Test and Measurement
Anritsu - LTE Device and Testing
In July, Anritsu and a leading device manufacturer in South Korea successfully demonstrated end-to-end LTE calls over an air interface. Over the last few months a number of mobile network operators have declared intent to roll-out LTE networks, starting from 2010. A frequently quoted barrier to this has been the availability of suitable devices and test equipment, but now there is good reason to be optimistic.
Agilent Technologies Equipment Used to Test First Mobile WiMAX Forum-Certified Products in China Lab
Agilent has announced that the China Academy of Telecommunication Research (CATR), a division of the Ministry of Industry and Information Technology and a WiMAX Forum Designated Certification Laboratory (WFDCL), has successfully used Agilent's N6430A Series Mobile WiMAX Protocol Conformance Test system to complete the first test of Mobile WiMAX products in mainland China. The test was conducted in June.
Keithley Expands Range of DC Source-Measure Instruments Compatible with ACS Basic Edition Software
Keithley Instruments has enhanced its popular ACS Basic Edition software, adding support for a broader line of source-measure (SMU) instrumentation. This broader choice of compatible instruments should prove especially useful in expanding the software's voltage and current limits available for testing solar cells, photovoltaic panels, and discrete power semiconductors. ACS Basic Edition combines high speed hardware control, device connectivity, and data management into an easy-to-use tool optimized for part verification, debugging, and analysis.
Anritsu Redefines Wireless Field Test with Introduction of ‘E’ Platform for Handheld Analyzer Family
Anritsu continues its leadership position in the wireless field test market with the introduction of an innovative new platform for its family of handheld analyzers, which is the de facto industry standard for field test instrumentation. The new platform features integrated functionality in a robust, lightweight, field-proven design that provides field personnel with all the tools necessary to deploy, maintain, and troubleshoot today's most demanding wireless equipment and networks.
Spirent and AT4 wireless Collaborate on LTE Device Testing
As the wireless industry prepares for the launch of LTE networks, Spirent Communications plc, the leader in wireless network, services and devices testing, today announced the Spirent LTE Network Emulator. The result of a collaborative engagement with AT4 wireless, a wireless testing services and test solutions company, the new LTE Network Emulator plays a key role in Spirent's performance test solutions for next-generation mobile devices.
China Telecom Selects Spirent for Mobile Phone Testing
Spirent Communications plc has announced that China Telecom has selected the Spirent C2K-ATS system to test mobile phones before they are offered to its subscribers. China Telecom will use the Spirent test system for parametric radio testing, signaling conformance testing, data performance testing and location-based services (LBS) testing.
Aeroflex Digital Radio Test Set now supports the widest range of available analog and digital radio technologies worldwide
Aeroflex has announced new software version 1.7.6.2 for the Aeroflex 3900 Series Digital Radio Test Set. Included in this release are a number of enhancements and support for the rapidly expanding digital land mobile radio test market across the globe.
RGB Networks Utilizes Tektronix Equipment to Optimize Next Generation Video Processing Solutions
Tektronix has announced that RGB Networks, the leader in network video processing, is implementing a full suite of Tektronix video test equipment to ensure compliance verification, dependable interoperability and the overall high video quality expected from its next generation of video processing solutions. The ensemble of Tektronix instruments includes the following: PQA500 Picture Quality Analyzer, MTS430 MPEG Test System, MTM400A MPEG Monitor, VCLIPS Video Test Clips, MTS4EA Elementary Stream Analyzer and WFM7120 Waveform Monitor.
Agilent and FuturePlus Introduce DDR3 1866 Memory Bus Debug Solution
Agilent Technologies Inc. and FuturePlus Systems Corp. today introduced a DDR3 1866 DIMM interposer test solution, which is comprised of the Agilent 16962A logic analyzer module and the FS2352 interposer for next-generation double-data-rate (DDR) SDRAM buses. The new DDR3 1866 DIMM interposer probing solution is the ideal tool for designers performing DIMM validation, failure analysis, and bus functional-parametric validation in servers, supercomputing, desktops and computing applications.
National Instruments Introduces NI VeriStand 2009 Real-Time Testing and Simulation Software
National Instruments today announced NI VeriStand 2009, an open, configuration-based software environment for creating real-time testing applications such as hardware-in-the-loop (HIL) and controlled environmental tests. All of the common functionalities of a real-time test system are implemented and optimized inside NI VeriStand in a ready-to-use format, making it possible for real-time test system developers to complete their test application development more efficiently.
