Test and Measurement

Agilent Technologies Wins Design News' Golden Mousetrap Award for Best Product

Agilent Technologies Wins Design News' Golden Mousetrap Award for Best Product

Agilent Technologies today announced its U2700A Series USB Modular Instruments family has won Design News' 2009 Golden Mousetrap Award for Best Products. Design News has recognized engineering innovation and creativity in product design for more than two decades. This year, Golden Mousetrap Awards were given in four major categories: Electronics, Motion Control/Automation, Hardware/Software, Materials/Fastening/Joining/Assembly and 20 subcategories.

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Anritsu demonstrates a 3G LTE Virtual Network Demo

Anritsu demonstrates a 3G LTE Virtual Network Demo

A 3G LTE test system which creates a virtual 3G LTE network will be displayed in Japan this week. Anritsu will display the system at CEATEC JAPAN 2009 running until 10th October in Chiba-city.

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Agilent -  ZIF Probe Head Extended to Protocol Layer Testing and Debugging for PCI Express

Agilent - ZIF Probe Head Extended to Protocol Layer Testing and Debugging for PCI Express

Agilent has introduced a new flying leads probe for its PCI Express (PCIe) 2.0 E2960B Series analyzers, using the Zero Insertion Force (ZIF) probe head. The new ZIF flying leads probe uses the Agilent Infiniimax ZIF design, which allows designers to use the same probe points for physical layer measurements as well as protocol debugging using the protocol analyzer. This simplifies troubleshooting situations where it is unclear whether the fault lies in the physical layer or in protocol interactions. The new ZIF flying leads probe supports both 2.5 GT/s and 5.0 GT/s PCI Express data rates.

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High-performance oscilloscope family offers extensive analysis capabilities and mixed-signal models

High-performance oscilloscope family offers extensive analysis capabilities and mixed-signal models

The Yokogawa DLM6000 mixed-signal oscilloscope is the flagship product in a new family of high-performance digital oscilloscopes featuring bandwidths up to 1.5 GHz, memory of 6.25M points per channel, an intuitive graphical user interface and a number of advanced analysis features.

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Tactical Grade Mems Inertial Measurement Unit

Tactical Grade Mems Inertial Measurement Unit

Inertial Aerosystems has introduced what is claimed to be the world's first MEMS based true tactical inertial measurement unit. Designated the SD1500, it is manufactured by U.S. based Systron Donner Inertial. The exceptional performance of this product (1°/hr) is based on a new generation of SDI's proven quartz MEMS inertial sensor technology. The quartz technology enables high volume production of precisely machined sensor structures combined with the inherent large signal output and thermal stability of quartz materials.

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GSM and UMTS Acoustic Type approval tests

Hermon Laboratories TI (www.hermonlabs.com), an expert in compliance testing in telecom, today announces TCA 4100 from Hermon Laboratories TI test equipment for telecom and acoustic testing for wireless handsets (GSM and UMTS). TCA 4100 controls and measures the tests according to acoustic standards (TS 51.010-1, TS 26.131/2). All tests comply with the GCF and PTCRB approvals specifications and validated by an independent test house.

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Aeroflex Improves Test Times of RF Communications Devices

Aeroflex has announced it will deliver a non-signaling PXI solution customized for RF production line test of Infineon's second-generation ultra low-cost mobile phone platform. The solution, based on the Aeroflex PXI 3000 Series, will test Infineon's second-generation ultra low-cost chipset (X-GOLD 101).

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Agilent's Test Tool for Precision Time Protocol Enables Wireless Backhaul Synchronization

Agilent Technologies has demonstrated its new N2X IEEE 1588v2 Precision Time Protocol (PTP) test solution that enables network equipment manufacturers (NEMs) and network operators to ensure that time-critical Carrier and Industrial Ethernet applications are synchronized. Agilent will present a white paper about this technology at the event's conference.

