Test and Measurement
LeCroy's New CrossSync Capability Provides Complete End-to-End Visibility into Multi-Protocol Systems
LeCroy Corporation, the worldwide leader in protocol test solutions, today introduced a new analyzer synchronization option that enables complete end-to-end visibility into multi-protocol systems. LeCroy's latest generation analyzer platforms can now be linked to provide time-aligned display of packet traffic from multiple high-speed serial protocols. Useful for testing systems that bridge data across different busses, this new capability leverages LeCroy's best-of-breed analysis software for fast multi-protocol problem resolution.
National Instruments Introduces PXI Express Module for High-Channel-Count Dynamic Signal Acquisition
National Instruments today announced the NI PXIe-449x devices, the most flexible high-channel-count dynamic signal acquisition (DSA) modules NI has to offer. The modules provide AC/DC coupling both for sensor measurements with a microphone or accelerometer and voltage measurements from a tachometer or device under test, making it possible for engineers to use a single device for all their sound and vibration acquisition needs.
Test & Measurement World Names Anritsu Spectrum Master and Signal Analyzer Best in Test Finalists
Anritsu Company announces that its MS272xC Spectrum Master handheld spectrum analyzer series and MS2830A signal analyzer have been named finalists in the prestigious Best in Test 2010 award competition held by Test & Measurement World. The MS272xC family, which includes the industry's first 32 GHz and 43 GHz handheld spectrum analyzer models, and the MS2830A, offering best-in-class measurement speed and accuracy, are finalists in the RF/microwave and wireless categories, respectively.
Boundary Scan Test Vector Migration into SPEA 3030 Board Testers
In cooperation with its German GATE program partner TAP (Tietjen Automatisierte Prueftechnik) GOEPEL electronic has developed a software tool that converts test vectors, generated in SYSTEM CASCON™, into executable test pattern of the SPEA 3030 In-Cicruit tester (ICT). The new method converts the JTAG bus' serial vectors as well as the parallel I/O vectors to the board test system's pin electronics. The utilisation of the SPEA 3030 test channels within the Boundary Scan test parts results in a significant higher test coverage and an even more efficient fault localisation.
Agilent - Infiniium 90000 X-Series Oscilloscope Named Test Product of Year
Agilent announced its Infiniium 90000 X-Series oscilloscopes was named Test Product of the Year at Elektra 2010, the European Electronics Industry Awards. The Elektra awards are decided by an independent panel of judges focused on 16 award categories. The event, considered an annual highpoint within the electronics industry, recognizes the achievements of individuals and companies across Europe. The awards are designed to promote best practices in key areas such as innovation, sales growth and employee motivation. The test and product category is dedicated to the most innovative test equipment during the year. The category is open to hardware and software applications and judged on usability as well as performance. Winners were announced earlier this month in London.
Agilent Technologies' New Software Automates In-Circuit Test Coverage Reports
Agilent introduced a fast and easy-to-use test coverage prediction tool: N1194A Agilent Test Coverage Consultant (ATCC). The ATCC software performs two significant tasks. First, it measures the test coverage of a product after the tests have been developed. Second, it quickly predicts the test coverage of a product based only on the CAD layout files. These two capabilities allow engineers to estimate test coverage early in the product life cycle, when only the CAD layout file is available. ATCC software also can work as a test strategy analysis tool by assisting the test manager in optimizing the manufacturing test coverage using a portfolio of available test platforms.
NI PXI Express Chassis Deliver Added Value and Performance to Automated Test and Control Applications
National Instruments has announced two new PXI Express chassis that deliver added value and performance to automated test and control applications at the same price as similar PXI chassis. Engineers can use the NI PXIe-1078 nine-slot and NI PXIe-1071 four-slot chassis to take advantage of the latest PXI Express modules and controllers with the flexibility of backward compatibility with existing PXI modules.
Tektronix Announces New Addition to its PCIe 3.0 Test Solution
Tektronix just announced a new addition to its solution for PCI Express 3.0. The new offering provides physical layer transmitter (Tx) verification, debug, characterization and compliance testing using Tektronix DPO/DSA/MSO70000 Series oscilloscopes. With this release, Tektronix now offers the broadest and most complete set of physical and protocol layer measurement capabilities for PCI Express.
Rohde & Schwarz releases an LTE Test Case Wizard that radically simplifies testing of radio base stations
The LTE test case wizard dramatically eases the task of generating the correct signals for specific R&S LTE base station test scenarios. An operator of a signal generator only has to select the appropriate test case and the wizard will configure the desired R&S LTE signal, interferers, AWGN and fading. Wizard functionality includes automatic selection of the correct R&S LTE reference measurement channel, setting of the required R&S LTE resource block allocations and configuration of the interfering signals. All power levels of the different signal components automatically conform to the test specification.
