Test and Measurement
Agilent Introduces Waveform Analysis Solutions for Next-Generation Storage, Telecommunications Components and Systems
Agilent Technologies has introduced three measurement solutions for testing next-generation storage and telecommunications components and systems. The new solutions are the first of their kind in the industry and are based on the 86100C digital communications analyzer (DCA). They allow engineers to easily visualize and accurately quantify the quality of their latest component and system designs.
New models expand applications for OTDR family
Six models have been added to the Yokogawa AQ7275 Series of optical time-domain reflectometers, extending its range of applications to cover virtually all metro, access and core networks as well as fibre to the home and passive optical networks.
White Paper Describes Semiconductor Characterization and Parametric Test Challenges
Keithley Instruments has published a white paper on how semiconductor characterization and parametric test solutions are evolving to keep pace with rapid changes in the semiconductor industry. The white paper, which can be downloaded at www.keithley.com/navigate, describes the emerging technology and business dynamics affecting the industry, including the growing need for vendor support.
Time switches maximise energy saving through astrological programming
Finder has launched a pair of digital weekly time switches providing a programming capability enabling switching according to local sunrise and sunset times, that are automatically calculated from user input of current date, time and either local longitude and latitude or nearest major city.
Keithley Upgrades SCS For Solar Cell Testing, Expanded C-V Frequency Range, and Nine-Slot Chassis Support
Keithley Instruments has introduced a variety of hardware, firmware, and software enhancements to its award-winning Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive (KTEI) V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system's Capacitance-Voltage (C-V) measurement capability, and support for the company's new nine-slot Model 4200-SCS instrument chassis.
Mixed-Signal Interconnect Solution for Semiconductor Device Probers and Characterization Equipment from Keithley
Keithley Instruments has introduced what it says is the test industry's only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current‑Voltage (I‑V), Capacitance‑Voltage (C‑V), and pulsed I‑V testing connections from any modern semiconductor parameter analyzer to a Cascade Microtech or SUSS MicroTec prober. The cables are designed for compatibility with Keithley's Model 4200‑SCS Semiconductor Characterization System, as well as with other test instruments used for characterization.
Agilent to Collaborate with ASTER for Seamless Test Coverage Analysis Across Test Platforms
Agilent has announced a strategic partnership with ASTER Technologies to enable integration of ASTER's TestWay Coverage Analyst with Agilent's printed circuit board assembly test platforms, enabling seamless test coverage analysis across test platforms.
Agilent's Portfolio Now Includes Industry-First Automated USB SuperSpeed Pattern Generator Calibration
Agilent has announced it has expanded its Universal Serial Bus (USB) test portfolio with the industry's first automated calibration of a USB 3.0 pattern generator required for receiver test. This enhancement will significantly reduce test system setup time and is a major step toward fully automated receiver tests.
Aeroflex and Icom in joint relationship for automated tests and alignment of Icom radios
Aeroflex has announced an agreement with Icom Inc. to provide automated test and alignment capabilities for Icom radios on the Aeroflex 3920 Digital Radio Test Set. Initial test capabilities will be focused on the IC-F9010/F9510 APCO Project 25 Conventional and Trunked Radios and the IC-F4029SDR Series dPMR Portable Digital Radios. The test programs will be expanded to include Icom's IDAS Series NXDN compatible radios and D-STAR digital amateur radios.
Keithley Webcast Seminar will explore how to Avoid Parallel Test Implementation Pitfalls
Keithley Instruments will broadcast a webcast seminar titled "Practical Tips and Tricks for Avoiding Common Pitfalls when Implementing Parallel Test" on Thursday, March 26, 2009. This one-hour seminar will offer guidance on migrating from sequential test to parallel test and explore ways to maximize resource utilization, balance system controller duties efficiently, and manage control of test timing and sequencing.
Aeroflex announces expansion of XTS-5000 Auto-Test II Option to include other Motorola models
Aeroflex has announced the expansion of the XTS-5000 Auto-Test II Automated Test and Alignment Option for the 3920 Digital Radio Test Set. This option provides automated test and alignment of Motorola XTS and XTL Series Radios. The latest version includes support for additional Motorola portables such as the XTS-1500, XTS-2500, XTS-4000, SSE-5000 and MT-1500. It also includes support for the XTL-1500, XTL-2500 and XTL-5000 mobiles.
Aeroflex announces support for NXDN radios
Aeroflex has announced support for new NXDN radios being developed for the land mobile radio market. As a member of the NXDN Forum, Aeroflex is leading the way with new test features that aid in the research and development of this exciting new radio technology.
Portable Measurement System with two free slots
With the SPPortA2, Spectrum has enhanced its range of system solutions around the main product area of measurement cards. Customers, seeking for a complete system solution, now have an additional choice besides an individual PC solution and a Docking solution for Laptops.
