Test and Measurement
Isotropic H-field probe from Link Microtek
Now available from RF radiation safety specialist Link Microtek is a new isotropic H-field probe for the Narda SRM-3000 selective radiation meter – an innovative instrument that is capable of measuring emissions from each individual source within a multiple-frequency RF environment.
Space-saving current and voltage measurement devices for hybrid and electric vehicles
Lithium-ion battery charging and discharging periods pose a great challenge for current and voltage measurement. At electronica, Isabellenhütte Heusler is presenting a sensor module (IMC) tailored to these needs. It can be completely configured according to customer requirements.
Keithley Creates RF Communications Toolkit Software to Provide Both Signal Generation and Analysis
Keithley Instruments has expanded its powerful SignalMeister software platform to now include RF signal analysis along with RF signal generation. First introduced in 2007, SignalMeister software is now the only software package on the market that integrates signal generation and analysis into one package for unmatched speed and simplicity. Furthermore, SignalMeister now has the capability of generating and analyzing both single-input single-output (SISO) and multiple-input multiple-output (MIMO) signals in the same environment.
National Instruments Expands High-Speed Digitiser Product Line
National Instruments has announced the expansion of its digitiser product line with the introduction of three new digitisers/PC-based oscilloscopes. The 500 MHz NI PXI-5153 and NI PCI-5153 and the 1 GHz NI PCI-5154 modules round out the NI 515x series of digitisers, following the introduction of the NI PXI-5154 in July. With the NI 515x series, engineers can take advantage of a complete line of high-speed digitisers – with 300 MHz, 500 MHz and 1 GHz bandwidths – for demanding automated test and streaming applications where high-bandwidth measurements are required.
Aeroflex launches TM500 TD-LTE test mobile
Aeroflex has launched the TM500 TD-LTE test mobile designed to support Time Division Duplex for 3G LTE (TD-LTE). Complementing Aeroflex's highly successful TM500 LTE-FDD for 3G LTE Frequency Division Duplex, which has been successfully deployed worldwide since 2007, the TM500 TD-LTE test mobile is designed to enable infrastructure equipment vendors match the demanding timescales for TD-LTE trials in China.
Tektronix SignalVu Analyzes RF Signals Up to 20 GHz Bandwidth
Tektronix has announced SignalVu vector signal analysis software for DPO7000 and DPO/DSA70000 digital oscilloscope series, enabling engineers to easily characterize and validate wideband and microwave spectral events.
Hermon Labs TI Introduces IP Testing Equipment
Hermon Laboratories has announced its new test equipment TCA 4100 low cost PC Based solutions is initially offering for VoIP and SIP (H.323). Both solutions are available as optional add-ons plus VQT (PESQ), and acoustic testing with HATS. SIP solution is also available as a standalone software application.
Ubiquisys Employs Keithley RF Test Systems
Keithley Instruments has announced that its award-winning RF test solutions, including the Series 2800 RF Vector Signal Analyzers and Series 2900 RF Vector Generators, are established in production with Ubiquisys, Ltd., a leading developer of 3G femtocells. Ubiquisys has been using Keithley's RF test solutions as it ramps its femtocell production at Sony UK Tech.
New PXI Module enables Combination JTAG/Boundary Scan and dynamic Functional Test
GOEPEL electronic, world class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x, launched a new series of JTAG Digital I/O PXI modules named PXI 5396-x.
New Boundary Scan fixture allows structural testing of PCI Express Plug-In Cards via IEEE1149.6
GOEPEL electronic, leading manufacturer of JTAG / Boundary Scan solutions compliant with IEEE1149.x, announced the launch of a new interface test fixture, CION Fixture™ /PCIe-x16, a further addition to the popular CION Fixture™ family. The new low cost fixture provides a predefined PCI Express x16 Slot, in which the card to be tested is inserted and thereby connected to a TAP (Test Access Port). Due to the integrated test channels IEEE 1149.1 and IEEE1149.6 virtually all PCI Express High Speed and Low Speed signal pins can be structurally tested if there are compatible interfaces.
New digital mobile radio testing capabilities enable Aeroflex 3900 Series to meet DMR test standards
Aeroflex has announced the release of a new option that enables the Aeroflex 3900 Series Digital Radio Test Set to test and align a wide range of digital mobile radio devices. DMR, a new digital radio format replacing analog private mobile radio, offers advanced communications features specified by the European Telecommunications Standards Institute technical standard 102-361. DMR technology is currently under development or being released by a number of OEM radio manufacturers and includes Motorola's new MOTOTRBO™ technology.
