Test and Measurement
RF Signal Generator Tests Components to Latest Standards
Aeroflex's new generation of wide bandwidth RF signal generators and analysers in PXI format with class-leading performance enable a high performance, flexible, and cost effective solution for RF component and wireless device testing to the latest standards, including WLAN 802.11ac. The PXI 3050A low noise RF signal generator and the PXI 3320 arbitrary waveform generator (AWG) are used together to provide a fully configurable RF signal generator with wide bandwidth vector modulation, low phase noise, and fast frequency and level settling.
Teledyne LeCroy Announces Flexible Storage and Network Test Solutions for 8/16G Fibre Channel and 10/40G Ethernet
Teledyne LeCroy today announced the addition of the SierraNet M168 and its new FlexPort Technology to the SierraNet product family. The SierraNet M168 is an 8-port multi-protocol analyzer and error injector supporting up to 16G Fibre Channel and 10Gbps Ethernet protocols.
Serial-Bus Testing Added to Eight-Channel Oscilloscopes
A number of new enhancements have been introduced to the Yokogawa DLM4000 Series of 8-channel mixed-signal oscilloscopes. These include the L16 option, which adds 16 extra channels of logic, plus upgraded firmware for power measurements and serial-bus testing.
Agilent Technologies Announces Analysis Software for USB Protocol Analyzers
Agilent Technologies today announced a new analysis software suite for the U4611A, U4611B and U4612A family of USB protocol analyzers. The suite features the new MegaZoom technology, offering USB device designers quick and easy insight into their designs' behavior, and streamlining USB test and validation.
The Threat Of Instability
Addressing one of the most difficult reliability challenges facing the semiconductor manufacturing community today. By Christopher L. Henderson, President of Semitracks Inc,. This ES Design magazine article is based on a white paper, with editorial contributions by Peter J. Hulbert and David W. Rose of Keithley Instruments.
Seeking A Test Panacea
Testing electronic circuits has been a key topic in the industry since the first transistor was developed, and today it is as relevant as ever. But how close to the ideal solution can developers get? By Thomas Wenzel, Co-Founder and Managing Director GOEPEL electronic GmbH in Jena/Germany, and Heiko Ehrenberg, President, North American operations, GOEPEL electronics LLC in Austin, TX/USA.
Improving Detection With Future Protection
Delivering future-proof innovation to the most demanding customer-base requires the adoption of the best-in-class solutions. By Stephane Monboisset, Senior Manager, Processing Platforms Product Marketing for Xilinx, and Peter Stemer, R&D Section Manager System Control for Agilent Life Science.
digitizerNETBOX – Ethernet/LXI digitizer solution
The digitizerNETBOX is the first model of the all-new product line easy instruments at Spectrum. These products are aimed at both industrial users, as well as users of research and development, which were to focus primarily on their measurement applications.
PCI Express Protocol Analysis Costs Less Than €5,000
Teledyne LeCroy announce its most cost-effective PCI Express protocol analyzer with interchangeable interposers for probing. The new compact but feature-packed Summit T24 Protocol Analyzer features a small chassis footprint while maintaining the same data analysis features found in the top-of-the-line Summit T3-16 protocol analyzer. The Summit T24 protocol analyzer supports PCIe data transmission rates up to 5 GT/s and data lane widths up to x4 in a single compact unit.
Saelig Announce 6GHz Counter-Timer With Low Cost And High Resolution
Saelig unveil an economical 6GHz bench/portable frequency counter, the TF960. It features a high quality temperature compensated internal frequency reference which has a low ageing rate and is stable to within ±1ppm over the full temperature range. Its short warm-up time allows accurate measurements to be made even under portable battery powered conditions.
New Flexible Resolution Oscilloscopes From Pico Technology
For the first time in an oscilloscope, Pico Technology has used reconfigurable ADC technology to offer a choice of resolutions from 8 to 16 bits in a single product. Most digital oscilloscopes gain their high sampling rates by interleaving multiple 8-bit ADCs. Despite careful design, the interleaving process introduces errors that always make the dynamic performance worse than the performance of the individual ADC cores.
Getting To The Heart Of The Problem
In this article from ES Design Magazine, Daniel Ruebusch of Agilent asks: How do you test and debug a device with hundreds of thousands of internal logic cells and transceiver speeds up to 28Gbit/s? Such is the challenge facing designers employing today's industry leading FPGAs.
ASSET InterTech eBook: Functional Test On I2C And SPI System Monitors With JTAG
A new eBook from ASSET InterTech explains how the structural test methodology based on the IEEE 1149.1 boundary scan standard, known as JTAG, can apply functional tests to I2C and SPI system monitors during prototype board bring-up and later during production of the circuit board.
Teledyne LeCroy Upgrades DDR Protocol Analyzer to Support ECC SO-DIMM
Teledyne LeCroy has upgraded the Kibra 480 DDR protocol analyzer platform with probing options to support DDR3 SO-DIMMs with Error Correction Code. The new interposers operate non-intrusively to monitor ECC SO-DIMM operating at speeds up to 2133 MT/s.
