Test and Measurement

Austin-Bergstrom further improves noise management with Brüel & Kjær

Upgraded Brüel & Kjær Monitoring System Equips Austin-Bergstrom International Airport to Further Improve Noise Management

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Christopher Associates Debuts Remote Live Option for the Tagarno Magnus HD

Christopher Associates Debuts Remote Live Option for the Tagarno Magnus HD

Christopher Associates Inc. today announced the release of its new Remote Live option for the Tagarno Magnus HD Inspection System. Remote Live enables streaming of the Tagarno Magnus HD's signal, allowing users in different buildings (or different parts of the world) to share the same field of view.

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Intersil Announces Opening of New Enhanced Low Dose Rate Sensitivity (ELDRS) Testing Facility

Intersil Corporation has announced its continued commitment to the global space community by introducing its new Palm Bay, Florida ELDRS testing facility. The facility will perform low dose rate total ionizing dose (TID) acceptance testing for all Intersil radiation hardened products – regardless of process technology – on a wafer by wafer basis. These tests will be conducted in accordance with government performance specifications MIL-PRF-38535 (QML) and MIL-STD-883, and will provide Intersil customers with assured low dose rate performance.

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GL Announces Enhanced Voice and Data Testing Solutions

GL Announces Enhanced Voice and Data Testing Solutions

GL Communications announced today the release of VQuad with enhanced Voice and Data Testing Capabilities – VQuad and VQuad - Lite (ver 6.4), Mobile Device Controller, and WebViewer. Speaking to the press, Mr. Robert Bichefsky Senior Manager at GL said, Communications is dramatically changing right now, as "mobility" and "IP" technologies such as LTE, Advanced LTE, WiMax, 3G, and Broadband Internet, lead this transformation. As these technologies are rolled out, basic voice/data quality will ultimately determine the fate of carriers and end equipment manufacturers. Simple and effective methods of testing voice and data are sorely needed - GL's mobile test solution provides this capability with the flexibility of connecting to and between any device (including Apple and Android), any network, any service, and any interface.

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Microscan’s Vision MINI Smart Camera a “Perfect Fit” for Clinical Instrument Manufacturers

Microscan’s Vision MINI Smart Camera a “Perfect Fit” for Clinical Instrument Manufacturers

Microscan, the leading global supplier of embedded barcode scanners and imagers for life sciences, announces the new Vision MINI smart camera. As the world's smallest, fully integrated vision system, the ultra-compact Vision MINI is designed for reliable vision performance in embedded clinical and lab automation applications. Live demonstrations of the Vision MINI will be available at the upcoming American Association for Clinical Chemistry (AACC) Annual Meeting in Atlanta, GA, scheduled to take place July 26-28, 2011 in Microscan's Booth #239.

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Award win for Multi-Contact's adjustable test probe

Award win for Multi-Contact's adjustable test probe

Multi-Contact's adjustable XSAP-4 test probe has won a MessTec & Sensor Masters Award 2011. The probe, which was launched earlier this year, was voted third place in the test and measurement category.

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LeCroy Extends Analysis and Simulation Offerings with Signal Integrity Studio Software Package

LeCroy Corporation announced the launch of an extension to their signal integrity product line: Signal Integrity Studio (SI Studio). SI Studio is an add-on to the LeCroy SPARQ application software, and can work either in conjunction with a SPARQ series network analyzer or as standalone software.

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LeCroy Introduces Address Translation Services Support For PCI Express Protocol Analysis and Test

LeCroy announced today a new feature added to its PCI Express (PCIe) protocol analyzer and exerciser line of products that will support PCI Express Address Translation Services (ATS) for testing and debugging PCI Express specification-based applications. LeCroy had previously supported some aspects of the Address Translation Services specification from the PCI-SIG® on its protocol analyzer line. The announcement now includes updates from the new specification and extends that functionality to LeCroy's Summit™ Z3-16 PCI Express 3.0 protocol exerciser.

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LeCroy - ExpressModule Interposer to Support PCI Express 3.0 Protocol Analysis

LeCroy introduced a new PCI Express (PCIe) ExpressModule interposer that supports PCI Express 3.0 specification data rates up to 8 GT/s. The new ExpressModule interposer, designed for use with the LeCroy Summit T3-16 and T3-8 PCI Express protocol analyzers, provides the ability to easily analyze data traffic between high performance ExpressModule HBA cards and ExpressModule-based blade server systems.

