Test and Measurement
Keithley Microsite Offers Access to Informative Photovoltaic Measurements Seminar, Online Solar Cell Demo
Keithley Instruments has created an application-specific microsite for those responsible for characterizing solar/photovoltaic devices. "Simplify Your Solar Cell Testing with Keithley's Precision Measurement Solutions" describes Keithley's high accuracy solutions for solar cell I-V and C-V characterization, which allow high speed testing without the hassles of integrating separate instruments or writing complicated programs. It also describes key solar cell parameters and measurement techniques. To visit this microsite, go to www.keithley.com/solar_cell.
Agilent Technologies Introduces NanoSuite 5.0 Software for More Powerful Nanomechanical Testing
Agilent Technologies Inc. today announced the availability of a new, more powerful version of its popular NanoSuite software package. Designed for use with the company's line of nanoindentation and tensile-testing instruments, Agilent NanoSuite 5.0 software offers advanced features such as enhanced imaging capabilities, survey scanning and a new test method development environment. All NanoSuite 5.0 functions have been optimized to help researchers run tests and manage data with unprecedented speed and ease.
Tektronix and National Instruments to Unveil Joint Product Initiative at NIWeek
Tektronix and National Instruments today announced that the two companies have extended their more than 20-year relationship by unveiling plans to co-innovate on new products that will improve productivity and lower costs for engineers and scientists working in design verification, manufacturing test, scientific research, and embedded test. The two companies will unveil specific details at NIWeek 2009 scheduled for Aug. 4–6 in Austin, Texas.
Verigy - SmartRA Redundancy Analysis Option for its V6000 WS Memory Test System
Verigy, the semiconductor test company, today introduced SmartRA (Scalable Memory Redundancy Technology), a memory redundancy analysis (RA) option for its V6000 WS test system. SmartRA provides a scalable, flexible, cost-effective solution that allows manufacturers to meet the expanding fail storage and performance requirements of redundancy analysis for DRAM.
LEM - 2nd generation Wi-LEM wireless sub-metering components
LEM has extended its Wi-LEM (Wireless Local Energy Meter) family to allow the remote measurement and monitoring of electricity, water and other metered utilities as well as temperature and humidity. It allows industrial and commercial enterprises to break down energy and water usage and identify areas of efficiency improvement. All the new Wi-LEM components feature a ten-fold increase of RF power from 1mW to 10mW, increasing the distance between nodes compared to the previous LEM generation of components.
Yokogawa - Power meters certified for testing standby power to new IEC 62301 standard
The Yokogawa WT3000-2A and WT210 digital power meters are now certified to carry out the standby power tests specified in the new IEC 62301 standard, which defines the standby mode as the lowest consumption of an appliance not performing its main function, when connected to the mains.
Peak Group - Switch probe for voltage-free applications
The P201/GVF from Peak Test Services is a normally open switch probe with built-in isolation for use in voltage-free ICT (in-circuit test) applications where the circuit under test needs to be isolated from voltages applied by the measurement circuitry.
National Instruments Delivers Advanced Data Management Capabilities With New Version of DIAdem
National Instruments has announced NI DIAdem 11.1, a new version of the interactive software for managing, analysing, visualising and reporting test data that includes new features and filtering capabilities for advanced development and automated analysis. DIAdem is designed to help engineers make informed decisions and meet the demands of today's testing environments, which require quick access to large volumes of scattered data, consistent reporting and data visualisation.
Agilent and Mu Dynamics Integrate Solutions to Accelerate Deployment of Scalable, Secure, Reliable Networks
Agilent Technologies and Mu Dynamics today announced a collaboration to tightly integrate Agilent's industry-leading N2X multiservices test solution with Mu's award-winning Test Suite family. The integration, already in use at leading network operators and their vendor suppliers, accelerates the design and automation of tests to evaluate the impact of unexpected device/systems scenarios on network performance and reliability. The testing emulates real-world scale and traffic in out-of-service lab environments, eliminating the need for operationally costly large test beds of network equipment. The companies coauthored a testing methodology that will enable shared customers to extend the integration to a wide variety of test scenarios.
