Test and Measurement
mimoOn and Rohde & Schwarz to demonstrate LTE testing capabilities at Mobile World Congress 2010
mimoOn, a pioneer in LTE software implementation for programmable radio platforms, will demonstrate the 4G capabilities of its mi!TestMOBILE(TM), one of the world's smallest and lowest-cost test mobiles for the rapid deployment and optimization of LTE networks, at Mobile World Congress (MWC) February 15-18, 2010 in Barcelona. The demonstration will include the R&S®CMW500 wideband radio communication tester, a product of Rohde & Schwarz, a leading supplier of test and measurement (T&M) products for the mobile industry.
InterLab Test Engines – making “Ease of Use” for RF and Protocol test systems a reality
Conformance test systems for the wireless communications industry vary a lot in their usability. This makes the handling of different test systems from different manufacturers complicated for the test system operators and engineers. Test systems require expert know-how and understanding if users want to make sure that they generate correct and reproducible results.
Aeroflex 7100 Digital Radio Test Set Wins 4G Wireless Evolution Product of the Year Award
Technology Marketing Corporation (TMC) has recognized Aeroflex's contributions to 4G wireless technology with a 4GWE Product of the Year award for the 7100 Digital Radio Test Set. Award recipients represent the most innovative new products brought to market during 2009.
Agilent Technologies' USB 3.0 Test Solution Chosen by ASMedia Technology for USB-IF Compliance Certification
Agilent Technologies announced that ASMedia Technology Inc., a Taiwanese IC design house, has selected the Agilent USB 3.0 test solution for in-house certification of SuperSpeed USB 3.0 devices. Agilent's comprehensive solution ensures compliance with the USB 3.0 standard. The Agilent USB 3.0 test solution is designed to reduce development costs, provide accurate test results, and simplify measurement processes for test engineers in the consumer electronics, cable manufacturer, and semiconductor industries.
Agilent Technologies' Enhanced Signaling Analyzer for LTE Supports Entire Network in Real Time
Agilent Technologies announced it has added capabilities to its Signaling Analyzer Real Time (SART) for LTE. These enhancements allow wireless carriers and network equipment manufacturers (NEMs) to analyze an LTE-enabled tenfold plus increase in network traffic without sacrificing real-time-to-results. The SART 6.60 will be demonstrated at the 2010 Mobile World Congress, Hall 8, Stand A77, Barcelona, Spain, Feb. 15-19.
Agilent Technologies Adds Phone Solution to LTE Drive Test Portfolio, Enabling Complete Performance, Coverage Testing
Agilent Technologies Inc. today announced it will introduce and demonstrate a phone solution extension for its LTE Drive Test portfolio at the 2010 Mobile World Congress, Hall 8, Stand A77, Barcelona, Spain, Feb. 15-19. The phone solution extension will expand the coverage monitoring capability of Agilent's industry-leading Drive Test Receiver to include comprehensive interactive LTE network-performance testing.
Agilent Technologies' Scanning Microwave Microscopy Garners Second Major Innovation Award
Agilent Technologies announced that its Scanning Microwave Microscopy Mode (SMM Mode) has been named one of 10 2009 Prism Award winners by judges from SPIE and the advisory board of Laurin Publishing's Photonics Spectra magazine.
VI Technology, an Aeroflex Company, Develops Test Systems for Second-Generation of Ford SYNCR
VI Technology MMTS for production testing of new and existing components was used in the development of second-generation of Ford's SYNC system. VI Technology MMTS is an automated test system designed to improve productivity for design and test engineers needing analog & digital measurements for audio/video devices.
Aeroflex introduces LTE signal fading simulator for affordable, repeatable, reliable profiling of mobile handsets
To speed up real-world testing of mobile handsets for LTE networks ahead of network deployment, Aeroflex is introducing the first one-box test system for cell phone signal fading simulation. Integrated within the 7100 Series digital radio test set, the new fading simulator option offers RF engineers an inexpensive and reliable baseband tool for signal fading profiling, a requirement for LTE (Long Term Evolution) certification.
TRaC announces comprehensive testing to satisfy Noise at Work Directive
TRaC has extended its capabilities in testing products against the requirements of the Noise at Work Directive.
Test & Measurement shop launched by Amplicon
Amplicon announced the launch of its new test & measurement web shop, a fast, secure and user friendly way of providing customers with an extensive range of instruments from industry leaders such as Fluke and Agilent Technologies.