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LeCroy - Comprehensive Verification, Debug, and Conformance Test Suite for MIPI M-PHY

LeCroy today introduced a test suite tailored specifically to the verification, debug, and conformance testing of MIPIR Alliance M-PHYSM and various other signal types using the M-PHY physical layer standard.

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NI DIAdem 2011 Expedites Analysis, Reporting of Engineering Measurement Data

NI DIAdem 2011 Expedites Analysis, Reporting of Engineering Measurement Data

National Instruments has announced NI DIAdem 2011, the latest version of the software tool specifically designed to make engineers and scientists more efficient when locating, inspecting, analysing and reporting on measurement data. DIAdem 2011 gives engineers a new data-loading method for access to large data sets in less time than before, a new DataPlugin Wizard for Microsoft Excel to easily migrate from Excel to DIAdem and enhancements to the DIAdem REPORT panel for a richer, more dynamic report creation experience.

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Anritsu Introduces High-Frequency Sampling Oscilloscope Probe

Anritsu Company introduced the J1512A Passive Probe for its BERTWave MP2100A BERT and EYE/Pulse Scope solution. Also compatible with GHz-band sampling oscilloscopes, the J1512A simplifies monitoring and confirming the signal levels and waveforms of mounted electronic devices without on-board coaxial connectors, such as SMA connectors, which allow engineers to more efficiently verify the designs of their high-speed digital communications equipment and devices.

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SATIMO to Support LTE OTA Testing Using Anritsu MT8820C One-Box Tester

Anritsu Corporation and SATIMO (A Microwave Vision company) are proud to announce that the Anritsu MT8820C One-Box Tester has been selected by SATIMO as a supported test solution for OTA LTE testing, including MIMO. Based on this selection, the MT8820C is integrated into the SATIMO SAM OTA performance test software.

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Anritsu Company Redefines Broadband VNA Market with Introduction of ME7838A

Anritsu Company introduces the ME7838A broadband vector network analyzer (VNA) system that provides single-sweep coverage from 70 kHz to 110 GHz with operation from 40 kHz to 125 GHz, and utilizes an advanced design that eliminates the need for large, heavy millimeter wave (mmWave) modules and coax combiners.

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World First 28-Gbit/s Interconnect Signal Integrity Analysis

Anritsu Corporation has announced the launch of the company's MU181500B Jitter Modulation Source and MP1825B 4 Tap Emphasis products for upgrading the functions of Anritsu's MP1800A Signal Quality Analyzer by supporting signal integrity analysis of high-speed interconnects up to 28 Gbit/s, - a world first.

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Chunghwa Telecom Selects Spirent for Cloud Security Testing

Addressing the uncertainty surrounding cloud security is critical for large-scale adoption of cloud computing in enterprises. Chunghwa Telecom Laboratories (CHTTL), the research and development arm of Chunghwa Telecom, Taiwan's largest network operator, clearly understands the need to ensure secure and reliable cloud services, and is relying on solutions from Spirent Communications to help validate the security of its cloud computing centers.

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Spirent Achieves ‘Ready for IBM Rational’ Software Validation

Spirent Communications today announced that its flagship test optimization product, Spirent iTest, has achieved 'Ready for IBM Rational Software' validation for its integrations with IBM Rational Quality Manager and IBM Rational Functional Tester. In addition, the Spirent iTest/Rational Quality Manager integration has achieved the 'Ready for IBM Rational Best Practices Indicator'.

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Agilent Establishes Capacitance Calibration Standard for AFM-Based Scanning Microwave Microscopy

Agilent Establishes Capacitance Calibration Standard for AFM-Based Scanning Microwave Microscopy

Agilent Technologies Inc. (NYSE: A) today introduced the first commercially available capacitance calibration standard for an atomic force microscope (AFM). The scientific solutions provider issued calibration specifications for capacitance measurements that allow quantitative assessment of material and device properties via its award-winning Scanning Microwave Microscopy Mode. Researchers from Agilent collaborated with the National Institute of Standards and Technology (NIST Boulder Laboratories) to establish the new standard.

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Agilent Technologies Releases New Cytogenetics Software, Providing Complete Solution for Researchers

Agilent introduced Agilent CytoGenomics 1.5 software. This analytical tool gives researchers the ability to streamline their analysis by querying the in-house CytoGenomic database and external databases. The software is designed for easy data interpretation and simple report generation.

