ZVA high end network analyser family. The R&S ZVAX-TRM can be combined with an analyser to yield a powerful, compact and highly customisable system. The extension unit conditions the signals from the network analyser as required for a given task and either returns them to the analyser or outputs them via its integrated high-power test ports.
6th October 2014

Lantronix Enables IT Professionals to Remotely Manage, Monitor and Troubleshoot IT Equipment with the Launch of the New SLC 8000 Console Manager at Interop 2014

Lantronix announced the launch of its new SLC 8000 – the industry’s first modular console manager.  Designed to reduce deployment and management costs and time by providing secure, centralised out-of-band management to most IT equipment, the new SLC 8000 can be expanded from eight to 48 ports.  In a typical deployment, each port would manage one piece of IT equipment such as a switch, router, or server.  This modular design makes the SLC 8000 the first of its kind, allowing users to simply add or swap modules to expand device port density and power supply, or introduce new interfaces such as USB. 
6th October 2014

GaN enhancements on the agenda at RF/Microwave PA Forum

Dr. Christopher Harris, Cree’s European business development manager will present “Using Cree GaN Large Signal Models in Microwave Office Simulation Tools” at the RF/Microwave PA Forum at European Microwave Week (EuMW) in Rome (Oct 7-9).  
3rd October 2014

Free electronica seminars focus on high speed interconnect

Free seminars will be on offer at Samtec’s stand during the electronica exhibition in Munich (Nov 11-14).  The seminars focus on high speed interconnect design considerations, and will be presented by Scott McMorrow, President and SI Consultant of Teraspeed Consulting. They are 20 minutes in duration. Reservations are not required, and time will be available afterwards for questions and discussion.
2nd October 2014

E-beam lithography tool debuts at Semicon Europa

Advantest is preparing to exhibit its broad portfolio, including its nanotechnology products, terahertz systems and semiconductor test solutions at SEMICON Europa in Grenoble (October 7-9).  It will highlight its multi-vision CD-SEM metrology solutions and newest e-beam lithography tool.
1st October 2014


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