Agilent Technologies Offers Simplified Receiver Tolerance Test Setup for USB 3.0, SATA and SAS
Agilent Technologies announced a second data channel option and a new analysis option for SER/FER for its J-BERT N4903B high-performance serial BERT. The new options significantly simplify receiver tolerance testing of USB 3.0 and SATA devices.
Agilent Technologies Delivers World's Most Accurate Handheld Vector Network Analyzer
Agilent introduced the N9923A FieldFox RF Vector Network Analyzer (VNA) -- the world's most accurate handheld VNA. The FieldFox RF VNA provides the best measurement stability in the industry, 0.01 dB/degree Celsius, and offers the world's first integrated QuickCal calibration capability available in a handheld VNA. QuickCal enables consistent measurement results and confidence in the data while eliminating the need to carry a calibration kit into the field.
World’s first LTE test cases validated by 7 layers
7 layers, a global group of test & service centers for the wireless communications industry, is the first company world-wide that has succeeded in validating LTE test cases. Long Term Evolution (LTE) is the next-generation 3G technology for GSM, CDMA and WCDMA cellular carriers. LTE uses a different air interface and packet structure than current 3G systems. Enormously increased data transmission rates (average 150MBit/s) are an important precondition that will finally make the mobile web come real.
Aeroflex Launches Multiple Handset Emulation Capability for the De Facto Industry Standard TM500 DC-HSDPA Test Mobile
Aeroflex announced today that its TM500 Test Mobile is the first to market to support multiple UE (user equipment, or handset) emulation in conjunction with measurements for the 3GPP W-CDMA Release 8 DC-HSDPA (Dual Cell High-Speed Download Packet Access) standard.
Aeroflex's DC to 40 GHz SMART^ET 5300 Reduces Life Cycle Cost of High-performance, High-speed RF and Microwave Testing
For high-performance, high-speed testing of RF and microwave devices, Aeroflex introduces the SMART^E 5300 general-purpose test environment. The DC to 40 GHz SMART^E 5300 is unique in its ability to test, monitor, and control any Device Under Test (DUT) within a single test environment.
LeCROY Chooses Keithley RF/Microwave Switch for its Superspeed USB 3.0 Test Suite
Keithley Instruments announced today that LeCroy Corporation, a leading producer of serial data test solutions, has chosen Keithley's System 46 (S46) RF/Microwave Switch System as part of the original equipment for its new USB 3.0 Test Suite product family. Keithley's S46 switch is engineered to simplify the automated switching needed to test a wide range of telecommunications products and devices, including Bluetooth devices. The USB 3.0 Test Suite represents the industry's first single-source lineup of test instruments that can comprehensively support the Universal Serial Bus (USB) 3.0 standard, also known as SuperSpeed USB.
RF Engines launches highly configurable, multichannel RF signal generator
RF Engines Limited (RFEL) has developed a highly sophisticated, 32 channel RF signal generator that is designed to enable challenging RF environments to be recreated in labs to test RF equipment. RFEL's world class expertise in RF and signal processing has enabled them to create a complete solution on a Xilinx Virtex-5 FPGA chip that is run within a PC on a PCI-express card. The PCI Upconverter is a very flexible and configurable system that replaces racks of expensive RF test equipment offering significant saving for Test and Measurement Laboratories.
Anritsu Expands Measurement Capability of Handheld Spectrum Analyzers to Include Signal Analyzer Functions
Anritsu Company announces it has expanded the test capability of its MS2712E and MS2713E Spectrum Master handheld spectrum analyzers to include signal analyzer capabilities. With the new 10 MHz bandwidth demodulation option, the MS2712E/MS2713E can test and verify the RF quality, modulation quality, and downlink coverage quality for all the major wireless standards, including LTE, WiMAX, WCDMA/HSDPA, TD-SCDMA/HSDPA, CDMA, and GSM/GPRS/EDGE.
Anritsu Introduced AM/FM/PM Spectrum Analysis Capability for Spectrum Master and Site Master Analyzers
Anritsu Company introduced AM/FM/PM analysis capabilities in its MS2712E/MS2713E Spectrum Master and S332E/S362E Site Master analyzers. Specifically meeting the needs of professional broadcast and land mobile radio (LMR) field technicians and engineers, the new option brings the inherent advantages of the industry leading handheld analyzers to professional broadcast and LMR applications.