Spirent GSS6300 Completes Spirent's Multi-GNSS Portfolio
Spirent Communications today announced the launch of the Spirent GSS6300 Multi-GNSS Signal Generator. The GSS6300 is an addition to Spirent's Multi-GNSS product portfolio, joining the recently launched GSS6700 Multi-GNSS Simulation System and the GSS8000 Multi-GNSS Constellation Simulator. This product portfolio provides comprehensive GPS, GLONASS, Galileo, and SBAS test solutions from high-end R&D through integration and production applications.
Spirent Test H3C's 40/100 GigE Data Center Core Switch Platform
Spirent Communications today announced that H3C selected its award-winning Spirent TestCenter platform to evaluate the performance of the H3C S12500 family of data center switches. Spirent TestCenter was selected specifically to test forwarding performance of the high-port-density S12500 platform. The S12500 is the first data center class core switch based on a 100 Gigabit Ethernet (GigE) platform and supports 40 GigE, 100 GigE and Fibre Channel over Ethernet (FCoE) links, meeting the ever-increasing performance requirements of modern data centers.
Double-sided in-line THT Inspection
GOEPEL electronic's OptiCon TurboLine is the first system that can efficiently be utilised for Automated Optical Inspection for in-line THT manufacturing. The system allows the inspection of the component side with up to 85cm placement height. It can applied before and after the soldering process, in particular for the inspection of power assemblies, e.g. for checking polarity and electrolytic capacitors.
National Instruments Introduces Wireless Sensor Network Platform
National Instruments has announced the NI wireless sensor network (WSN) platform, a complete remote monitoring solution that consists of NI LabVIEW graphical programming software and new reliable, low-power wireless measurement nodes. The adoption of wireless technology for remote monitoring applications is growing, yet engineers and scientists struggle to find an integrated solution that can provide the required measurement quality, power management and reliable hardware for long-term, remote deployments.
Agilent Enhances One-Box Communication Tester with cdma2000 PESQ Audio Measurement
Agilent Technologies has introduced cdma200 perceptual evaluation of speech quality (PESQ) measurement functionality for its 8960 wireless communications test set. This capability helps wireless engineers enhance the end-user experience by providing an objective measurement of audio quality in digitally vocoded voice.
National Instruments and Tektronix Develop Industry’s Fastest PXI Digitizer
National Instruments has announced the joint development of a high-speed digitizer with Tektronix, a leading provider of test, measurement and monitoring instrumentation. The PXI Express digitizer sets a new milestone for PXI modular instrumentation performance, with greater than 3 GHz bandwidth, sample rates beyond 10 GS/s, data throughput of more than 600 MB/s and multi-module synchronization capabilities. Because of this collaborative development effort, engineers and scientists will experience a new level of measurement performance and test productivity in demanding high-speed applications such as those found in physics and experimental research, aerospace and defense, communications, semiconductor and consumer electronics industries.
National Instruments Introduces PCI Express-Based Multifunction I/O for LabVIEW FPGA
National Instruments has announced four new R Series multifunction RIO boards for PCI Express that give engineers and scientists the benefits of field-programmable gate array (FPGA) technology in a widely adopted form factor. The boards deliver exceptional performance and value by combining a Xilinx Virtex-5 FPGA, eight analog inputs, eight analog outputs and 96 digital I/O lines on a single board. Using the NI LabVIEW FPGA Module, engineers and scientists can program the onboard FPGA to create custom measurement hardware for custom data acquisition, high-speed control, digital communications protocols, sensor simulation, hardware-in-the-loop and signal processing applications.
National Instruments and TSSI Collaborate to Support WGL and STIL Semiconductor Vector Formats
National Instruments has announced its collaboration with Test System Strategies, Inc. (TSSI), inventor of the Waveform Generation Language (WGL), on a new software tool that is compatible with NI LabVIEW graphical system design software. This software tool makes it possible for semiconductor test engineers to import WGL and IEEE 1450 Standard Test Interface Language (STIL) simulation vectors into NI PXI digital test systems, a task which previously required custom software development. Evaluation versions of the new TSSI TD-Scan for National Instruments software will be available by request from National Instruments while the full version can be purchased from TSSI.
Curve-tracer software for semiconductor testing
A new version of Yokogawa's curve-tracer software for semiconductor testing has been introduced for the company's GS610 source measure unit. Designed to carry out voltage/current analysis on two-lead or three-lead components including discrete semiconductors, integrated circuits and optoelectronic components, the new PC-based software works in conjunction with the USB-connected GS610 to enable source and sink operations at up to 100 V at 0.5 A or 12 V at 3.2 A. A single GS610 is required for two-lead components and two units are needed for three-lead components.