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Agilent Technologies' Momentum Electromagnetic Simulator Qualified for High-Frequency Designs in TSMC Advanced RF Processes

Agilent Technologies has announced that it has qualified its Momentum Electromagnetic (EM) tool for Taiwan Semiconductor Manufacturing Corp.'s (TSMC's) 65-nm process as part of the TSMC EM Tool Qualification program. This program assists IC designers by providing certified process technology files, layout and measurements for 65-nm and 90-nm process technologies. Certified process files eliminate several error sources in the design process and enable designers to use a TSMC-qualified EM simulator on TSMC 65-nm processes with confidence. Today's qualification announcement demonstrates the fitness of Momentum in EM-based inductor device modeling for high-frequency and RF designs in TSMC's 65-nm process.

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Vishay Systems Crane-Weighing Solution with Life Cycle Measurement Optimizes Service and Maintenance Intervals, Is Compliant with FEM 9.755

Vishay Systems Crane-Weighing Solution with Life Cycle Measurement Optimizes Service and Maintenance Intervals, Is Compliant with FEM 9.755

Vishay Intertechnology has announced a new Vishay Nobel crane-weighing solution from Vishay Systems. It incorporates Vishay load cells and Vishay Systems state-of-the-art instrumentation for logging time, position, and weight to optimize service and maintenance intervals. It provides a cost-effective crane-weighing solution that complies with European crane standard FEM 9.755, which establishes calculation of service intervals and life-cycle measurement parameters for cranes above 1000 kg.

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Prism Sound Appoints MixRommet To Handle Test & Measurement Range In Sweden

Prism Sound Appoints MixRommet To Handle Test & Measurement Range In Sweden

Prism Sound's range of test and measurement equipment is now being represented in Sweden by MixRommet, a subsidiary of Oslo-based distributor LydRommet, which already handles Prism Sound's range in Norway.

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TRaC, Agilent Technologies Announce Comprehensive Bluetooth-Qualification Test System

TRaC and Agilent Technologies Inc. today announced the availability of TRaC's Bluetooth test system, which uses Agilent's N4010A Wireless Connectivity Test Set. The Bluetooth test system, developed by TRaC engineers in conjunction with Agilent hardware engineering, delivers a fully automated RF qualification solution to the Bluetooth Specification Test Suite Structure and Test Purpose System Specification 1.2/2.0/2.0+EDR/2.1/2.1+EDR. Additionally, support for V3.0 + HS is currently being developed by TRaC's engineers.

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30MHz digital demodulation for Aeroflex 3280A Series Spectrum Analyzers added as standard feature

30MHz digital demodulation for Aeroflex 3280A Series Spectrum Analyzers added as standard feature

Aeroflex has announced the 3280A Series spectrum analyzers with 30MHz digital demodulator and generic vector demodulation as standard features with no price increase over its predecessor, the 3280 Series. Digital demodulation in the 3280A Series spectrum analyzers allows engineers to analyse the transmitter characteristics of wireless devices. The 3280A Series includes many optional measurement suites including WiMAX, WLAN, UMTS, CDMA2000, and GSM/EDGE.

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Boundary Scan Platform  supports Test of RS232 Interfaces

Boundary Scan Platform supports Test of RS232 Interfaces

GOEPEL electronic has introduced 9305-BAC/RS232, another Bus Access Cables (BAC) as new member of the industry leading JTAG/Boundary Scan hardware platform SCANFLEX® In connection with the SCANFLEX multi port module SFX9305, new family member of Bus Access Cables enables the test of RS232 interfaces in combination with extended JTAG/Boundary Scan operations based on a unique platform.

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Anritsu Extends Frequency Range of VectorStar 4-port Solutions to Measure Passive High-Speed Balanced Transmission Lines and Connections

Anritsu Extends Frequency Range of VectorStar 4-port Solutions to Measure Passive High-Speed Balanced Transmission Lines and Connections

Anritsu Company has announced it has extended the low-end frequency of its MN469xB VectorStar 4-port test sets, making the instruments the first microwave multiport Vector Network Analyzer (VNA) solutions to measure down to 70 kHz.

