Test and Measurement
Advantest Introduces Industry’s Highest Capability 3-in-1 Semiconductor Test Clock Module to Improve Yields and Save Time & Money in Testing High-Speed ICs
Advantest Corporation have introduced the new T2000 LJC16 16-channel, low-jitter-clock module. The LJC16 module, which combines different digital clock and analog clock/sine-wave requirements in a single high-multi-site system, will be featured in Advantest's booth (#6247 in North Hall) at the SEMICON West trade show, July 10-12 in San Francisco.
Teseq Magnetic Field Coil Generates Fields Up To 1200 A/m
Teseq today debuted a new magnetic field coil that generates fields up to 1200 A/m during magnetic field testing. The INA 703 is designed for testing to IEC 61000-4-8 (supply frequency magnetic fields), IEC 61000-4-9 (pulsed magnetic fields) and IEC 61000-4-10 (oscillatory magnetic fields) standards. It is ideal for medical equipment, military, avionics, aerospace and industry applications.
New J&W GC Columns from Agilent ideal for Environmental and Pharmaceutical Industries
The new Agilent J&W gas chromatography columns are designed for environmental and pharmaceutical applications. The new additions expand the Agilent J&W family of columns, three of which are ultra inert GC solutions.
Multitest’s Solution for 3D Packages Released to Production
The first Multitest Plug & Yield solution from Multitest has recently been released to the customer's production. James Quinn, VP Sales and Marketing, commented: "Multitest is the first equipment supplier to deliver a full turn-key hardware set up for in-process test in 3D assembly.
Brüel & Kjær’s radiation-resistant accelerometers
Vibration measurements in harsh industrial environments is much easier for engineers with Brüel & Kjær's new Type 8347-C Accelerometer. The Type 8347-C accelerometer can withstand temperatures ranging from -196°C (-321°F) to +482°C (+900°F) and has high resistance to radiation.
Prism Sound’s New dScope Series IIIE Audio Analyzer Raises The Bar In Terms Of Functionality Versus Price
Audio test and measurement specialist Prism Sound continues its innovative product development strategy by introducing a new analogue and digital audio analyzer that sets a new benchmark in terms of functionality versus price.
Noise XT Introduces NXA Series One-box Phase Noise Analyzers
The NXA Series simplifies phase noise testing by incorporating a completely new one-box system design. With a category-leading 14-inch touch screen and a redesigned user interface, phase noise measurement is now faster and easier.
Extended Integration of GOEPEL electronic’s Boundary Scan into Rohde & Schwarz TSVP Platform
The enhanced OEM cooperation between Rohde & Schwarz and GOEPEL electronic enables additional options for customer-optimized utilisation of the R&S TSVP. Applying the extended combination of functional/in-circuit test and Boundary Scan, users are now able to achieve an even higher test depth and test speed.
Accurate fast sensor system and frequency measurement IC
MMS Electronics has made available the Universal Sensor and Transducer Interface (UFDC, USTI and USTI-EXT). The USTI can measure analogue sensor signals (capacitive and resistive) but also quasi-digital sensors.
Multi-function JTAG Module Addresses Analogue Testing
JTAG Technologies has introduced the JT 2149/DAF, a compact, mixed-signal measurement module. The JT 2149/DAF is the first unit of its type to offer both digital and analogue test access to PCBs via JTAG Technologies' widely-used QuadPod signal conditioning interface.
Agilent Technologies Introduces World's Fastest USB Power Sensors
Agilent Technologies Inc. today announced the Agilent U2020 X-series, the world's fastest USB power sensors. With the peak and average power measurement capabilities of a power meter, these compact high-performance sensors allow engineers to test devices faster and with greater efficiency and accuracy.
SCALEXIO: Test Systems That Evolve
With its latest update, dSPACE SCALEXIO makes it easy to scale hardware-in-the-loop simulation for large, computationally demanding simulation models and large quantities of input and output channels. Extensive models with numerous I/O channels can now be distributed conveniently across several processor cores to guarantee real-time simulation. SCALEXIO also provides adaptable failure simulation technology that scales with growing numbers of I/O channels.
Agilent Technologies Announces Next-Generation MIPI D-PHY Protocol Exerciser/Analyzer for High-Definition Mobile Computing Applications
Agilent Technologies Inc. today announced Agilent's next-generation U4421A MIPI D-PHY exerciser and analyzer for mobile computing applications. This new instrument gives R&D and manufacturing engineers deep insight into the CSI-2 and DSI of MIPI D-PHY designs.