LeCroy Enhances LogicStudio to Include Tektronix and Agilent Oscilloscope Connectivity
LeCroy Corporation today announced a new version of its LogicStudio software that enhances the oscilloscope connectivity of the LogicStudio™ 16 providing support for not only the LeCroy WaveJet® oscilloscope but also several popular oscilloscopes from Tektronix and Agilent. This new software adds an unprecedented level of flexibility to the LogicStudio, letting users of a wide range of oscilloscopes from 40 MHz up to 1 GHz turn their PCs into Mixed Signal Oscilloscopes. The 16 digital channels, 1 GS/s sample rate, 3.75ns glitch capture, and serial protocol analysis (I2C, SPI, UART) of LogicStudio can now combine with the analog channels from a wide range of oscilloscopes including the LeCroy WaveJet, six Tektronix product lines, or three Agilent product lines. The lively, dynamic waveform display with a smart, intuitive user-interface is now more powerful than ever, providing a deep toolset for digital, serial and analog debug.
LTE Signaling Conformance Test Cases for Agilent Technologies Equipment validated by 7 layers
7 layers, a global group of test & service centers for the wireless communications industry, is the first accredited organization to validate LTE signaling conformance test cases (also known as protocol conformance test or PCT) for the Agilent N6070A series Signaling Conformance Test and E6621A PXT Wireless Communications Test Set.
Spirent Receives 2010 4GWE LTE Visionary Award
Spirent Communications, the leader in testing solutions for wireless networks, devices and services today announced that Spirent's eAirAccess wireless network emulator was presented the 2010 LTE Visionary Award. The award was presented by Technology Marketing Corporation (TMC) in conjunction with Crossfire Media.
Spirent Tests Service Interaction on Smartphones
Spirent Communications, a leading provider of testing solutions for wireless devices, networks and services, today announced the availability of the industry's first automated R&D solution for testing smartphone performance in the presence of simultaneous voice, data and location-based services (LBS). Built on Spirent's 8100 Development Library solution, this new service interaction test capability is the latest innovative Spirent tool designed specifically to test 3G UMTS device performance.
Agilent Technologies' Target Enrichment System Now Supports 454 Life Sciences Next-Generation Sequencing Platform
Agilent announced that its SureSelect Target Enrichment System now supports the 454 Life Sciences next-generation sequencing platform, boosting efficiency and cost-effectiveness of research by enabling users to sequence just genomic regions of interest rather than entire genomes.
Agilent Launches Online Digital Test Solutions Expertise Centre
Agilent introduced its Digital Test Solutions and Expertise Online Center. The learning site gives customers a range of essential tools on high-speed digital test, including USB 3.0, DisplayPort and HDMI, SATA/SAS, PCI Express(r), MIPI and memory.
Pico Technology offers new Tetris 1 GHz and 1.5 GHz active probes
The two new Tetris probes from Pico Technology offer high bandwidth in a compact and lightweight housing, and are ideal for testing densely-packed high-speed circuits. With their active circuitry, these probes deliver a significant performance improvement over passive probes. While the input capacitance of a passive probe loads the signal source even at frequencies below 1 MHz, causing distortion, the Tetris probes maintain a high input impedance into the GHz range. This enables the accurate display of pulses with sub-nanosecond rise times. The Tetris probes are compatible with all standard high-bandwidth oscilloscopes with 50-ohm BNC inputs, such as the PicoScope 6000 Series.
Agilent Technologies Introduces Automated Software for Testing PCI Express 3.0 Transmitter Compliance
Agilent announced an automated compliance test package for PCI Express(PCIe) 3.0 physical-layer transmitter compliance testing that includes measurement support for the new PCIe 8-GT/s interface. Devices operating at 8 GT/s present new measurement challenges that require new tools and procedures for proper validation and jitter margin analysis. Having advance access to measurements enables engineers developing cutting-edge solutions to address potential issues early in the design cycle and get their products to market faster. The PCIe specification defines a high-speed serial bus used primarily for data communication between a computer's main CPU and high-speed peripheral components such as graphics, networking and storage adapters. It is capable of operating at data rates from 2.5 GT/s to 8 GT/s.
Rohde & Schwarz UK supplies vector network analyser to test waveguide components to 500GHz
Rohde & Schwarz delivers millimeter wave test equipment to Flann Microwave (Bodmin, UK), a leading supplier of waveguide components and systems used in research, communications, radar and security applications. Flann acquired the 50 GHz R&S ZVA vector network analyser in June, subsequently taking delivery of millimeter-wave converter heads that enable the company to test to 220 GHz. This represents the highest frequency test capability known within any UK commercial company to date.