TTi adds value to RF power measurement
Now available from TTi is the TTi Satori range of high-performance USB based RF power measurement sensors. Their introduction follows the acquisition of the range from their original developers, Satori Technology. The initial product range will consist of the ST Series of 12.4 GHz, 18.5 GHz and 26.5 GHz USB power sensors. These devices are complete miniature power meters, each containing a CPU that controls the sensor, processes the measurement results and operates the interface.
Keithley Introduces 50MHz Arbitrary Waveform/Function Generator
Keithley Instruments, Inc has introduced the Model 3390 50MHz Arbitrary Waveform/Function Generator, featuring the highest waveform resolution and best price-to-performance value in its class. The Model 3390 is a flexible, easy-to-use programmable signal generator with advanced function, pulse, and arbitrary waveform capabilities. Superior signal integrity, faster rise and fall times, lower noise, and greater waveform memory combine to provide high quality output signals. High resolution waveforms are supported by four times the waveform memory of any competitive waveform generator on the market. Keithley is offering the Model 3390 for a special introductory price.
Tektronix Announces Test Tools for SuperSpeed USB
Tektronix has announced a comprehensive test set for the USB 3.0 specification. The high-speed serial data offering will enable customers to rapidly test their SuperSpeed USB designs.
Aeroflex launches multi-handset test mobile
Aeroflex has launched an LTE version of its industry-standard TM500 multi-handset (multi-UE) test mobile designed to enable infrastructure equipment vendors accelerate the pace of their LTE development projects. At the same time Aeroflex has announced that it has won a contract to supply a major European infrastructure equipment vendor with the TM500 LTE Multi-UE test mobile.
Philips Test Center Adopts Tektronix for HDMI
Tektronix has announced that the new Philips High-Definition Multimedia Interface (HDMI) Authorized Testing Center (ATC) in Bangalore, India has adopted the Tektronix HDMI V1.3b1 Compliance Test Solution (CTS). The adoption of Tektronix HDMI compliance test solution by Philips, one of the key founders of HDMI, reinforces Tektronix leadership for high-speed serial data and HDMI test solutions.
National Instruments Introduces Advanced Connectivity for Multisim and LabVIEW
National Instruments has announced further integration of the NI Multisim and LabVIEWplatforms. By integrating the recently released Multisim 10.1 and LabVIEW, engineers can better identify and analyse design behaviour and detect errors at the earliest stages of design. Additionally, with the beta version of the NI LabVIEW Multisim Connectivity Toolkit, engineers can now enhance circuit design.
LeCroy Introduces USB 3.0 Protocol Analyzer Exerciser System
LeCroy Corporation has announced its Voyager verification system, said to be the world's first protocol analyzer for USB 3.0, also known as SuperSpeed USB. Using custom front-end circuitry developed in conjunction with LeCroy's 5 Gbps PCI-Express platform, the Voyager analyzer provides simultaneous protocol capture of both USB 2.0 and USB 3.0 signaling. Available with an integrated exerciser option, this sixth generation verification platform is LeCroy's complete solution for testing USB devices, systems and software.
Tektronix Provides First Published Test Procedure for SATA Revision 3.0 Physical Layer Tests
Tektronix has announced availability of the first published test procedures for physical layer testing of the Serial ATA Revision 3.0 standard. Tektronix provides a comprehensive high-speed serial data test suite for the SATA physical layer design and debug.
PulseCore Semiconductor Taps Tektronix USB Serial Test Suite
Tektronix has announced that PulseCore Semiconductor has successfully used a full suite of Tektronix test instrumentation to test and validate its recently announced USB 2.0 integrated circuit. The new PulseCore IC is the first in the industry to use spread spectrum clocking (SSC) to reduce electromagnetic interference while achieving USB 2.0 industry compliance.
Keithley Launches New Instrument Platform
Keithley Instruments has announced its Series 2600A System SourceMeter Instrument family. They provide unmatched ease-of-use, measurement performance, and flexibility in order to speed time-to-market for its users, lower cost of test, and simplify the process of making high performance measurements.
National Instruments Extends Environmental Monitoring Capabilities in LabVIEW
National Instruments has announced the release of a new instrument driver that gives users of the NI LabVIEW graphical system design platform the ability to interface with environmental monitoring sensors that communicate via SDI-12, a serial-based communication protocol optimised for battery-powered intelligent sensors. With NI LabVIEW SDI-12 Application Programming Interface (API)software, researchers, engineers and scientists can easily acquire measurements such as turbidity, dissolved oxygen, tank level, soil pH, conductivity and other critical environmental sensor measurements.