Software extends capabilities of Aeroflex 3500 Series hand-held Radio Test Set
Aeroflex has announced the latest software features for the 3500 Series hand-held Radio Test Set. Software version 3.5.1 includes new features to extend the test capabilities of the 3500 Series, such as a new Tracking Generator Option which allows users to test and align duplexers quickly in the field. The updated software also provides support for the P25 Testing Option.
Aeroflex 3920 Digital Radio Test Set now includes EIA/TIA-603 Compliance Test for FM land mobile radios
Aeroflex has announced it has enhanced its Auto-Test II test function for the Aeroflex 3920 Digital Radio Test Set. The Auto-Test II application now performs test functions as prescribed by the EIA/TIA-603 standard for testing any FM Land Mobile Radio. This option allows development groups, manufacturers and field service operations to verify that FM Land Mobile Radios perform to specifications.
IR Introduces Testing Services for Commercial Products Used In Military, Space and Heavy Industrial Applications
International Rectifier has announced that its HiRel Business Unit has launched Testing Services to customers seeking critical electrical, reliability and qualification testing. IR's new suite of testing services addresses the growing need for electrical and environmental testing of hermetic and non-hermetic (plastic) components required by customers in a range of high reliability market segments.
Outram Research Improves Quality of Power Measurements with IEEE1459
Outram Research has enhanced the functionality of its market leading Ranger PM7000 Power Quality Analyser, the industry's only Cat IV 600V Phase A-powered analyser, with the addition of support for capture of IEEE 1459 and IEEE 100 parameters. The new functionality allows users to more effectively measure useful power, fundamental reactive power and distortion power to help resolve a wide range of power quality problems.
Agilent Technologies Introduces DDR3 Test Suite and claims Industry's Fastest Full Channel Logic Analysis Tool
Agilent Technologies has introduced the industry's first and most comprehensive DDR3 protocol debug and validation test suite for digital designers developing computer and embedded memory applications. The test platform offers the industry's fastest full channel 2.0GT/s 16962A logic analysis module, a complete probing portfolio for DDR3 BGA and DIMM, and the first DDR3 compliance and performance software environment.
Non-contact torque measurement from Sensor Technology
Soon to be announced is TorqSense RWT330/340 series, designed for use in applications where space is limited. Like other units in the TorqSense family, the RWT330/340 provides non-contact measurement of torque, speed, power and position of rotating shafts, such as machine drives, drive shafts for pumps, fans, mixers etc, and in the critical axes of test rigs.
Keithley Discontinues its S600 Series Parametric Test Product Line
Keithley Instruments has announced that it is discontinuing its S600 Series parametric test product line. The Company will continue to accept orders for S600 Series testers until February 2010 and will continue to provide technical support, calibration, and repair services for five years through February 2014.
Yokogawa completes package for automotive bus testing
With the launch of the new DLM2000 mixed-signal oscilloscope, Yokogawa Europe is now able to offer a complete package of test & measurement solutions for analysing the serial bus systems that are increasingly being used in the automotive sector.
Protocol and network analyzers meet the 802.15.4/ZigBee development and implementation challenges
The ZigBee short range wireless protocol is achieving maturity. With more than 12M chips shipped during 2008, the protocol is gaining momentum in Smart Energy, health care, home automation and many other applications.
Worldwide unrivalled Angled-View in GOEPEL electronic’s AOI Systems
GOEPEL electronic is now providing a module for angled-view inspection in its Automated Optical Inspection (AOI) systems. The new module generates a hitherto unrivalled field of view with excellent image quality at a 45° angle. With this the orthogonal camera's entire inspection area is covered. Making the inspection of solder joints and components concealed by other components much more accurate. Images can be captured from any angle position in 1° steps.
Keithley Web-Based Seminar Covers Hall Effect Measurements
Keithley Instruments will broadcast a free, web-based seminar titled "Hall Effect Measurements Fundamentals" on Thursday, February 19, 2009. This one-hour seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization. To register for this event, visit www.keithley.com/events/semconfs/webseminars.
Production line tester for medical electronics from Clare
Electronic medical equipment manufacturers can take advantage of a new test unit from Clare Instruments which improves the electrical safety and compliance testing of equipment in accordance with the 60601 set of standards.
Link expands in-house test capability with new Agilent network analyser
The Engineering Division of RF and microwave specialist Link Microtek has enhanced its in-house test facilities with the addition of a new Agilent PNA-L network analyser. Covering the frequency range 10MHz to 40GHz, the analyser is ideal for measuring a variety of microwave performance parameters, including VSWR, insertion loss, return loss and power.
Pico Technology Adds More To Picoscope Oscilloscope Software
PicoScope, the PC Oscilloscope software from Pico Technology, is said to be one of the best-known oscilloscope packages on the market. Its carefully designed ergonomics and clear, uncluttered layout have set a benchmark for PC Oscilloscope displays.
Keithley Releases its 2009 Test And Measurement Product Guide
Keithley Instruments, Inc has announced the release of its 2009 Test and Measurement Product Guide. The 144-page guide offers details and technical specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test.