Agilent Introduced Complete Test Solution for PCI Express 3.0 Featuring the New Digital Test Console
Agilent Technologies introduced its PCIe3.0 test solutions and the new Agilent Digital Test Console. The Digital Test Console is the industry's only complete and integrated x1 through x16 protocol analyzer and exerciser solution for the PCI Express 3.0 specification, currently under development within the PCI-SIG®. The Digital Test Console offers the industry's largest capture buffer and fastest download interface, with multiple non-intrusive probing options that employs the latest ESP technology. The Digital Test Console was designed to assist with PCIe 3.0 development and provide accurate test results.
Agilent Technologies' Advanced Design System 2010 to Support Emerging IBIS-AMI Modeling Standard
Agilent Technologies Inc. today announced its support for IBIS-AMI (Algorithmic Modeling Interface) -- a modeling standard for SerDes transceivers created to enable fast, statistically significant analysis of high-speed serial links. Agilent's work in support of this standard is expected to yield the commercial release of a new version of Advanced Design System, ADS 2010, which will allow signal integrity designers to integrate IBIS-AMI models into their ADS projects.
Agilent Technologies - One-Box Solution for High-Speed Serial Interconnect Analysis
Agilent Technologies today introduced the Time Domain Reflectometer (TDR) application software option for the Agilent E5071C ENA network analyzer. The combined E5071C and TDR application software make the ideal one-box solution for high-speed serial interconnect analysis. The E5071C with the TDR option includes three breakthrough features; simple and intuitive operation, fast and accurate measurements, and lower cost of ownership. The one-box solution is used by signal integrity engineers who require efficient design and verification in R&D, quality assurance and manufacturing.
Agilent Technologies, DeMille Research Inc. to Offer CAD Translation, Test Development Tools for Agilent Medalist In-Circuit Testers
Agilent Technologies Inc. and DeMille Research Inc announced they have signed a value-added reseller agreement that allows Agilent to offer DRI's TestSight Developer software to its Medalist i3070 and Medalist i1000 in-circuit test (ICT) customers.
Byte Paradigm and MTCS to sell test instruments in China
Byte Paradigm (Nivelles, Belgium) and MTCS Systems Engineering (Beijing, China) are pleased to announce that they are starting a collaboration to market Byte Paradigm's PC instrumentation products in China.
Unit test tool allows temporal component testing
The latest version of Tessy, a tool to automate unit / module / integration testing of embedded software, features "temporal component testing" as major enhancement. It allows testing several test objects integrated, under certain circumstances even using simulated time, hence "temporal".
Economical Aeroflex 3250 Series spectrum analyzers add 8 GHz tracking generator option
The Aeroflex 3250 Series spectrum analyzers now include an optional 8 GHz tracking generator. Ideal for any kind of bench or lab environment, the new 3250 Series tracking generator has a frequency range of 100 kHz to 8 GHz and a level range from 0 dB down to -20 dB. An adjustable output level, with a setting resolution of 0.5 dB, provides additional flexibility when testing the frequency response and compression characteristics of amplifiers, filters, and non-linear devices.
Tektronix Introduces Fully Automated Test Support for SAS Conformance
Tektronix today announced an automated compliance and test automation solution that now spans both SATA and SAS (Serial Attached SCSI). It encompasses the breadth of SAS conformance tests defined by UNH-IOL and the SCSI Trade Association (STA). Using the latest TekExpress software, storage system designers can complete these tests by simply pressing a single button which ensures accurate and consistent results — saving set-up time and eliminating time-consuming and repetitive manual testing.
Multi-Tool for R&D testing mobile devices from 7 layers
7 layers has developed a new small and affordable InterLab R&D Multi-Tool. It is ideal for creating an over-the-air test environment for mobile phones without the need for an RF wired connection. The system supports tests such as battery lifetime, data throughput and RF- and acoustic parameter measurements.
Test System Ensures that SERCOS III Slave Implementations from Different Manufacturers are Interoperable
The SERCOS III Slave Conformizer is a powerful test tool for slave devices on the SERCOS III Ethernet-based automation bus. It ensures that SERCOS III slave implementations from different manufacturers are compatible and interoperable.