Agilent Technologies - Rugged FieldFox RF Interference Analyzer
Agilent Technologies has introduced an interference analyzer option for its popular FieldFox RF Analyzer, the world's most integrated RF handheld for wireless installation and maintenance (I&M). The company also introduced new, industry-first spectrum analyzer features.
Verigy - Zero-Footprint Tester for Cost-Sensitive ICs and Microcontrollers
Verigy has introduced the V101, a low-cost, zero-footprint, 100 MHz tester-on-board system for wafer sort and final test of today's most cost-sensitive ICs and microcontrollers. The V101 addresses the extreme low cost requirements of these devices and intense time-to-market pressures.
The TF930 3 GHz universal frequency counter incorporates a USB interface for remote control and readback
The new counter has a frequency range from 0.001 Hz to over 3000 MHz with high sensitivity across the range. The high-quality TCXO timebase is stable to within ±1 part in 106 over the full temperature range, and provides a low aging rate. Its short warm-up time allows accurate measurements to be made even under portable battery-powered conditions.
Agilent Introduces Full Suite of Oscilloscope Probe Positioners
Agilent Technologies has introduced four new oscilloscope probe positioners. The N278xA Series probe positioners provide quick and stable probe positioning for making measurements on PC boards and other devices that require hands-free probing.
Matrix Card Expands Keithley’s Series 3700 System Switch/Multimeter Family
Keithley Instruments has announced an expansion of its Series 3700 System Switch/Multimeter and plug-in card family with the addition of a new plug-in switching card, the Model 3731 6´16 High Speed, Reed Relay, Matrix Card. Its voltage and current characteristics (200V, 1A switched or 2A carry signal capacity) make it ideal for use in multi-channel I-V testing in conjunction with Keithley's Series 2600A System SourceMeter instruments.
Agilent's Audio Analyzer Quantifies Performance of Audio Components
Agilent has introduced a single-unit solution - the U8903A audio analyzer -- that helps users quantify characteristics that affect sound quality in audio devices. The Agilent U8903A is also the next-generation replacement for the widely used legacy 8903B audio analyzer.
Test mobile with DC-HSDPA support is a first says Aeroflex
Aeroflex claims another world first for its market-leading TM500 test mobile with the launch of support for the new 3GPP W-CDMA Release 8 Dual Cell HSDPA (DC-HSDPA) feature. Building on the Aeroflex TM500's existing Release 7 HSPA+ solution, the launch of DC-HSDPA support provides network infrastructure equipment manufacturers with the early access to the test capabilities they need to speed its development and deployment.
Livingston's new rental agreement with Agilent
Livingston has announced a rental agreement with Agilent, which came into effect this spring. The agreement is seen as an opportunity to increase Livingston's footprint globally, and further their continued expansion into the RF, microwave, aerospace and defence markets in Europe, the Middle East and Africa.
Aeroflex and w2bi agree to develop new LTE handset certification platform
Aeroflex and w2bi have announced that they have entered into an agreement under which they will pool their test expertise and technology for the joint development of a network certification platform for LTE mobile devices.
Stanford Research function generator with 10% discount and FREE GPIB interface
Lambda Photometrics is currently offering the Stanford Research Systems DS345 30MHz function generator with a 10% discount and FREE GPIB interface. The versatile DS345 30 MHz function generator can generate sine, square, ramp, triangle and arbitrary waveforms with 1 microHz resolution.
GOEPEL to run free Boundary Scan Training Days in UK
GOEPEL electronics is offering a free JTAG/Boundary Scan Training Day at the premises of interested parties located in UK and Ireland. The respective seminar is addressing system architects, R&D engineers as well as test production engineers to find out how versatile and effective JTAG/Boundary Scan is for the test, programming and emulation of boards and whole systems.
Keithley Adds Free Graphing Toolkit to Series 3700 System Switch/Multimeter Firmware
Keithley Instruments has announced the addition of a Web-browser-based, multi-channel graphing toolkit capability to its Series 3700 System Switch/Multimeter family. This new data visualization capability, which is included at no charge in the firmware for all new Series 3700 mainframes, offers users a quick and easy way to observe measurement data vs. time as channel measurements are made with the optional built-in digital multimeter, without the need for programming or any data file manipulation.