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Agilent Technologies Introduces Sub-Two Micron Reversed-Phase UHPLC Column, Enabling Fast Higher-Order Protein Characterization

Agilent Technologies Inc. (NYSE: A) today introduced the ZORBAX RRHD 300SB-C18 1.8 micron column for UHPLC systems. It is a silica reversed-phase column that can be used for higher-order reversed-phase characterization of intact proteins and protein digests.

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Agilent Technologies Introduces Highest Bandwidth Optical Waveform Analysis, Increased Accuracy on its Digital Communications Analyzers

Agilent Technologies introduced a new measurement solution for optical transmitter compliance testing on the Agilent 86100D digital communications analyzer. The solution offers the industry's highest bandwidth optical waveform analysis and increased accuracy.

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Aeroflex - AX-Series for characterization and production test of consumer RF and mixed signal semiconductors

Aeroflex - AX-Series for characterization and production test of consumer RF and mixed signal semiconductors

Aeroflex launched the AX-Series at SEMICON West today, a completely new product line for characterization and production testing of consumer RF and mixed-signal semiconductors.

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GOEPEL electronic supports Picochip in testing next generation ’small cell’ baseband chips

GOEPEL electronic has developed special VarioTAP IPs for testing the new generation of femtocell chips in cooperation with Picochip. The solution enables dynamic processor emulation tests (PET) for fault detection and diagnostic on board and system level, as well as supporting embedded Flash programming.

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Multitest Names New President

Multitest Names New President

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Reinhart Richter has been promoted to President of the Multitest Group effective immediately.

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Yokogawa offers enhanced calibration services for power measurements

Yokogawa offers enhanced calibration services for power measurements

An enhanced calibration service for high-frequency AC power measurements is now being offered by Yokogawa Europe through its European Standards Laboratory in Amersfoort, Netherlands.

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AOI Brings Contract Manufacturer Up To Speed

AOI technology is paying dividends for Wildtrax, YES Tech's Andy Bonner looks at what the technology provided

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Compact and for high pressures - New: Flow monitor with flow indicator

Compact and for high pressures - New: Flow monitor with flow indicator

Meister Strömungstechnik expands its product portfolio with a new series of compact, high-pressure flow monitors with integrated flow indicators. The model series RVM/UA-2 serves not only to electrically monitor limit values, it was developed specifically for applications in which the volume flow is to be indicated also.

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Geotest Announces PXI Semiconductor Test System for Digital and Mixed Signal Test Applications

Geotest has announced the TS-900, a new PXI-based test system for component, SoC and SiP test applications. Offering up to 512, 100 MHz channels with per-pin PMUs and an integrated receiver interface, the modular TS-900 includes a full-featured set of hardware and software capabilities for digital and mixed – signal test applications. The custom-designed, test interface supports the use of PCB DUT (Device Under Test) boards — a proven and high-performance method for interfacing to the device under test. Additionally, the receiver interface's pin blocks are field configurable, allowing users to upgrade the receiver when they modify or upgrade the system for new applications. The system supports 64 to 512 dynamic digital channels as well as a range of analog, power supply and RF resources.

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Extending the Reach of Free Boundary-scan Tools

Extending the Reach of Free Boundary-scan Tools

JTAG Technologies launches Buzz-plus; worth 99 Euros but available for free to a limited number of current Buzz users - JTAG Technologies is proud to announce the latest extension to its popular JTAGLive family of boundary-scan powered design and repair debug tools for PCBs. JTAGLive Buzz-plus is an extension to the acclaimed free-of-charge Buzz tool that was launched in 2009.

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Multitest’s Dura Kelvin Reduces Overall Cost of Test

Multitest’s Dura Kelvin Reduces Overall Cost of Test

Multiest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its Dura Kelvin contactors again have proven their reputation for outstanding lifetime and cleaning cycles. At an international IDM's high-volume production site, the Dura Kelvin contactor substantially contributed to reducing the overall cost of test.

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National Instruments Introduces Industry’s Highest Throughput PXI Frame Grabber

National Instruments Introduces Industry’s Highest Throughput PXI Frame Grabber

New Module Ideal for End-of-Line Test and Industrial Inspections Requiring High Data Throughput - National Instruments today announced the NI PXIe-1435 high-performance Camera Link frame grabber. Engineers can use the new module to integrate high-speed and high-resolution imaging into their PXI systems, the industry standard for automated test with more than 1,500 measurement modules available from more than 70 vendors. By combining high-throughput imaging with the benefits of off-the-shelf PXI measurement hardware, NI now offers full software-defined solutions for demanding automated test applications in industries such as consumer electronics, automotive and semiconductor.