CellMetric launches 4G LTE eNodeB Test Signal Generator
Cambridge based digital cellular and broadcast company CellMetric announces the launch of a Long Term Evolution (LTE) eNodeB 4G base station test signal generator. CellMetric's Modus 6 LTE test solution is compliant with Release 8 of the Third Generation Partnership Project standard (3GPP) and supports both Time Domain Duplex (TDD) and Frequency Domain Duplex (FDD) modes. This follows the 11th December 2008 functional freeze of LTE as part of 3GPP Release 8.
Verizon Wireless Chooses Spirent For LTE Testing
Verizon Wireless announced today that the company has selected Spirent Communications as a provider of testing solutions for the certification of devices that will operate on the nationwide 4G Long Term Evolution (LTE) network that Verizon Wireless is building on the Upper 700 MHz C-Block spectrum.
Take a trip to Barcelona and learn from the leading experts in LTE test and service monitoring
LTE will for sure be in the spotlight this year at Mobile World Congress February 15-18 in Barcelona. Come visit Anritsu at stand 1B31 to see live LTE testing of devices and networks, and discuss the activities and trends within the testing community.
Tektronix SuperSpeed Test Solution Supports World’s First USB 3.0 Certification At NEC Electronics
Tektronix announced that its SuperSpeed USB solution supported the verification of signal quality for NEC Electronics Corporation's USB 3.0-compatible host controller –the world's first to obtain USB 3.0 certification from the USB Implementers Forum.
Free Keithley Web-Based Seminar Illustrates Best Practices for On-Wafer Probing
Keithley Instruments will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps for On-Wafer Probing" on Thursday, January 28, 2010. This one-hour seminar will demonstrate the best practices for on-wafer probing and how to identify and solve common problems. To register for this event, which will be broadcast at 15:00 CET for the European audience, visit http://www.keithley.info/probingtips.
Agilent Technologies Introduces 28 Gb/s Multiplexer for J-BERT, ParBERT
Agilent Technologies announced the N4876A 2:1 Multiplexer, extending the generator data rate of the J-BERT N4903B and ParBERT 81250A up to 28 Gb/s. Design and test engineers in the semiconductor, communications, storage, and computing industries now can accurately characterize the next generation of serial interfaces to optimize their design margins. The first public showing of the N4876A is January 20 at the Fiber Optics Expo 2010, Agilent Booth EAST 1-43.
PXI Programmable Amplifier and Attenuator Expand National Instruments RF and Microwave Test Portfolio
National Instruments has expanded its automated test product line with two new RF signal conditioning modules that enhance the measurement accuracy and flexibility of PXI-based RF and microwave test systems. In applications such as RF signal path degradation modeling, field strength metering and receiver testing, engineers can combine the new NI PXI-5695 8 GHz programmable RF attenuator with a vector signal generator (VSG) to improve RF signal quality at low power levels. Engineers can integrate the NI PXI-5691 8 GHz programmable RF preamplifier, which also functions as a power amplifier, with VSGs to increase maximum power and with vector signal analysers (VSAs) to measure low-level signals.
Agilent Technologies Introduces 12-GHz Differential Wafer Probing Solution for Better Signal Integrity
Agilent today introduced a 12-GHz differential wafer probing solution. The fine-wire probe tip is a high-fidelity, high-bandwidth solution that allows R&D and test engineers to debug and test high-speed active ICs using an oscilloscope.
Optical Multi-Meter Operates in Three Modes
GAO Fiber Optics, a leading supplier of fiber optic equipment, launched its upgraded, highly accurateoptical multi-meter .which can act as an optical power meter and a stable light source or be used as a loss measurement system. It is intended to measure optical loss and check the performance of optical parts. The optical meter is specifically designed for single mode fiber measurement. It has a high definition backlit LCD screen and an AC-DC adaptor, a rechargeable Ni-Cd battery and dry cells as power sources for selection. A compact size and light weight design makes it ideally suited for fieldwork.
Tektronix Communications Introduces New Platform for More Efficient Core Network Testing
Tektronix Communications today unveiled the Spectra2u Core Network test platform for the Spectra2 protocol test product line. Built on an Intel Dual Quad Core processing architecture, Spectra2u allows network equipment manufacturers and telecom operators to test NGN, VoIP and converged networks for functionality, conformance, performance and media quality – all from a single, high capacity, multi-user test platform. The Spectra2u offers a low-cost footprint supporting IP and TDM interfaces for signaling and media.