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The web seminars available through Keithley University include:
* Understanding the Basics of Electrical Measurements
Many people need to make electrical measurements but are not necessarily experts in measurement science. In this seminar, scientists or engineers who need to perform electrical measurements but who have little experience can learn how to go about choosing test equipment, designing a test system, or simply carrying out measurements using existing equipment.
* How to Get the Most from Your Low Current Measurement Instruments
This seminar covers the basics of low current (from nanoamps to femtoamps) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of error. These measurement best practices are important for applications in semiconductor material/device characterization, nanotechnology test and measurement, optoelectronic device characterization, and many more. Examples of applications requiring such sensitive measurements are presented, as is an overview of recent test equipment innovations.
* Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing
This seminar is designed to help laboratory engineers implement, troubleshoot, and verify C-V measurement systems. The seminar discusses the keys to getting good C-V measurement results. Topics include system setup and results from some extended C-V applications, such as high voltage C-V and quasistatic C-V.
* Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor Characterization
Learn how to implement, troubleshoot, and verify pulsed I-V, transient I-V, and general-purpose Ultra-Fast I-V measurement systems. The seminar provides the keys to getting good measurements. Topics discussed include system setup, typical measurement limitations, and results from some actual devices.
* Hall Effect Measurements Fundamentals
Those who attend this seminar will learn how Hall effect measurement systems are commonly used to determine semiconductor parameters, such as carrier mobility and carrier concentration, Hall coefficient, and conductivity and conductivity type.