Compact MID-compliant energy meter from Carlo Gavazzi
Carlo Gavazzi's MID-certified and compliant family of energy meters has been enhanced by adding Dupline Fieldbus capability to the smallest and most powerful MID instrument that enables three-phase direct connection up to 65A and external CT connection up to 10A. This makes the EM24 the only such device on the market fully compatible with a complete and flexible Fieldbus system.
BAE Systems, National Instruments and Phase Matrix Introduce 26.5 GHz PXI Synthetic Instrument
BAE Systems, National Instruments and Phase Matrix Inc. have announced the availability of a next-generation, 26.5 GHz synthetic instrument based on the PXI platform for military and commercial RF and microwave applications. Synthetic instrumentation is a subset of virtual instrumentation that combines modular hardware with a software platform to create user-defined test and measurement systems. The new synthetic instrument developed by the companies is based on five new 3U PXI Express-compatible RF/microwave downconverter modules that can operate over a frequency range of 100 kHz to 26.5 GHz. The instrument also uses National Instruments PXI Express chassis, controllers and intermediate frequency (IF) digitiser modules as well as NI LabVIEW graphical development software for host and FPGA-based signal processing.
TI driving forward new IEEE 1149.7 standard
As chips add new functionality and system designs evolve away from boards and toward multi-chip system-on-chip (SoC) architectures, developers of handheld and consumer electronics are faced with stricter pin and package constraints. Texas Instruments, a key member of the IEEE working group, announced that it is driving the ratification of the IEEE 1149.7 standard, a new two-pin test and debug interface standard that supports half the number of pins of the IEEE 1149.1 technology, allowing developers to easily test and debug products with complex digital circuitry, multiple CPUs and applications software in products such as mobile and handheld communication devices. In addition to leading the development and adoption of the new IEEE 1149.7 standard, TI is also working with Freescale Semiconductor, Lauterbach Datentechnik GmbH, IPExtreme, ASSET InterTech, Inc., Corelis and GlobeTech Solutions to refine and identify implementation challenges, ensuring a streamlined and robust solution is r
NI Announces PXI Embedded Controller and New PXI System Accessories
National Instruments has announced the NI PXI-8108, what it says is the industry's fastest PXI embedded controller, and two new PXI system accessories, a 32 GB solid-state hard drive and the NI PXI-8250 system monitoring module. These new products provide increased system performance and reliability to help engineers and scientists achieve faster process execution, lower test times and longer system life.
Keithley Expands MIMO RF Measurement Capabilities with 8x8 MIMO Test System
Keithley Instruments is extending its lead in RF MIMO (multiple-input, multiple-output) test with what it says is the industry's first measurement-grade 8x8 MIMO system. The system is used for primary research of next-generation RF MIMO devices and technologies.
Low-Cost XRF Analyzer for RoHS Testing from Skyray XRF
Skyray XRF has re-designed a low-cost and compact desktop XRF model with the capability to detect lead, cadmium and other hazardous substances in finished goods. The organizations instrument line already includes a larger desktop model and a handheld portable XRF system for hazardous substance detection.
Tektronix oscilloscopes help IZT to overcome signal integrity challenges
Tektronix has announced that the Innovationszentrum für Telekommunikationstechnik GmbH (IZT), a German manufacturer of advanced digital signal processing (DSP) technologies, has selected its DSA70000 and DPO7000 high-performance Digital Phosphor Oscilloscopes (DPOs) and P7313 Z-Active probes for testing advanced telecommunications systems that employ high-speed serial buses.
Tektronix Accelerates Arbitrary Waveform Generators
Tektronix has announced the new AWG7000B and AWG5000B Series of Arbitrary Waveform Generators (AWG). The AWG B series provides a 20% performance boost over many of the prior AWG instruments and continues to be the world's fastest and most capable family of AWG's, designed to meet the test needs for high-speed serial data buses and wideband RF applications. With 9.6 GHz effective RF output, 10 bit resolution, and sample rates up to 24 GS/s, the AWG7000B is the only AWG that can produce high-speed serial waveforms with real life imperfections including noise, jitter, pre/de-emphasis and multi-level signaling up to 8 Gb/s. Also announced today is the radar signal creation option - RDR - for the RFXpress Software suite, offering the ultimate flexibility in creating Pulsed radar waveforms on the AWG7000B and AWG5000B.
