KIC’s MB Allen to Present at the Long Island SMTA Expo and Technical Forum 2011
KIC, , announces that its Product Manager MB (Marybeth) Allen will present on the topic of Non-Destructive Profiling Methods at the upcoming SMTA Long Island Expo and Technical Forum on September 21, 2011 at the Islandia Marriott Long Island in Islandia, NY. The discussion will begin at 3:15 p.m. in Salon C&D.
Some profiling methods are either non-repeatable or destructive. This presentation discusses alternatives that cover faster setup, repeatable results and eliminate the destruction of the profiling board. The solutions to be discussed are cost-effective and provide quality improvements.
MB Allen has worked in the electronics industry for more than 20 years and been associated with KIC for 22 years. Now KIC’s product manager, she was the company’s General Manager in Europe for the past six years and the North American Sales Manager before that.
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Panasonic PhotoMOS® Photovoltaic MOSFET High-Power Drivers
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