Intepro to Demo Battery Test System For Flight Line Support at Aerospace Testing 09
Appearing for a second time at Aerospace 09, the premier aerospace design, test and manufacturing show, Intepro Systems will be demonstrating its new IBT700 aircraft battery test system on stand – B144.
National Instruments Expands Sound and Vibration Product Offerings for Machine Diagnostic Applications
National Instruments has announced the release of NI analysis and signal processing tools for noise, vibration and harshness (NVH); machine condition monitoring; and audio test applications. The NI Sound and Vibration Measurement Suite Version 7.0 extends analysis functionality with NI LabVIEW virtual instruments (VIs) for performing psychoacoustic measurements, making it possible for engineers to quickly set up tests to quantify sound quality.
Energy meter allows direct 3-phase connection to 65A
The latest MID-compliant energy meter from Carlo Gavazzi is said to be the smallest device in the industry to offer direct three-phase connection up to 65A. Just four DIN modules wide, the EM23 DIN is also simple to use and easy to install, providing comprehensive and accurate measurements for energy cost sharing, cost allocation and utility metering applications.
Tektronix Expands TriMode Probe Series
Tektronix has announced new offerings of its active differential probes that complement the full portfolio of new DPO/DSA70000B Series real-time oscilloscopes also announced today. The expanded P7500 probing family now offers performance probes for 4, 6 and 8 GHz in addition to the previously available industry setting benchmark ultra-performance probes at 13, 16 and 20 GHz – all providing superior signal fidelity with fast rise time, low circuit loading and unique patented TriModeTM measurement switching.
Production line electrical testing boost with new Clare PowerSmart
Significant improvements in production line electrical safety testing are provided with the new PowerSmart automation and leakage test module by Clare Instruments. The module provides full leakage testing to EN 60990 and displays run test voltage and current during the functional tests. The power for the functional test can be either the internal supply or from the external connected electrical safety tester.
Lowest Cost Handheld XRF Analyzer Released by Skyray XRF
Skyray XRF (USA) has released the newest version of their Handheld XRF Analyzer to the North American market. The Pocket-III builds upon the strengths of previous versions with the addition of various features and application capabilities.
National Instruments' Top Trends in Test and Measurement for 2009
As the global economic climate places additional constraints on budgets, test engineers are challenged to identify ways to test devices more efficiently than ever before. National Instruments has identified three trends – software-defined instrumentation, parallel processing technologies and new methods for wireless and semiconductor test – that will significantly improve the efficiency of test and measurement systems in 2009.
Aeroflex secures first sales in China for TM500 TD-LTE test mobile
Aeroflex has announced that it has secured a series of sales for the recently launched TD-LTE version of its market-leading TM500 test mobile from various leading suppliers of cellular mobile infrastructure equipment in China. These orders for the new TM500 TD-LTE further strengthen Aeroflex's position as the leading provider of test mobiles for LTE, HSPA and WCDMA.
Curve tracer for parametric testing of high-speed devices
A high-speed, high-accuracy real-time V/I curve tracer that is ideally suited to carrying out DC parametric testing on semiconductor and optoelectronic devices has been introduced by Yokogawa Europe. The new compact, lightweight unit consists of the Yokogawa GS820 multichannel source measure unit and the 765670 curve tracer software, which runs on a PC connected to the GS820 via a USB link.
TESEQ's Multifunction ESD Generator
TESEQ has announced the introduction of its new NSG 3040 ESD test generator. The NSG 3040 is small, smart and has a high-contrast 7in touch-screen colour display and rotary control wheel to simplify programming with simple and intuitive operation. With its open modular architecture, the NSG 3040 is the ideal immunity test system for smaller engineering laboratories. The NSG 3040 offers outstanding capabilities to demanding EMC test companies and allow simple integration into production test processes.
National Instruments Measurement Studio 8.6 Offers Complete Support for Visual Studio 2008
National Instruments has announced Measurement Studio 8.6, which increases test and measurement functionality for Visual Studio 2008, the latest Microsoft development environment. Measurement Studio 8.6 features the industry's first complete set of .NET and C++ class libraries, tools and data acquisition and instrument control driver support for Microsoft Visual Studio 2008, Microsoft Foundation Class Library (MFC) 9.0 and the .NET Framework 3.5. Engineers using .NET can also use Measurement Studio 8.6 to support applications with select modular instruments by building benchmark applications in Visual Studio 2008.
Keithley’s Component Test Solution Combines Ease of Use with Curve Tracer Capabilities
Keithley Instruments has announced its ACS Basic Edition, characterization and curve tracer software for component test applications. The latest addition to Keithley's powerful Automated Characterization Suite (ACS) family, ACS Basic Edition integrates with the industry's broadest range of source-measure units, Keithley's SourceMeter Instrument family. ACS Basic Edition, pared with Keithley's proven line of SourceMeter instruments, replaces obsolete curve tracers with a solution that performs both basic curve tracing as well as parametric test while providing a remarkable cost breakthrough.