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CellMetric launches 4G LTE eNodeB Test Signal Generator

Cambridge based digital cellular and broadcast company CellMetric announces the launch of a Long Term Evolution (LTE) eNodeB 4G base station test signal generator. CellMetric's Modus 6 LTE test solution is compliant with Release 8 of the Third Generation Partnership Project standard (3GPP) and supports both Time Domain Duplex (TDD) and Frequency Domain Duplex (FDD) modes. This follows the 11th December 2008 functional freeze of LTE as part of 3GPP Release 8.

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China Mobile and Motorola Use Aeroflex TM500 Test Mobile for TD-LTE Demonstrations at Telecom World 2009

China Mobile and Motorola Use Aeroflex TM500 Test Mobile for TD-LTE Demonstrations at Telecom World 2009

Aeroflex has announced that China Mobile Communications Company (CMCC) and Motorola will use Aeroflex's highly successful TM500 LTE test mobile at International Telecommunications Union's (ITU) Telecom World 2009 as part of China Mobile's TD-LTE booth demonstrations.

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National Instruments Announces More Than 8000 Drivers Available Through IDNet for Instrument Control

National Instruments has announced more than 8000 instrument drivers available through the NI Instrument Driver Network (IDNet) that make it easy to connect and control stand-alone instruments. IDNet is the industry's largest source of instrument drivers and easy-to-use software optimised for instrument control, including NI LabVIEW, LabWindowsTM/CVI and Measurement Studio for Microsoft Visual Studio. This network, which includes more than 500 new drivers added since April 2009, offers instrument drivers to connect to both NI instruments and stand-alone instruments from more than 325 vendors, including Tektronix, Agilent Technologies and Rohde & Schwarz. By using this source of instrument drivers, engineers and scientists can save time by getting their measurements faster and achieve more with their overall applications.

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Green Hills Probe Supports Intel Architecture

Green Hills Probe Supports Intel Architecture

Green Hills Software Inc. has announced that it has added support for Intel architecture to the Green Hills Probe, the fastest and smartest debug probe ever built. The Green Hills Probe supports the latest Intel architecture, including the Intel Atom™, Intel Core2 Duo, and Intel Core i7. Together with the MULTI integrated development environment (IDE), the Green Hills Probe is a versatile tool for hardware bring-up, software and firmware debugging, and product manufacturing.

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Agilent Technologies - Probes for General-Purpose Differential Signal Measurements

Agilent Technologies - Probes for General-Purpose Differential Signal Measurements

Agilent Technologies has introduced 200-MHz and 800-MHz, high-voltage differential probes. The differential probes provide superior general-purpose differential signal measurements required for today's high-speed power measurements, vehicle bus measurements and digital system designs.

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Advanced Test Equipment Rentals has the Varian VSMR15 mass spectrometer leak detector

Advanced Test Equipment Rentals has the Varian VSMR15 mass spectrometer leak detector

The state-of-the-art mass spectrometer leak detector and vacuum system by Varian provides powerful capability, enabling a broad range of test methods for specific applications, including industrial process, power generation, high energy physics, semiconductor production, small parts manufacturing and general research & development.

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CST Previews New Tool for Multi-Physics Simulation at EuMW 2009

In many branches of microwaves and RF engineering, required analysis is not confined to the electromagnetic problem, particularly when dealing with high power applications. Both the temperature rise and resulting stress have to be considered in the design process since these may have major implications for the device's performance.

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Agilent Technologies Introduces Its Highest-Resolution VME/VXS Digitizer for Defense Market

Agilent Technologies Introduces Its Highest-Resolution VME/VXS Digitizer for Defense Market

Agilent Technologies today introduced its Acqiris product line's highest-resolution VME/VXS digitizer. The SVM4800 is an eight-channel 14-bit digitizer with more than 300 MHz input signal bandwidth, achieving sampling of up to 125 MS/s. This new digitizer is ideal for applications in radar, Electronic Warfare (EW) and Synthetic Instrumentation (SI).

