Tektronix

Address:
14150 SW Karl Braun Drive
P.O. Box 500
Beaverton

OR 97077
United States of America

Phone: 503-260-1169

Web: www.tek.com


Tektronix articles

Displaying 1 - 20 of 222

Tektronix improve personal experience at Italian high school

Tektronix improve personal experience at Italian high school
Tektronix has announced that a top Italian high school for applied sciences in Lecco, Italy has outfitted its electronics instruction laboratory with Tektronix bench test instruments and TekSmartLab, the industry's first network-based lab instrument management solution. The recently updated laboratory at the Istituto di Istruzione Superiore 'A. Badoni' enables instructors and lab managers to focus on helping students gain the critical hands-on skills they need to excel in the real world.
20th April 2017

AWG meets signal generation demands at lower cost

AWG meets signal generation demands at lower cost
Responding to a changing scenario in the test and measurement sector, Tektronix has launched an arbitrary waveform generator to meet what it describes as demanding signal generation needs in advanced research, radar and electronic warfare design. The test and measurement specialist thinks the pricing is pretty special too, coming in at 11,000 Euro per channel.
17th April 2017

Software enhances IP video network quality

Software enhances IP video network quality
A series of enhancements to PRISM, a software-based hybrid IP and SDI media analysis platform has been announced by Tektronix. The new features added to the PRISM platform include support for important industry specifications and help engineers boost IP video network quality, conquer integration and operations challenges and perform deep-dive analysis for troubleshooting.
11th April 2017


High-speed test solutions upgrade Raspberry Pi lab

High-speed test solutions upgrade Raspberry Pi lab
The Research and Development (R&D) lab for Raspberry Pi is to be equipped with the latest Tektronix high-speed test solutions. Raspberry Pi’s new laboratory will focus on high speed serial design and validation testing. The new test equipment from Tektronix delivers on their needs today while also ensuring enough bandwidth to support any future high speed interfaces that would require the highest performance instrumentation.    
20th March 2017

Newcombe to head Tektronix global sales and marketing

Newcombe to head Tektronix global sales and marketing
Tami Newcombe has been named as Commercial President at Tektronix where she will be responsible for leading global sales and marketing. A former Cisco executive with 25 years of technology industry experience, Newcombe has a strong track record of working with customers ranging from small and medium businesses to enterprises and in developing new approaches to capture critical market transitions, capitalise on the power of channel partners and show the business value of technology adoption to customers.
7th March 2017

Optical test solutions head for Los Angeles

Optical test solutions head for Los Angeles
The latest in optical test innovation for data centre networking will be showcased by Tektronix at OFC 2017 in Los Angeles (March 19-23). Data centre networking technology providers are looking to continuously increase the capacity and precision of high speed data transfers.
6th March 2017

Test solution meets MIPI Alliance D-PHY v.2.0 spec

Test solution meets  MIPI Alliance D-PHY v.2.0 spec
What is claimed to be the industry’s first receiver test solution with 100 percent coverage of the MIPI Alliance’s recently released D-PHY v.2.0 specification along with full support for the C-PHY v1.1 receiver test specification has been released by Tektronix. MIPI designers, such as those working on autonomous driving systems or in-vehicle infotainment, can now access simplified PHY receiver test set up and faster test execution combined with industry leading signal fidelity and flexible support for in-depth debug and margin testing.
15th February 2017

BERT eases 4th generation standards receiver testing

BERT eases 4th generation standards receiver testing
Claimed to be the industry’s first 32Gb/s protocol-aware bit error rate test and analysis system. the new Tektronix BSX series BERTScope helps characterise the receiver in Gen3 and Gen4 devices and enables users to shorten the time needed to debug link training and bit error rate issues.
31st January 2017

Automated 100G electrical test solutions on parade at DesignCon

Automated 100G electrical test solutions on parade at DesignCon
Tektronix has introduced new equivalent time automated compliance test solutions for 4-lane 100G electrical interfaces defined in the IEEE 802.3bm and 802.3bj specifications. The new capabilities along with the full set of Tektronix solutions for 100G and 400G characterisation and validation will be demonstrated at DesignCon 2017 (February 1-2).
24th January 2017