Bluetooth Audio Testing Is Faster and Easier
January 2011 sees the launch of the world's first complete audio test system for Bluetooth devices. Prism Sound's award-winning dScope Series III audio analyzer now supports audio streaming directly between test system and Bluetooth device, enabling real-time, closed-loop testing of Bluetooth audio systems.
Keithley COO Starts Blog on Semi Test on Solid State Technology Website
Linda Rae, executive vice president and chief operating officer of Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has begun a blog with her insights on the changing landscape in the semiconductor test industry. Rae's initial blog topics have included: "Did the Recession Affect the Pace of Innovation?" and "Tier 1 Fabs are Consolidating. How Does that Affect Test?" The Test Points blog can be accessed at: http://keithleyinstruments.blogspot.com/.
NI Measurement Studio 2010 Introduces New Support for Microsoft Visual Studio 2010
National Instruments has announced Measurement Studio 2010 with new support for Microsoft Visual Studio 2010 .NET. The new version of the software fully integrates into Visual Studio 2010/2008/2005 and provides tools designed specifically for data acquisition, signal processing, analysis and visualisation. Microsoft Visual Studio developers using Measurement Studio 2010 can create Windows Forms and Web Forms applications in a shorter amount of time with increased productivity tools, such as code generation assistants and managed .NET APIs. Measurement Studio 2010 also provides support for test and measurement application development using Visual Basic .NET or Visual C#.
Keithley Instruments Releases 11 New “How-To” Videos on Configuring and Operating Source-Measure Units
Keithley Instruments has produced a series of 11 new tutorial videos on topics related to configuring and operating one of their most popular product types, Source-Measure Units (SMUs).
Sweden’s Anaview Invests In A Prism Sound dScope Series III Audio Analyzer
Anaview AB, a Swedish technology house that specialises in providing OEM electronics for the audio industry, is the latest European company to purchase a dScope Series III analogue and digital audio analyser from Prism Sound.
NI LabWindows/CVI 2010 Improves ANSI C Developer Productivity and Simplifies FPGA Communication
National Instruments announced NI LabWindows/CVI 2010, which includes features that build on the proven ANSI C test and measurement software platform to offer increased developer productivity and simplified field-programmable gate array (FPGA) communication. Additional announcements include the LabWindows/CVI 2010 Linux Run-Time Module and the LabWindows/CVI 2010 Real-Time Module that provide functionality to extend the development environment for deploying to Linux and real-time operating systems.
AC/DC current probes offer simple clamp operation and measurement down to 1mA
GMC-I PROSyS has announced that it has extended its CP3 range of AC/DC, non-invasive, current measurement probes. Offering measurement sensitivity into the milliamp range, and with resolution of 1 mA, the CP3 range provides engineers with probes that are ideal for detecting and measuring leakage currents in automotive systems, or verifying correct operation in process control signal loops.
Tektronix - New Oscilloscope Platform with Breakthrough Price, Performance
Tektronix announced a significant expansion of its oscilloscope offerings with the introduction of a new mixed signal oscilloscope platform, the MSO/DPO5000 Series. Tektronix also unveiled revolutionary new TPP1000 and TPP0500 high-bandwidth and low capacitance passive voltage probes with breakthrough performance. Taken together, the new instruments and probes give embedded systems design engineers unmatched performance and analysis tools for complex component and system-level debug and validation tasks, all at highly competitive price points.
New RF Emission and Immunity (Susceptibility) test software Compliance 5 released
Teseq have released the new Compliance 5 test software along with dedicated applications to automate commercial and military testing. DO160 aerospace packages will be available by the end of the year and Automotive packages will be launched in the near future.
Agilent Technologies' Atomic Force Microscopes Enable Advanced Studies of Photovoltaic Materials at South Dakota State University
Agilent announced that the Department of Electrical Engineering at South Dakota State University (SDSU) has installed three additional scientific-grade atomic force microscopes (AFMs). Two of the new instruments, an Agilent 5500 AFM and an Agilent 5420 AFM, will be used by the nano research group, led by Dr. Venkat Bommisetty and other researchers at SDSU.
Free Keithley Webinar Teaches Fundamentals of Bias Temperature Instability Measurement Methods
Keithley Instruments will broadcast a free, webinar titled "Fundamentals of Bias Temperature Instability and State-of-the-Art Measurement Methods" on Thursday, December 16, 2010. This one-hour presentation is designed to help reliability engineers understand and implement state-of-the-art Bias Temperature Instability (BTI) measurements using ultra-fast I-V (current-voltage) methods. The online event also features an interactive question and answer session.