Keithley at this weeks Femtocells World Summit 2009 in London
During the Femtocells World Summit 2009 in London, June 23 - 25, 2009, representatives from Keithley Instruments will be on hand to demonstrate the Keithley-ACE Solution manufacturing test solution for femtocells based on the picoChip PC202 Integrated Baseband Processor and the PC205 High Performance Integrated PHY Processor.
Boundary Scan Software Platform features Automatic Program Generator for functional Emulation Test of Bus Components
GOEPEL electronic has announced the introduction of a fully automatic program generator specifically for the dynamic test of on-board system bus structures in the context of the Boundary Scan software platform SYSTEM CASCON. The newly developed tools are based on the innovative VarioTAP technology for functional emulation tests and enable a complete automation of the test vector generation, as well as for the error diagnostics for the first time ever.
Agilent Technologies' InfiniiSim Waveform Transformation Software Lets Engineers View Waveforms Anywhere in High-Speed Digital Systems
Agilent Technologies Inc. today announced waveform transformation software for its Infiniium 9000 and 90000 Series oscilloscopes. The software lets engineers view waveforms at any point in a high-speed serial data system, including PCI Express(r), USB 3.0, SATA and DisplayPort systems. It provides de-embedding, virtual probing and simulation tools for real-time analysis that help engineers characterize their systems more thoroughly and improve measurement margins.
High-speed 16-bit digitiser card has 125MHz bandwidth
The new Razor family of high-speed, high-performance digitiser cards has been released by GaGe Applied. The new multi-channel 16-bit digitisers feature up to four channels, 100 or 200 MS/s maximum sampling per channel, up to 2 GS of on-board memory, and 65 or 125 MHz bandwidth.
Aeroflex expands PXI platform with new high-power signal generators for RF component test
Aeroflex has announced it has expanded its flexible PXI modular test platform with the addition of two new 3020 Series high-power and compact RF signal generators. The 3020 Series are compact, high-precision PXI modular RF signal generators with integrated dual-channel arbitrary waveform generators ideally suited for R&D manufacturing and design verification of RF components and systems. The addition of the 3021C and 3026C extend the output power range of the 3020 Series to +17dBm for frequencies up to 3GHz and 6GHz respectively.
New Upconverter Supports Transceiver Test, Simplifies Test System Design
Keithley Instruments has introduced the Model 2891-IQ Upconverter, which provides comprehensive support for transceiver testing by processing analog I and Q baseband signals for testing a transceiver's transmitter, as well as processing analog I and Q output signals for testing a transceiver's receiver.
Universal Boundary Scan tester for production integrates test electronics directly in the fixture
GOEPEL electronic recently introduced the development of JULIET (JTAG UnLimItEd Tester), a family of completely integrated stand-alone production testers. The modular systems combine all test electronics, as well as the basic mechanics in a compact desktop system. Furthermore, they are equipped with a specific interface to an exchangeable adaptor giving fast changes to accommodate different Units Under Test (UUT).
Murata's long lead thermistor gains automotive qualifications
Murata's Thermo-String long lead thermistor range for monitoring the temperature of areas that are hard to reach with surface-mount thermistors is now fully qualified for automotive use. Hot spots may not always be on the PCB or motherboard, so Thermo-String's long leads of up to 150mm allow the head of the thermistor to be situated as close to the problem area as possible, even in narrow or small locations.
Gigahertz Photon Detection Module From PerkinElmer
PerkinElmer has announced the introduction of its new Gigahertz Photon Detection Module (GPDM) for analytical and clinical diagnostic applications under low light level conditions. The new module, the latest addition to PerkinElmer's Channel Photomultiplier family, offers the world's highest dynamic counting range between 1 cps and 1 Gcps in a single operating mode, coupled with extremely low noise performance. As a result of the new Gigahertz module's high dynamic range and high signal to noise (S/N), OEMs can perform fluorescence and luminescence measurements with a single detection system.