Frost & Sullivan Recognizes Spirent's Ethernet Testing Market Leadership
Spirent Communications plc has been recognized as the market leader for Ethernet testing by Frost & Sullivan according to the World Gigabit Ethernet Test Equipment Market report. Spirent sold more Ethernet test ports than any other vendor through its comprehensive solution portfolio that spans testing from the lab to the live network and into the subscriber's home.
Great Demand for Hitex Expertise: Insider's Guides
Some years ago Hitex published the first Insider's Guide as an Engineer's Introduction to the C166 Family. It was the beginning of a success story: Thousands of engineers all around the world could benefit from the useful information given in printed form or pdf format.
Configuration Replaces Multiple Instrument Alternatives to Reduce Cost and time of Test, and Lower Setup Costs
Anritsu Company introduces the MU150110A multi-rate/multi-channel unit for its MP1590B Network Performance Tester. The plug-in unit creates a single-instrument 10G transport test solution with the MP1590B mainframe and allows the tester to accurately evaluate the performance of SDH/SONET, OTN, and PDH/DSn equipment from 1.5M to 11.1G, as well as 10GbE interfaces during development and manufacturing.
Dedicated Bluetooth Audio Test Set Introduced by Anritsu Company
Anritsu Company introduces the MT8855A, the world's first integrated test set capable of measuring the new generation of products using the Bluetooth Advanced Audio Distribution Profile (A2DP), headset profile, and hands-free profile. Providing frequency coverage of 20 Hz to 20 kHz, the MT8855A offers lower cost-of-test, significantly reduced development time, and greater confidence in the quality of products shipped compared to alternative multi-instrument test systems consisting of Bluetooth controllers, generators and analyzers.
Agilent Technologies Introduces High-Speed PCIe Digitizer with Real-Time Data Processing for OEM Applications
Agilent Technologies Inc. today introduced its new PCI Express(r) (PCIe) high-speed data acquisition card with on-board field programmable gate array (FPGA) for real-time data processing. This new platform provides higher sampling rates, faster measurement throughput and even more flexibility to OEMs and many test and measurement engineers, while maintaining precision and cost effectiveness.
Agilent Technologies' Test Solutions Support March 2009 LTE Standard
Agilent Technologies Inc. today announced its compliance with the March 2009 release of the 3GPP Long Term Evolution (LTE) standard. Agilent's compliance enables broader test capability for LTE TDD, LTE FDD and MIMO.
Underwriters Laboratories Expands Global Photovoltaic Footprint To China
Underwriters Laboratories announced today the expansion of its global photovoltaic testing services to Suzhou, China, where it will open a Photovoltaic Technology Center of Excellence. The new facility, set to open on February 26, 2009, will be the largest photovoltaic testing laboratory in Greater China and have the capability to test to both UL and International Electrotechnical Commission (IEC) Standards. This announcement marks yet another step in UL's ongoing commitment to the development of safe renewable energy equipment.
Spirent Communications Redefines Test Lab Automation
Spirent Communications plc, a leader in network, services and device testing, today announced the introduction of a broad set of tools designed to automate the testing process and save engineers and their organizations time and money. Spirent NoCode™ delivers the industry's first and only complete set of integrated end-to-end automation solutions covering the entire breadth of test automation requirements through a portfolio of offerings that fit a wide variety of needs and enable users to introduce higher quality products and services more quickly and at a significantly lower cost.
Trend Communications announces the availability of a new version of the Multipro Copper with a 6 MHz frequency range
The Multipro Copper 6MHz is Trend Communications answer to the need for a highly affordable fully featured ADSL2+ Copper test solution. While most ADSL2+ test solutions will allow testing up to 2.2MHz, the Multipro Copper 6MHz supports testing beyond this up to 6MHz. An ADSL2+ system will attempt to operate over a spectrum 2.2MHz wide, most testers will only test across this frequency range, however there are can be powerful sources of noise at higher frequencies which can have an impact on the performance of the ADSL2+ installation.
Agilent Technologies Introduces One-Box-Tester for 1xEV-DO eHRPD Protocol Stack
Agilent has announced support for 1xEV-DO enhanced high-rate packet data (eHRPD) in Agilent 8960 wireless communication test sets running the Agilent E6706C lab application software. This one-box solution, a first in the industry, will help engineers test and verify the interaction of new eHRPD designs with existing 1xEV-DO and future LTE designs.