Agilent Technologies' Newest 3D-EM Software Release Increases Integration with Circuit Design Flow
Agilent Technologies Inc. today announced the latest release of its Electromagnetic Professional software. EMPro 2012 will make it easier to create 3-D models and analyze the electrical performance of packages, connectors, antennas, and other RF and high-speed components.
Agilent Technologies Introduces Highest Performance Mid-Range Vector Network Analyzer
Agilent Technologies Inc. today introduced five new PNA-L vector network analyzer models, offering design and manufacturing engineers the highest performance (up to 50 GHz) in a mid-range VNA, along with lower cost and future-proof capabilities. Agilent's new N523xA PNA-L vector network analyzers replace existing N5230C models.
New Entry Level Computed Tomography for Electronics Manufacture Quality Control
A Computed Tomography option, allowing 3D inspection of components, is now available with the phoenix x|aminer 2D microfocus X-ray inspection system from the Inspection Technologies business of GE Measurement & Control. The recently introduced 5-axis phoenix x|aminer is particularly suitable for the rapid and accurate 2D inspection of soldered joints on a production line.
Analog Devices Introduces Industry’s Lowest Power MEMS Accelerometer
Analog Devices, Inc. introduced today the industry's lowest power MEMS accelerometer. The ADXL362, 3-axis, digital MEMS accelerometer operates at 300 nA in motion sensing wake-up mode, consuming 60 percent less current than the closest competing sensor in the same mode.
Multitest’s InCarrier Is Now Available In A Wide Range of Loading and Unloading Configurations
Multitest announces that its InCarrier Loader/Unloader is available in a variety of configurations, e.g. for loading from tube, bowl, tray and for unloading into tube, bulk or metal mag in any combination. Additionally, partner solutions for loading from wafer ring or unloading into tape-and-reel can be offered.
Advantest Announces 3D TSV Stack Test Solutions
Advantest Corporation today announced that a new product line of fully automated and integrated test and handling solutions for TSV based 2.5D and 3D products is under development. The concept model test cell dubbed, DIMENSION, integrates a high parallel test cluster along with singulated die and 3D die stack automated handling capabilities.
Advantest Announces Memory Test System T5811
Advantest Corporation today announced its new memory test system, the T5811, targeting DRAM memory core test. Available from July 2012, the T5811 reduces power consumption by 90% and floor-space requirements by two-thirds, compared to previous models, and is upgradable via a simple exchange of components.
Advantest to Launch CloudTesting Service in Fall 2012
Advantest Corporation today announced that it will launch a new test solution, dubbed CloudTesting Service (CTS), which utilizes cloud computing technology to offer cutting-edge test technology for semiconductor device R&D and design applications.
NI Extends PXI Leadership With New Chassis That Improves System Uptime
National Instruments today introduced the NI PXIe-1066DC 18-slot chassis, which adds high-availability features to the PXI Express platform to maximize system uptime. These features improve the system-level mean time before failure and mean time to repair of PXI systems in many demanding, mission-critical test, measurement and control applications.
Advantest Ships 100th V93000 Smart Scale Test System in Product Line’s First 10 Months
Just ten months after launching its Smart Scale generation of testers, Advantest Corporation has shipped its 100th V93000 Smart Scale system, capable of scalable, highly cost-efficient testing of IC designs for the 28 nm technology node and beyond.
Agilent Technologies Expands Catalog of SureFISH Probes to Largest Offering on the Market
Agilent Technologies Inc. today launched additional Agilent SureFISH probes, creating the largest offering of oligonucleotide-based fluorescent in situ hybridization assays on the market. Over 425 probes are now available from Agilent, including centromere probes for all 24 chromosomes, and 35 telomere probes.
Agilent Technologies Announces Availability of Enhanced Calibration Certificate in Singapore
Agilent Technologies Inc. announced today that it is offering an enhanced Certificate of Calibration in Singapore. The new certificate includes additional measurement information and provides a tighter linkage to international standards, such as ISO/IEC 17025:2005, for quality and metrology. This will give customers added confidence in the accuracy of their electronic equipment and improve audit readiness.
Agilent Technologies Introduces New Human Gene-Expression Microarray
Agilent Technologies Inc. today introduced the Agilent SurePrint G3 Human Gene-Expression v2 Microarray, the only product available with an array of probes designed using the Broad Institute's recently published human reference catalog of large intergenic noncoding RNAs.
Analog Devices Introduces Industry’s First Analog 3-axis, High-g MEMS Accelerometer
Analog Devices, Inc. introduced today the industry's first commercially available analog, 3-axis, high-g MEMS accelerometer. The ADXL377 measures acceleration of high-impact events resulting from shock and vibration, within the full-scale range of ±200 g with no signal saturation.