LEM introduces triple current measurement in single housing
LEM has introduced the HTT series of PCB-mounting current transducers to provide the facility to measure three currents with a single PCB-mounted unit. The new transducers, with maximum measurement currents ranging from 25 to 150 ARMS, allow three-phase currents to be monitored independently by a unit occupying a mounting area of only 16.8 cm2 and with a height of only 29 mm.
Verigy Receives Frost & Sullivan 2009 Product Innovation of the Year Award for Flash and DRAM Test Platform
Verigy, a semiconductor test company, has announced it has been awarded the 2009 Product Innovation of the Year Award from Frost & Sullivan for its V6000 tester platform. Introduced in late 2008, the V6000 enables testing of both flash and DRAM memory on the same platform, at breakthrough cost-of-test. The V6000 is versatile and scalable across the entire semiconductor memory test process, including engineering, wafer sort and final test.
Keithley Webinar Explores Fundamentals of Semiconductor C-V Testing
Keithley Instruments will broadcast a free, web-based seminar titled "Semiconductor Capacitance-Voltage (C-V) Fundamentals," which will be presented by Electronic Design magazine. Lee Stauffer, Senior Staff Technologist for Keithley's Semiconductor Measurements Group will present the webinar and take questions from the audience at the end. The webinar will be broadcast on Tuesday, June 2, at 2:00 p.m. ET (11:00 a.m. PT).
Agilent Offers MATLAB Software with its Sampling Scopes
Agilent Technologies has announced the availability of MATLAB data analysis software with the purchase of Agilent 86100C DCA-J oscilloscopes. Combining Agilent oscilloscopes and MATLAB data analysis software enables engineers to confidently analyze, visualize and filter signals. Users are able to obtain high-quality instrumentation and data-analysis software from a single source, simplifying work processes and saving engineers' time.
Agilent Technologies to Demonstrate Industry-First USB 3.0 Tests with NEC's USB 3.0 Host Controller at Developers Conference
Agilent today will demonstrate its SuperSpeed USB test solution portfolio here at the Developers Conference. This is the industry's first high-performance SuperSpeed USB test fixture coupled with NEC Electronics' USB 3.0 host controller. Agilent will also demonstrate its complete USB 3.0 portfolio, which consists of fully automated transmitter and receiver tests that are key to efficient compliance tests and systematic product characterization of SuperSpeed USB.
Agilent Technologies' EMPro 2009 Improves Integration with Advanced Design System
Agilent has introduced EMPro 2009, the full 3-D electromagnetic design and simulation software that represents the next step in integration with Advanced Design System, the industry's leading RF and microwave design and simulation platform.
Yokogawa launches website for test & measurement products
Yokogawa has launched a dedicated web site for its ranges of test & measurement products. The new site gives full details of the company's ranges of oscilloscopes, data-acquisition systems, digital power meters, signal sources, and optical and wireless communications test equipment.
Agilent Technologies, Net-O2 Technologies Announce World's First MEF 21 Conformance Test Suite
Agilent Technologies and Net-O2 Technologies has announced what it says is the world's first MEF 21 conformance test suite. This test suite is the result of integrating Net-O2's ATTEST MEF 21 Link OAM protocol conformance test suites (CTSs) into Agilent's N2X multiservices test solution
Free Keithley Web-Based Technical Seminar Explores Electrical Measurements of Photovoltaic/Solar Cell Devices
Keithley Instruments will broadcast a free, web-based seminar titled "Photovoltaic Measurements: Testing the Electrical Properties of Today's Solar Cells." It will be broadcast on Wednesday, May 27. This one-hour seminar will provide an overview of the electrical measurements used in photovoltaic device development from basic research to early production testing. To register for this event, visit www.keithley.com/events/semconfs/webseminars.
Power meter complies with latest obligatory EN standards on harmonics testing
The Yokogawa WT3000 digital power analyser equipped with IEC harmonics testing software complies with the latest EN standard on harmonics testing: EN61000-3-2:2006. IEC Standard 61000-4-7 Ed. 2, which is now obligatory as the test method for harmonics testing, specifies that the test instrument must be able to accept current input signals with a crest factor (peak current divided by RMS current) of at least 4 for inputs up to 5 A RMS, 3.5 for inputs up to 10 A RMS and 2.5 for higher RMS currents.