Still Faster with ETAS INCA V7.1, New features and increased system performance accelerate work processes
In the course of its 15 years on the market, the INCA application tool has grown a user base of more than 25,000. One of the major focal points in the development of the tool's latest release, INCA V7.1, was the improvement of system performance as it relates to the handling of ECU projects featuring a large contingent of measurement and calibration variables.
Rohde & Schwarz User-Friendly Bench Oscilloscopes With Logic Analysis
With the introduction of the new R&S RTM series, Rohde & Schwarz has expanded the functional range of its bench oscilloscopes. The key upgrades are a 20 Msample deep memory and a logic analysis option with 16 digital channels. The smart operating concept of the new R&S RTM models ensures extreme ease of use. The R&S RTM provides time domain, logic, protocol and frequency analysis functions in a single box, making it the ideal instrument for the testing and development of electronic circuits.
Simplify Vision Systems With Power Over Ethernet Frame Grabbers
National Instruments has announced the NI PCIe-8236 and NI PCIe-8237R two-port GigE Vision frame grabbers featuring PoE technology. The NI PCIe-8237R features NI LabVIEW FPGA-enabled I/O, including isolated digital inputs and outputs, as well as bidirectional TTL lines for implementing custom counters, PWM signals and quadrature encoder inputs.
Saelig announces the JTAGMaster universal PLD test system
Saelig Company has introduced the JTAGMaster Tester/Programmer, an integrated solution for testing and configuring Programmable Logic Devices. JTAGMaster can perform boundary scan IC and board tests, as well as programming JTAG-compatible IC and EEPROMs using external adapters.
Signal Generator Frequency Range Covers 100kHz to 3GHz or 6GHz
Described as a future proof instrument the Rohde & Schwarz SMW200A high end vector signal generator covers the frequency range from 100kHz to 3Ghz or 6GHz. It features an I/Q modulation bandwidth of 160MHz with internal baseband. It covers all the important communications stanards including WLAN IEEE 802.11ac, and 2x2MIMO, 8x2MIMO for TD-LTE and 2x2MIMO for LTE-A.
Epson Announces Two New Inertial Measurement Units for Industry
Seiko Epson has developed two new products, the M-G550-PC and the M-G550-PR, for its inertial measurement unit lineup. The new products will be on show at Sensor + Test 2013, the world's largest international fair for sensors to be held from May 14 to 16 in Nuremburg, Germany.
Mantracourt Launches New Design Strain Gauge to USB Converter
We are pleased to announce the launch of our new redesigned strain gauge to USB converter (DSCUSB). The new design offers a more compact solution, with a smaller and more stylish enclosure. Internally the product remains unchanged and will perform identically to its widely acclaimed predecessor.
Teledyne LeCroy Announces DDR4 Physical Layer Compliance Test Support and DDR4 Lighthouse Partners Program
Teledyne LeCroy announces the addition of DDR4 physical layer compliance test capability through the DDR4 Lighthouse Partners Program. DDR4 developers who are looking to validate their design will benefit from joining the Lighthouse Partners program which provides early access to design validation software.
GOEPEL electronic extends JULIET Desktop Tester to support Embedded System Access
GOEPEL electronic presents a number of new features for its desktop tester series JULIET. The systems now support all Embedded System Access technologies for high-speed in-system programming of Flash, PLD and MCU as well as structural and functional at-speed board test.
LTX-Credence Announces the Selection of the Diamondx Tester by Texas Instruments for Microcontroller Device Testing
LTX-Credence today announced that Texas Instruments has selected the LTX-Credence Diamondx tester as its test solution for Cortex-M microcontrollers in a 65nm process. TI selected the Diamondx based on its proven ability to deliver highly efficient testing of its microcontrollers, thereby substantially lowering test cost without compromising quality.
Yokogawa power meters are key to LUX-TSI EcoDesign Test programmes
Yokogawa power meters and analysers are the key elements in tests being carried out by LUX-TSI. The two companies have entered into a relationship to test products using Yokogawa's WT210 and WT3000 instruments to evaluate compliance with European Ecodesign Directives, and this capability will be demonstrated at the euroLED Conference at the International Convention Centre, Birmingham, on 24th and 25th June 2013.
New PXI controller for ASSET's ScanWorks platform supports four test technologies
With the new PXI-based controller for ASSET InterTech's ScanWorks platform for debug, validation and test, engineers can test circuit boards with four different toolsets, each based on a different test technology.
IAR Systems now shipping I-scope probe for real-time current and voltage measurements
IAR Systems today announced that it has started shipping the latest addition to its innovative Power Debugging technology. The I-scope probe extends the power optimization possibilities available in IAR Embedded Workbench.