Automated USB 3.1 Type-C test solution offers deep analysis

An automated USB 3.1 Type-C transmitter test solution for Gen1 and Gen 2 that combines full SigTest support with DPOJET debug and analysis tools, allowing designers to bring devices with improved margins to market in less time has been announced by Tektronix. The new solution delivers 100 percent compliance test coverage as well as full support for the new Type-C connector, fixtures and associated channel tests.
6th December 2016

Updated transmitter features SNDR measurement

Updated transmitter features SNDR measurement
An update for Tektronik PAM4 solution for validating 400G physical layer transmitter designs for its DPO70000SX ultra high performance oscilloscope series, has been made. The release adds PAM4 error detection, SNDR (Signal to Noise and Distortion Ratio) measurement capability, and advanced FFE/DFE equalisation capabilities into one solution.
1st December 2016

PAM4 error detection enhances oscilloscope series

PAM4 error detection enhances oscilloscope series
An update to its PAM4 solution for validating 400G physical layer transmitter designs for its DPO70000SX ultra high-performance oscilloscope series is announced by Tektronix. The latest release adds PAM4 error detection, industry-leading Signal to Noise and Distortion Ratio (SNDR) measurement capability, and new advanced FFE/DFE equalisation capabilities into one easy to use solution.
30th November 2016

Signal analyser targets radar/EW design

Signal analyser targets radar/EW design
A wideband signal analysis solution that combines 800MHz of real-time bandwidth with up to 2 hours of streaming storage at full bandwidth in one solution has been announced by Tektronix. The new RSA7100A instrument’s 16kHz to 26.5GHz frequency range covers a broad range of analysis needs for critical wide-bandwidth applications.
29th November 2016

Software paves way to repeatable material characterisation

Software paves way to repeatable material characterisation
A complete solution for performing high resistivity measurements in compliance with accepted industry standards including ASTM D257 and IEC 60093 has been unveiled by Tektronix. Designed for use with the Keithley Model 6517B Electrometer and Model 8009 Resistivity Chamber, the new Model KICKSTARTFL-HRMA application automates volume and surface resistivity measurements for more accurate and repeatable results without the need for custom programming.
29th November 2016

Test solution meets ONFI flash memory standard

Test solution meets ONFI flash memory standard
What is claimed to be the industry’s first test solution for the Open NAND Flash Interface (ONFI) standard is available for Tektronix high-performance oscilloscopes. The ONFI 4.0 test solution includes software for analysing DDR2/3 modes on the ONFI bus coupled with an effective probing solution based on interposers.
2nd November 2016

DisplayPort Type-C transmitter test solution cuts compliance test times

DisplayPort Type-C transmitter test solution cuts compliance test times
A DisplayPort Type-C Transmitter Test solution significantly reduces compliance test times compared to both previous Tektronix DisplayPort solution and those available from competitors. According to real-world field evaluations, the highly optimised solution for use with Tektronix high-performance oscilloscopes allows engineers to complete the full suite of DisplayPort Type C compliance tests in less than 6 hours.
1st November 2016

100G link training tool added to scope's capabilities

A new 100G link training tool has been released for use with the Tektronix DPO70000SX family of ultra-high performance oscilloscopes. This new option, along with expanded measurement support for 100G electrical debug and validation, addresses critical needs in the growing data centre market.
1st November 2016

Parametric test solution targets power semiconductors

Parametric test solution targets power semiconductors
The Keithley S540 Power Semiconductor Test System, a fully-automated, 48 pin parametric test system for wafer-level testing of power semiconductor devices and structures up to 3kV has been released by Tektronix. Optimised for use with the latest compound power semiconductor materials including silicon carbide (SiC) and gallium nitride (GaN), the fully integrated S540 can perform all high voltage, low voltage, and capacitance tests in a single probe touch-down.
25th October 2016

Training link helps debug data centre interconnects

Training link helps debug data centre interconnects
A new 100G link training tool has been released for use with the Tektronix DPO7000SX family of ultra-high performance oscilloscopes. This new option, along with expanded measurement support for 100G electrical debug and validation, addresses critical needs in the growing data centre market.
25th October 2016

Oscilloscopes CAN FD support meets automotive demand

Oscilloscopes CAN FD support meets automotive demand
A complete CAN FD protocol trigger, decode and search solution has been added to the Tektronix MDO3000 and MDO4000C Series of mixed domain oscilloscopes. It will help automotive engineers meet consumer demand for more capable and sophisticated electronic modules and integrated systems.
18th October 2016


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