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Portable microscope features on-screen views

A versatile microscope with rotating lens brings advanced digital enlargement and image capture features to a hand-held format for the first time. The iLoupe XL, a second-generation model with added capabilities, is manufactured exclusively for Aven, Inc. The new product magnifies from three to 300 times and has a 5.1-megapixel, high-resolution sensor for detailed images. Six white-light LEDs with an adjustable intensity control assure clear, bright images, and the lens tube rotates 180 degrees for capturing any angle.

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Multi-channel transducer signal conditioning systems

Multi-channel transducer signal conditioning systems

Measurement specialists RDP Electronics Ltd provide a number of cost-effective signal conditioning solutions, including panel and DIN mounted options for applications using multiple transducers. Where there are a number of transducers in close proximity then a more economic and space efficient solution can usually be achieved by selecting either the RDP Modular 600 or DR7 DIN rail options, rather than using several individual devices.

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Torsional stiffness measurement systems from RDP Electronics

Torsional stiffness measurement systems from RDP Electronics

For development engineers working in automotive, aerospace and other disciplines where the measurement of torsional stiffness is essential, then measurement specialists RDP Electronics Ltd can provide a suitable system utilising standard products.

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Model P730 Universal Fanout Buffer

Model P730 Universal Fanout Buffer

Highland adds a multipurpose digital fanout buffer to its line of photonics products. As either a benchtop instrument or an OEM assembly, the P730 is compatible with CMOS, TTL, CMOS, LVDS, NECL, PECL, NIM and sine wave systems.

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National Instruments - Enhanced Sound and Vibration Software for Noise Frequency Response Analysis

National Instruments - Enhanced Sound and Vibration Software for Noise Frequency Response Analysis

National Instruments has announced the release of the NI Sound and Vibration Measurement Suite 2009, a comprehensive collection of analysis and signal processing tools for noise, vibration and harshness (NVH), machine condition monitoring and audio test applications.

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Agilent Technologies - High-Performance Signal Analyzer for Advanced RF and Microwave Applications

Agilent Technologies - High-Performance Signal Analyzer for Advanced RF and Microwave Applications

Agilent Technologies has announced the introduction of the N9030A PXA signal analyzer, the highest-performance member of the Agilent X-Series signal analyzers. The PXA provides frequency coverage up to 26.5 GHz and ensures present and future flexibility through optional measurement capabilities and hardware expandability. The analyzer also includes extensive code-compatibility features that make existing Agilent or HP high-performance signal analyzers easier to replace.

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Agilent Technologies - Low-Cost Signal Analyzers for Essential RF Measurements

Agilent Technologies - Low-Cost Signal Analyzers for Essential RF Measurements

Agilent Technologies has introduced its N9000A CXA signal analyzers, a pair of low-cost models that offer frequency coverage up to 7.5 GHz. These new analyzers provide outstanding flexibility through a variety of built-in and optional measurement capabilities that can be easily configured and reconfigured to meet present and future requirements. Target applications include general purpose electronics manufacturing, low-cost R&D, and RF education.

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Ophir-Spiricon - Sensor  Directly Measures Very High Laser Power and Power Density

Ophir-Spiricon - Sensor Directly Measures Very High Laser Power and Power Density

Ophir-Spiricon, the global leader in precision laser measurement equipment, today announced the 10KW Power/Energy Sensor, the first detector to directly measure very high powers and power densities. Designed for material processing applications, such as welding and metal cutting, the 10KW measures YAG and fiber lasers in the 1040-1100 nm range, and CO2 lasers at 10.6 microns. A wide aperture of 45 mm allows for measurement of broad beams. The maximum power for concentrated beams is up to 10KW/cm2. The maximum energy density for a 10 ms pulse is up to 150 J/cm2.