ACCES I/O Releases Fast USB Digital Waveform Generator Modules
ACCES I/O Products has announced the release of its fastest USB/104 digital I/O unit to date – Model USB-DIO-16H. The unit features 16 high-speed buffered digital inputs or digital outputs at continuous, sustained streaming speeds up to 16 MB/s for fast, unlimited waveform length. The module is capable of 80 MB/s bursts with handshaking signals for synchronizing communications plus an additional 18 bits of general purpose digital I/O. The USB-DIO-16H is a port-powered high-speed USB 2.0 device and offers hot swapping functionality for quick connect/disconnect whenever you need additional I/O on your USB port.
Aeroflex announces advanced test capabilities for its 3900 Series Digital Radio Test Set
Aeroflex has announced the release of version 1.7.4 software for the Aeroflex 3900 Series Digital Radio Test Set that includes support for Motorola's Astro SmartNet/SmartZone systems. Included in this release is support for re-banded channels in the 800MHz band. This new software is available for all Aeroflex 3900 Series products currently in the field, including the 3901, the 3902 and the new 3920 Series.
Hand-held Aeroflex Radio Test Set
Aeroflex has announced the release of new software for its 3500 1GHz hand-held Radio Test Set to support Survey Technologies' Field Test 6 Software. Now, users of the Aeroflex 3500 Series can improve and automate the acquisition, analysis and display of signal strength across a given terrain, as well as inside buildings. Field Test 6 has expanded the drive-test measurement concept to include indoor measurement and analysis for applications where GPS is not available. The hand-held capability of the Aeroflex 3500, along with the Field Test 6 software, now allows users to map out their building or geographical areas and find any sections that contain a weak signal. Armed with this information users can improve critical communications within those areas.
Kikusui's modular DC Electronic Loads.
Kikusui's PLZ-U Series modular multifunction DC Electronic Load Series feature faster rise/fall times with variable slew rates for transient testing on high speed DC/DC convertors, DC power supplies, Batteries and Fuel Cells for both bench and system application.
National Instruments 1 GHz Bandwidth PXI Digitiser
National Instruments has announced a significant bandwidth increase in its digitiser offering with the introduction of the NI PXI-5154 digitiser/PC-based oscilloscope, expanding the family of more than 20 high-speed, high-resolution and high-channel-count products. The dual-channel, 1 GHz PXI-5154 digitiser offers up to a 2 GS/s real-time sample rate (20 GS/s equivalent-time sample rate for repetitive signals), making it ideal for acquisition and characterisation of fast, nanosecond-edge speeds.
Keithley's Guide to Wireless and RF Testing
Keithley Instruments has announced the availability of Advanced Measurement Techniques for OFDM- and MIMO-based Radio Systems: Demystifying WLAN and WiMAX Testing, a new guide to wireless and RF testing. This CD contains useful and informative RF testing resources, including application notes, articles, white papers, and product demonstrations, to help engineers reduce their cost of test by simplifying and solving the most challenging RF measurement applications.
Benchtop power analyser from Yokogawa
The Yokogawa WT500 is a compact benchtop power analyser which can carry out DC or single- and three-phase AC measurements at voltages of up to 1000 V and currents up to 40 A. With a basic voltage, current and power accuracy of ±0.2% and a frequency range of DC and 0.5 Hz to 100 kHz, the new instrument features a 5.7-inch colour LCD display for showing numerical, waveform and harmonic data. Extensive harmonic measurement capabilities are also available as an option.
Compact ESD Simulator from Teseq
TESEQ has announced the introduction of its latest hand held ESD simulator. The new NSG 434 is a compact and cost effective solution for air discharge testing up to 8KV and contact testing up to 6KV. Offering a saving of up to 30% over higher performance models the NSG 434 will provide testing to meet around 95% of all commonly required standards.
China’s MTNet test lab standardises on Aeroflex equipment for CDMA 1xEV-DO Rev A and A-GPS test
MTNet, the CCF accredited conformance test lab established within the Ministry of Information Industries of the People's Republic of China, has standardised on the Aeroflex 6402 AIME CDMA test platform for 1xEV-DO Rev A and A-GPS testing. MTNet selected Aeroflex following a recent public tender to upgrade its CDMA test capability to include 1xEV-DO Rev A protocol testing and A-GPS protocol and minimum performance testing.
Upgrade for Model 4200-SCS Semiconductor Characterization System Expands C‑V, I-V, and Pulsed I-V Characterization
Keithley Instruments has introduced Keithley Test Environment Interactive (KTEI) V7.1 for the company's award-winning Model 4200-SCS Semiconductor Characterization System. This software upgrade includes support for testing higher power semiconductor devices. With support for low-level device characterization through higher power devices, the Model 4200-SCS is the most complete semiconductor characterization analyzer on the market, making tough measurements easy and lowering the cost of test by protecting capital equipment investment.