Agilent Technologies Claims Industry-First TD-LTE Receiver Measurements Drive Test System
Agilent Technologies has announced TD- LTE Receiver Measurements as a software upgrade to its proven Agilent E6474A Drive Test Network Optimization Platform. Network equipment manufacturers and wireless service providers can use the software on Agilent W1314A receivers to quickly verify base-station RF coverage, plot accurate coverage maps and validate planning in the early development of LTE networks. This new option builds on the existing FDD-LTE measurements in the Agilent solution to provide both FDD-LTE and TD-LTE measurements on a single measurement platform.
GOPEL Combines JTAG/Boundary Scan and Optical Inspection
GOPEL electronic is offering a cost-effective hybrid JTAG/Boundary Scan and optical test system. Simple optical inspection tasks of LEDs, displays or OCR are executed by the TOM (Teachable Optical Measurement) system whilst Boundary Scan controls the board. That means users are provided with a one-stop shop of electric and optical testing, both developed and produced by GOEPEL electronic.
Vero Technologies - Terminal pins can save money during manufacture and test
The range of terminal pins available from Vero Technologies provide an easily useable fitting on a PTH PCB for the attachment of oscilloscope probes, multimeter leads and test equipment, saving time and money during the manufacture and test process.
TD-LTE hand-off milestone for Aeroflex’s TM500 test mobile in mobility field trials
Aeroflex has announced a significant new milestone for its TM500 TD-LTE test mobile, successfully achieving hand-off between multiple TD-LTE basestations during mobility field trials with a number of network infrastructure equipment vendors.
Aeroflex - Modular test platform expands 2G and 3G wireless testing capabilities
Aeroflex has announced the addition of new communications standards to its PXI 3000 Series modular test platform, now enabling communications test engineers to address a variety of 2G and 3G wireless data standards with a single, flexible, software-defined system. With the addition of the new Bluetooth measurement suite along with the new WLAN and CDMA2000/1xEVDO plug-ins for the PXI Studio software application as well as significant upgrades to the WiMAX, UMTS and GSM/EDGE measurement suites, the PXI 3000 Series is one of the most versatile and far-reaching communications test applications available.
Agilent Technologies Launches HYCOR Ultra-Sensitive EIA System for Allergy Testing
Agilent has announced the availability of the HYCOR Ultra-Sensitive EIA System for allergen-specific IgE. The HYCOR Ultra-Sensitive EIA System is FDA-cleared for quantitative determination of specific IgE. Using a unique assay design, the system provides quantitative specific IgE detection with testing capacity sized for moderate to higher-volume labs. Based on proven technology, the system combines quantitative accuracy, precision and sensitivity with fully automated robotics to deliver a new level of performance and productivity, and has been designed to offer laboratories an overall cost-per-test advantage over alternative methods.
Aeroflex - Multi-handset capability for the TM500 TD-LTE test mobile
Aeroflex has announced the TM500 TD-LTE Multi-UE, adding a multiple handset (multi-UE) capability to its market-leading test mobile range supporting TD-LTE infrastructure development. The TM500 TD-LTE Multi-UE enables TD-LTE infrastructure equipment vendors to test the performance of their TD-LTE basestations (e-NodeBs) under loaded conditions, accelerating the pace of infrastructure equipment development programmes. At the same time, Aeroflex has announced that it has already won a series of sales contracts for the TM500 TD-LTE Multi-UE.
Yokogawa - LXI compliant Ethernet interface for oscilloscopes
LXI compliant Ethernet options are now available for the Yokogawa DL9000 Series of digital and mixed-signal oscilloscopes and the SB5000 vehicle serial bus analyser. The new options, designated /C9 and /C12, meet the Class C requirements of the LXI Standard.
TDI Dynaload's high-speed loads from TTi
In response to changing industry demands, the Dynaload division of TDI Power has developed a new line of electronic loads. The Dynaload XBL Series features 800, 2000, 4000, and 6000 W models with a wide range of voltage inputs and sophisticated computer programming via GPIB, Ethernet, or RS232. These units also feature an integrated web page for local system operation and control.
CIL extends flying probe test capability
CIL, the Andover-based electronics design manufacturing company, has increased its flying probe test capability by installing a new Takaya APT9401CE. The installation is part of the company's continuous investment programme and is required to increase capacity for new business activities.
Amplicon launches Test Systems Division
Amplicon's new Test Systems Division has been developed to provide system integrators and end-users with the widest range of test system hardware at a price that only a manufacturer and tier 1 distributor can offer. PXI, Compact PCI (cPCI), LXI and PC-based systems along with an extensive product integration service provides customers with a finished hardware platform allowing them to concentrate on their specific area of expertise – typically, the addition of a bespoke test software application.