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PCLM Earth Monitoring Now With Online Support

PCLM Earth Monitoring Now With Online Support

FDB Electrical – specialists in earth monitoring equipment are increasing their support to defence contractors, design/specification engineers and electrical project engineers for their PCLM modular range by provision of a downloadable PDF datasheet available from www.fdb.uk.com. The PCLM has been designed especially for application in modular electrical systems as used by military or quasi-military organisations for temporary bases, field hospitals, mobile communications centres, forward command centres etc.

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Express Boundary-scan Controller

Express Boundary-scan Controller

JTAG Technologies, a leading provider of IEEE Std. 1149.1 solutions for testing and programming high-density PCBs, has announced a further extension to its line of high-performance boundary-scan IEEE Std. 1149.1 controllers. Known as the DataBlaster JT 37x7/PCIe, the new unit offers support for the popular PCI-express slot format found extensively in today's PCs. The PCIe bus is a high-speed serial replacement of the older parallel PCI bus.

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SELEX and GOEPEL co-operate to enable Boundary Scan and dynamic Functional Test in critical system environments

SELEX and GOEPEL co-operate to enable Boundary Scan and dynamic Functional Test in critical system environments

At the Defence Systems and Equipment International (DSEI) GOEPEL electronic, worldwide leading vendor of JTAG/Boundary Scan solutions compliant with IEEE1149.x, announced the launch of PXI 5396/FXT-x, a further series of JTAG/Boundary Scan digital I/O modules on the basis of the PXI bus. The PXI5396-FXT was developed in cooperation with SELEX Galileo and supports both the structural JTAG/Boundary Scan Test and dynamic I/O operations up to 100MHz for the execution of functional tests in critical environments.

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Aeroflex Extends LTE Measurement Capabilities to its PXI Platform

Aeroflex today announced it has added new LTE measurement capabilities to its flexible, modular PXI 3000 platform. This latest addition enables production test engineers to achieve faster time to volume for RF components and LTE user equipment. The new solution leverages itself on Aeroflex's track record in LTE testing for R&D and the proven yield and throughput benefits of the PXI 3000 Series platform in mobile handset manufacturing.

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MCL MT4100 broadband CW TWT lab amplifier newly available from Advanced Test Equipment Rentals

MCL MT4100 broadband CW TWT lab amplifier newly available from Advanced Test Equipment Rentals

The new MCL MT4100 broadband power amplifier is the latest design from the field-proven MT4000 TWT family. This high power amplifier is ideal for use in radar, EMC, and EW testing, and wherever wideband applications are required. Advanced Test Equipment Rentals offers a model covering 2.5-7.5 GHz with an output power range up to 500W typical.

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New test solutions to support development of next generation 40G/100G communications networks

Anritsu Corporation meets the demands of testing the technology for next generation communications networks as it introduces the new 56Gbit/s MUX/DEMUX modules to its MP1800 Signal Quality Analyzer.

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Spirent Participates in EANTC's Carrier Ethernet Interoperability Test Event

Spirent Communications plc today announced its participation in the industry's foremost Carrier Ethernet Interoperability Test Event conducted by EANTC. The live demonstration, showcased during Carrier Ethernet World Congress (September 21 – 23) in Berlin, featured Spirent TestCenter validating the performance and interoperability of a multi-vendor Carrier Ethernet topology focused on three key areas: managed services, mobile backhaul and global interconnect.

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Spirent Showcases New Developments in GPS/GNSS Testing at ION 2009

Spirent Communications plc today announced that it will demonstrate its new GPS modernization and multi-GNSS product range at ION GNSS 2009. For the first time ever, event attendees will have access to live demonstrations of Spirent's full range of GPS modernization and multi-GNSS simulators including the GSS8000 Multi-GNSS Simulator, GSS6700 Multi-GNSS Simulation System and GSS6300 Multi-GNSS Signal Generator.

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LPC1300 evaluation with benchmarking of performance and power consumption

LPC1300 evaluation with benchmarking of performance and power consumption

The LPC1313-Stick from Hitex is the brand new tool for evaluation of the ARM Cortex-M3 based LPC1300 controller family from NXP featuring a high level of integration and low power consumption.

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