New Emerson Network Power VPX System Chassis Simplifies Development, Testing and Deployment
At the Design West Expo today, Emerson Network Power today announced its latest VPX system chassis: the KR8-VPX-3-6-1. Designed primarily for development, testing and lab duties, the KR8-VPX-3-6-1 can also be deployed in ground benign installations as it meets Emerson's standard safety, electromagnetic compatibility and environmental requirements.
Industry-First Solution For SD UHS-II Receiver Testing
Agilent Technologies have introduced the industry's first receiver testing solution for secure digital ultra-high-speed host products and memory card devices. Unveiled at the SDA event in Osaka, Japan, N5990A test automation software Option 120 accelerates accurate characterization and compliance verification of receiver ports in host products and memory card devices that support the SD Association's emerging UHS-II memory card standard.
GOEPEL electronic upgrades RAPIDO System Series for cost-efficient On-Board Programming
At the 2013 SMT/Hybrid/Packaging show, GOEPEL electronic announced the market introduction of another RAPIDO series inline production system for in-system programming and board test based on the latest Embedded System Access technologies.
Teledyne LeCroy Announces New SFF-8639 Single Port Interposer
Teledyne LeCroy today announced the availability of a SFF-8639 single-port interposer card for analysis of Solid State Drives based on PCI Express protocols. The SFF-8639 Interposer Card, used with a Summit Protocol Analyzer, enables PCIe bus traffic between a host backplane and SSD device to be monitored, captured, and recorded for protocol analysis.
PCI Express Protocol Analysis Drops Below $5,000
Teledyne LeCroy today introduced its most cost-effective PCI Express protocol analyzer with interchangeable interposers for probing. The new compact but feature-packed Summit™ T24 Protocol Analyzer features a small chassis footprint while maintaining the same data analysis features found in the top-of-the-line Summit T3-16 protocol analyzer.
Telonic Explores Switch Mode PSU Noise With Video Demos
An ideal PSU would supply pure DC at its output, with no noise evident. How does this work in the real world? What happens to regulation under load? Noise must be measured correctly to avoid troublesome test results. Showing how to correctly recognise the several sources of noise, Charles an Engineer at Telonic Instruments makes some practical measurements on a typical mains-powered switch mode power supply.
Newtons4th Launch Portable IEC60076-18 Transformer Tester
The Queen's Award winning Newtons4th has launched the SFRA45, a handheld instrument designed especially for field testing the frequency response of step down transformers against the standards laid down in IEC60076-18.
Simultaneously Stress Test Networks And Diagnose Issues In Real-Time
Fluke Networks announce a new version of the OptiView XG v10 Network Analysis Tablet that allows users to simultaneously stress test and diagnose network problems in real-time, as well as a new iPhone App, called HeadsUp XG, that receives instant notifications of issues identified by the tablet. Simultaneous testing is key to quickly isolating intermittent network performance issues, a top concern of more than 75 percent of IT professionals.
Enhanced DC LISN from Teseq Measures Disturbances at Higher Current
Teseq now offers a high current impedance stabilization network for measuring conducted emissions disturbances on DC power ports of photovoltaic inverters. The DC-LISN-M2-100, which conforms to the latest requirements of the international standard working group MT GCPC (grid connected power conditioners), can run at a maximum operating current of 150 A for 30 minutes, or continuously at 100 A.
Teledyne LeCroy Announces New TeleScan PE Utility supporting PCI Express 3.0 Specification
Teledyne LeCroy today announced the availability of TeleScan PE, the third-generation configuration space scanning and editing software application, now supporting PCI Express 3.0 technology. TeleScan PE provides system scan, read, write and decode features for PCI Express designs up to PCIe 3.0 specification, and is supplied free of charge.
ADLINK Announces New High Capacity 18-Slot PXI Express Chassis
ADLINK Technology has today announced a new PXI Express chassis for applications requiring enhanced bandwidth and higher density and capacity. ADLINK's PXES-2780, an 18-slot PXI Express chassis with ten hybrid peripheral slots provides a configurable PCIe switch fabric, enabling configuration with two-link x8, and four-link x4 PXI express deployments, allowing full utilization of the PCIe gen2 bandwidth.
Outram PM7000I is First Power Quality Analyser to Simultaneously Record All Harmonics up to 100th
Outram Research announces that the PM7000 has an improved "Interharmonics" option making it the first power quality analyser to record simultaneously all harmonics up to the 100th, on all three phases and the neutral, on either current or voltage.
Electrical Safety Testing Thanks To Rigel Medical’s 62353 Analyser
A leading equipment and service supplier to the NHS has improved the electrical testing of thousands of medical devices located at sites around the UK using Rigel Medical's 62353 safety analyser. Medstrom supplies and maintains electrically operated paediatric cots, bed movers, reactive therapy systems, patient beds, trolleys and carts among other items to hundreds of hospitals and healthcare facilities across the UK. These have to be regularly tested to ensure compliance with IEC 62353, the standard for in-service and after repair testing of medical electronic devices.