CyberOptics has today announced that it will feature its newest range of AOI and SPI systems in Hall 03 , booth #3210 at the upcoming productronica India exhibition, scheduled to take place September 11-13, 2012 in Bangalore, India. CyberOptics’ unique value-add initiatives such as one-step SPI/AOI programming, AOI-SPI correlation analysis and printer closed-loop feedback capability also will be featured.
The QX100 redefines tabletop inspection by combining the performance of an in-line inspection system with the flexibility of a tabletop system. The system features CyberOptics’ unique image acquisition technology, the Strobed Inspection Module and is capable of inspecting component sizes down to 01005.
The sleek QX100 is powered by AI2, a patented next-generation image analysis technique that provides superior defect detection capabilities, lowest false call rates and improved clarity of defect identification. With AI2 technology, programming gets faster — with a dramatic 90 percent reduction in examples, and simpler with full support for unsupervised and semiautomatic model training. A single workflow setup makes QX100 an ideal choice for high-mix environments. Programs created on QX100 are 100 percent compatible with in-line systems.
On the SPI front, CyberOptics will feature its newest 3-D SPI system, the SE500ULTRA, designed with an all-new, ultra-fast sensor setting a new benchmark for SPI inspection speed. The sensor combined with CyberOptics’ unique “all-in-one” scan algorithm positions the SE500ULTRA to be 30 percent faster than its predecessor SPI systems with zero compromise on measurement accuracy and repeatability. Additionally, the system includes a Dual Illumination sensor option to further improve repeatability and reproducibility on the very smallest of paste deposits.
The CyberOptics team looks forward to welcoming visitors to Hall 03, booth #3210 during the productronica India exhibition.