Anritsu Introduces Tracking Generator with CW Generator for Spectrum MasterT MS2711E, MS2712E and MS2713E Analysers
Anritsu introduces a tracking generator for its Spectrum MasterT MS2711E, MS2712E, and MS2713E models that enhances the overall performance of the handheld analysers, whilst making it easier and faster for field technicians to conduct additional measurements.
LeCroy Announces New SATA Express SSD Decode Support for PCI Express Protocol Analysis
LeCroy Corporation today demonstrated new features added to its PCI Express protocol analyzer line of products that will support testing and debugging of all recently announced PCIe Solid State Drive host interfaces.
LeCroy Announces New 12Gb/s SAS Protocol Analyzer
LeCroy Corporation today announced the addition of the Sierra M124 12Gb/s Serial Attached SCSI Protocol Analyzer platform to its leading Sierra protocol analyzer line of products; supporting protocol testing and debugging of all 12Gb/s SAS and legacy SAS storage interfaces.
Agilent Technologies Introduces Mechanical Qualification System for Dissolution Testing
Agilent Technologies Inc. today introduced the 280-DS Mechanical Qualification System, a new instrument for routine and effortless calibration of a dissolution apparatus. The 280-DS accurately measures, verifies and documents physical parameters established with recently enhanced mechanical qualification standards, eliminating the need for visual interpretation of measurements from manual gauges.
Multitest’s Bowl Feed Option for the MT9928 Is Well Accepted by the Market
Multitest announces a new bowl feed module for the MT9928 xm gravity test handler. This option offers a state-of-the-art solution for temperature test of the smallest devices such as MLF2 and SOT. While Turret is the traditional handling solution, it does not apply when accurate temperature testing is required at hot or cold.
Advantest Introduces T5511 High-Speed Memory Test System Offering Multi-functionality and Industry’s Top Test Speed of 8Gbps
Advantest Corporation announced the availability of its next-generation high-speed DRAM test system, the T5511. The new system, which begins shipping this month, offers the industry's fastest test speed of 8Gbps.
Noise measurements to finished report: The fastest route
Measurement Partner Suite is the free, new post-processing software for Brüel & Kjær's sound level meters and hand-hand analyzers. For the first time, Brüel & Kjær now includes post-processing functionality in the same program that users upload their data to.
With the UDE 3.3, PLS presents the first optimized test and debug solution for the new AURIX 32-bit multi-core MCUs
As a result of the very early and close cooperation with Infineon Technologies and several key customers, PLS now presents the first optimized test and debug solution, the Universal Debug Engine (UDE) 3.3, for the new multi-core architecture of the 32-bit microcontroller family AURIX.
ClareHAL104 and Safety e-Base Pro combine to deliver added test benefits
Production line and type testing across a variety of manufacturing sectors is easier and faster to complete with the ClareHAL104 and Safety e-Base Pro solution from Seaward. The ClareHAL104 and Safety e-Base Pro solution combines advanced PC control software with the latest multi-function safety tester technology to enable end-users in the avionics, appliance, lighting, defence and electronics manufacturing sectors among others to simplify and improve the efficiency of their production line systems.
LEM's new user-programmable HO current transducers
LEM announces the HO series of current transducers, setting a new standard of performance, programmability and ease-of-use for designers of the latest generation of motor drives and inverters. The HO series of open-loop ASIC based current transducers deliver better performance in areas such as thermal drift, response time, power supply and noise driven by technology advances in power electronics applications.
Multitest ecoAmp: New Kelvin Contactor for High-Power Applications
Multitest have announced the debut of its latest Kelvin contactor — a state-of-the-art solution for high-power applications of 500+ Amperes. Current market requirements are driven by energy efficiency, energy harvesting, green energy application, mobility and more. Typically, this application can be found for MOSFET, drivers, IGBT, power modules, and power packages such as TO, SO and DIP.
National Instruments Offers Measurement Microphones Through G.R.A.S. Sound and Vibration
National Instruments today announced that NI Alliance Partner G.R.A.S. Sound & Vibration, a leading producer of acoustic front-end products, now sells microphone kits for use with NI dynamic signal acquisition (DSA) hardware.
Agilent Technologies Introduces Industry's First Integrated Product that Can Characterize All Modern Semiconductor Power Devices
Agilent Technologies Inc. today introduced enhancements to the B1505A Power Device Analyzer/Curve Tracer that significantly increase its voltage and current range to cover all devices in today's fast-growing power-device market.