Agilent Technologies' Announces Express Configurations for Signal Analyzers, Signal Generators
Agilent Technologies Inc. today introduced express configurations for the popular CXA/EXA signal analyzers and MXG signal generators. Express configuration products provide fast, off-the-shelf delivery of the most popular test and measurement configurations. This service ensures that test equipment is shipped as fast as possible to customers' research and development and manufacturing lines, ready for immediate use, saving time, effort and expense.
Agilent Technologies' New Nanoindentation Technique Enables Substrate-Independent Measurements on Thin Film Materials
Agilent Technologies Inc. today announced an innovative nanoindentation technique available exclusively on the Agilent Nano Indenter G200 instrumentation platform. The new technique gives researchers the unprecedented ability to make substrate-independent measurements on thin film materials quickly, easily and confidently by means of nanoindentation. It is ideal for evaluating the elastic modulus of hard samples on soft substrates, or of soft samples on hard substrates.
Agilent Technologies Awarded $1.8 Million Contract by U.S. Navy for Handheld Spectrum Analyzers
Agilent Technologies Inc. today announced that it has been awarded a $1.8 million contract by the U.S. Navy. Under the terms of the contract, Agilent will supply handheld spectrum analyzers (HSAs) to the Navy for five years. The instruments will help the Navy's technicians install, monitor and maintain RF electronic systems in the field.
COMPRION sets the standard for a new generation of SIM spy tools
The MiniMove responds to the testing needs of card and handset manufacturers, application developers and network operators for a very small, USB powered quality trace tool which helps to ensure interoperability between the individual components involved with the (U)SIM interface. MiniMove detects communication errors between handsets and Smart Cards and analyses them accordingly.
New Boundary Scan Relays Card for Integration into ICT Adapter Systems
GOEPEL electronic introduces a special relay card for integration into fixture adapter systems for In-Circuit Testers (ICT). The card is named CION ICT Adapter, and was specifically developed to meet customer requirements for Boundary Scan integration into ICT adapter systems.
Hamamatsu Photonics M2 Ion Detector
Hamamatsu Photonics introduced the new M2 Ion Detector, a unique, ultra-compact high speed ion detector for mass spectrometry applications. The M2 Ion Detector is a thumb-sized device, measuring just 28mm (including leads) x 24mm, with an 8mm diameter effective area.
National Instruments - NI TestStand 2010 With Enhanced Team-Based Test Software Development Tools
National Instruments has introduced NI TestStand 2010, the industry's most widely used commercial off-the-shelf test management software for automated validation and production testing. NI TestStand helps test engineers build a powerful software framework for accelerating the development of test sequences and minimises the total cost of ownership of maintaining test executive software deployed across many test stations. The latest version adds many new team-based development features including a Sequence Analyser, a three-way file diff-and-merge utility, support for new PC technologies and enhanced integration with NI LabVIEW graphical system design software. NI TestStand 2010 is ideal for a variety of automated test applications within telecommunications, consumer electronics, automotive, aerospace/defence and other industries.
Vector Link connects Agilent In-Circuit Tester with JTAG/Boundary Scan Software Platform SYSTEM CASCON
GOEPEL electronic introduces a special link software to migrate test vectors to Agilent In-Circuit Testers (ICT). The vector link was developed in cooperation with the GATE Program member WG-Test and supports the transfer of hybrid Boundary Scan test sets to the parallel pin electronics at parallel pin level fault diagnosis.
Multitest Develops Innovative LCR Concept for Cost Efficient, High-Performance Test Interface Boards
Multitest's board division has successfully introduced a new LCR (layer count reduction) concept for high pin count BGA applications. Board customers now will benefit from significant cost savings without sacrificing performance. With the new LCR concept, the layer count of standard pitch BGA boards can be reduced by up to 40 percent.
Airbus military tanker passes civilian noise restrictions
Spain's National Institute for Aerospace Technology (INTA) successfully took part in the Noise Certification of the Airbus A330 MRTT (Multi Role Transport Tanker) using Brüel & Kjær's equipment and expertise.
Rochester Electronics’ Original Engineering-Driven Test Protocol Assures Accurate, Comprehensive Testing of All Manufactured Semiconductor Devices
Selecting the proper fault models, methodologies, implementation techniques, and test facilities appropriate for each of today's IC chips is a complex science. Rochester Electronics has founded its Original EngineeringDriven (OED) Test Protocol™ on continuing manufacturing agreements with original semiconductor manufacturers and the advanced expertise of Rochester's dedicated test engineers.