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National Instruments Digital Video Analyzer Automates Wide Range of HDMI Tests

National Instruments Digital Video Analyzer Automates Wide Range of HDMI Tests

New PXI Solution Delivers HDMI 1.4 Protocol, Embedded Audio, 3-D Video Measurements and Real-Time Picture Quality Analysis - National Instruments today introduced the new NI Digital Video Analyzer, which automates a wide range of tests for the latest HDMI sources such as set-top boxes, Blu-ray Disc players and DVD players. The analyzer features configuration-based test steps that automate measurements of HDMI features including 3-D video, HDMI 1.4 protocol and picture quality analysis. With hardware based on the NI PXI Express platform and software designed for multicore computing, engineers can use the NI Digital Video Analyzer to achieve high-performance, high-precision measurements of HDMI content in a fraction of the time required by traditional video test solutions.

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Analog Devices’ MEMS iSensor Digital Inclinometer System Delivers 0.1-degree Roll/Pitch Accuracy with Simple Set Up

Analog Devices’ MEMS iSensor Digital Inclinometer System Delivers 0.1-degree Roll/Pitch Accuracy with Simple Set Up

Analog Devices, Inc. (ADI), released for general availability today the ADIS16210 MEMS iSensor® digital inclinometer system, which provides precise measurements for both pitch and roll angles over a full orientation range of ±180 degrees. The ADIS16210 integrates ADI's iMEMS® multi-axis accelerometer technology and signal processing expertise, adding addressable user registers for application tuning and programming, available over an SPI-compatible serial interface. The precision core sensors are tuned to allow accurate roll/pitch outputs independent of the orientation of the mounted sensor.

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Pico Technology celebrates 20th anniversary with fastest ever PicoScope!

Pico Technology celebrates 20th anniversary with fastest ever PicoScope!

The new four-channel PicoScope 6404 PC Oscilloscope has an analog bandwidth of 500 MHz. This is matched by a real-time sampling rate of 5 GS/s, which guarantees accurate representation of signals up to the full bandwidth. The scope also has an ultra-deep 1 gigasample buffer memory that allows capture and analysis of complex waveforms, even when sampling at full speed.

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Christopher Associates Introduces Large-Format AOI System from Marantz

Christopher Associates Introduces Large-Format AOI System from Marantz

Christopher Associates Inc. today announced the release of the Marantz iSpector 800 large-format automatic optical inspection (AOI) system. The iSpector 800 is capable of high-speed inspection of panels from 50 x 50 mm (2 x 2) up to 460 x 800 mm (21 ¾ x 31 ½).

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National Instruments - Industry’s Highest Throughput PXI Frame Grabber

National Instruments announced the NI PXIe-1435 high-performance Camera Link frame grabber . Engineers can use the new module to integrate high-speed and high-resolution imaging into their PXI systems, the industry standard for automated test with more than 1,500 measurement modules available from more than 70 vendors. By combining high-throughput imaging with the benefits of off-the-shelf PXI measurement hardware, NI now offers full software-defined solutions for demanding automated test applications in industries such as consumer electronics, automotive and semiconductor.

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Agilent - 8990B Peak Power Analyzer with the Fastest Rise Time/Fall Time in the Peak Power-Measurement Market

Agilent - 8990B Peak Power Analyzer with the Fastest Rise Time/Fall Time in the Peak Power-Measurement Market

Agilent announced the Agilent 8990B, a peak power analyzer that offers faster measurement speed and greater measurement accuracy in peak power-pulse analysis for the aerospace, defense and wireless markets.

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Agilent Technologies Advances X-Parameters* Innovations

Agilent announced the latest wave of X-parameter innovations designed to further advance their use and support the industry's rapidly increasing interest in the technology.

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Agilent Technologies' N6700 Modular Power System Family Adds Application-Specific Modules for Battery Test, Mobile Device Manufacturing

Agilent Technologies' N6700 Modular Power System Family Adds Application-Specific Modules for Battery Test, Mobile Device Manufacturing

Agilent announced the addition of two new application-specific modules to the N6700 Modular Power System (MPS) family, the N6783A-MFG mobile communications DC power module and the N6783A-BAT battery charge/discharge module.

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Agilent - Modular AXIe Embedded Controller

Agilent announced its first modular AXIe embedded controller - the Agilent M9536A, a powerful one-slot module that can be used to build compact AXIe systems.

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