Test and Measurement

Digital Multimeter Tests More Diodes Including LEDs

Digital Multimeter Tests More Diodes Including LEDs

Agilent Technologies has unveiled the Truevolt Series digital multimeters. These DMMs offer several advantages over previous models. They help engineers see their measurement data in new ways, get actionable information faster, and document their results more easily. Exclusive Truevolt technology reduces extraneous factors such as noise, injected current and input bias current.

Read full story

RF Conformance Test System Wins PTCRB Approval

Anritsu has received the world's first PTCRB approval for its ME7873L RF Conformance Test System meeting the LTE Rel-10 Carrier Aggregation Standard. The new 4G mobile LTE-Advanced standard supports the carrier aggregation function offering faster communication speeds than the LTE technology now being deployed worldwide.

Read full story

Field Probe Calibration Expanded at EMC Test Centre

TESEQ has expanded its capability in field probe calibration to deliver calibration data at all frequencies defined in the IEC 61000-4-3 standard. The company can now offer field probe calibration data to 6GHz, allowing customers to compensate for frequency variations within the probe with greater precision, through the reduction of measurement inaccuracies. In addition, probe linearity data can also be provided.

Read full story

SEGGER J-Link – First Debug Probe supporting Infineon’s Single Pin Debug Interface

SEGGER J-Link – First Debug Probe supporting Infineon’s Single Pin Debug Interface

SEGGER has added support for Infineon's Single Pin Debug Interface for the XMC1000-series of Infineon Technologies to the J-Link family of debug probes. The J-Link is the only commercial debug probe in the market capable of connecting to a device with the SPD-interface.

Read full story

Synopsys Unveils New Synthesis-Based Test Technology Delivering Up to 3X Higher Compression

Synopsys today unveiled a new, innovative test technology to further reduce the cost of testing silicon devices by delivering up to 3x higher test compression and minimizing the time required to test each silicon die.

Read full story

Insertion Loss Test System Upgraded To Meet SET2DIL Enhancement

Insertion Loss Test System Upgraded To Meet SET2DIL Enhancement

Polar Instruments says that its Atlas Si SET2DIL (Single Ended TDR to Differential > Insertion Loss) insertion loss test system will be upgraded to support Bidirectional SET2DIL from June 2013. This upgrade follows the recent IPC proposal for SET2DIL insertion loss testing to be enhanced with Bidirectional SET2DIL. Polar Instruments' customers using previous versions of the Atlas Si test system will be offered an upgrade, at no cost, to support Bidirectional SET2DIL testing.

Read full story

Current Transducer Opens Door to Measurements at Higher Temperatures

Current Transducer Opens Door to Measurements at Higher Temperatures

Power Electronic Measurements (PEM) has launched its latest generation of Rogowski coils for non-contact current measurement, designed specifically for monitoring today's most advanced power systems and semiconductors. The new CWT Ultra-mini probe offers higher maximum frequency and increased stability over a wider operating temperature range.

Read full story

Enter the Dragon! Goepel Unleashes LVDS, HDMI Tester

Enter the Dragon! Goepel Unleashes LVDS, HDMI Tester

GOEPEL electronic has introduced Video Dragon (basicCON 4121), a new solution for the test of high-speed LVDS connections and HDMI interfaces, setting new standards in testing infotainment components. Due to its modular architecture the device can be optionally configured as a frame grabber and frame generator.

Read full story

Agilent Acts to Develop RoHS Compliant Products

Agilent Technologies says that the majority of its electronic test and measurement products are now designed for compliance with the European Union's restrictions on the use of certain hazardous substances in electrical and electronic equipment. The European RoHS directive bans the sale of equipment containing more than the agreed level of lead, mercury, cadmium and other substances.

Read full story

Saelig Announces Smallest Handheld Mixed-Signal Oscilloscope With AWG

Saelig Announces Smallest Handheld Mixed-Signal Oscilloscope With AWG

Saelig Company has introduced the Xprotolab Portable - a combination of three electronic instruments: a mixed signal oscilloscope (simultaneously sampling of 2 analog/8-bit/200kHz and 8 digital/1MHz signals), an arbitrary waveform generator and a protocol sniffer.

Read full story

Signal Analyser Upgrade Lifts Analysis Bandwidth to 160MHz

Signal Analyser Upgrade Lifts Analysis Bandwidth to 160MHz

Agilent Technologies has enhanced its midrange N9020A MXA X-Series signal analyser. New options for 160MHz analysis bandwidth and real-time spectrum analyser (RTSA) capability address the challenges of measuring interference in the next generation of heterogeneous wireless networks. The options can be included in new MXAs or added to existing units.

Read full story

Mid-Range Vector Network Analysers Cover 100KHz to 40GHz

Mid-Range Vector Network Analysers Cover 100KHz to 40GHz

Rhode & Schwarz has launched the mid-range R&S ZNB20 and R&S ZNB40 vector network analysers for frequency ranges from 100 kHz to 20 GHz and from 1 MHz to 40GHz. The analysers are equipped with two test ports and offer measurement characteristics that are on a similar level as high-end instruments.

Read full story

Semiconductor Device Analyser Enhancements Speed Pulse Measurement

Agilent Technologies has unveiled source/monitor unit (SMU) and software enhancements to its B1500A semiconductor device analyser. The B1514A 50µs pulse medium-current SMU gives a faster pulse at 30V/1A range plus oscilloscope-like viewing. The B1511B medium-power SMU delivers 0.1fA low-current measurement capability at a lower price with an optional atto-sense switch unit.

Read full story

Measurement Option Upgrades Spectrum Analyser to Real-Time Operation

A new measurement option from Rohde & Schwarz for the R&S FSW high-end signal and spectrum analyser supports real-time signal analysis for frequencies up to 50 GHz with an analysis bandwidth of 160 MHz. It enables the detection of interfering signals to the exact level and without gaps, using a single, fast measuring instrument.

Read full story

GOEPEL electronic supports Energy Micro’s Wonder Gecko MCU with new VarioTAP Emulation Test & Debug libraries

GOEPEL electronic supports Energy Micro’s Wonder Gecko MCU with new VarioTAP Emulation Test & Debug libraries

VarioTAP technology increases test coverage for the latest ARM Cortex-M4 with FPU EFM32 Wonder Gecko microcontrollers. Energy Micro announces the immediate availability of emulation support for its latest EFM32 Wonder Gecko MCU with new VarioTAP model libraries from GOEPEL electronic.

Read full story

8-Channel Temperature Measurement Device In An M2 Enclosure

8-Channel Temperature Measurement Device In An M2 Enclosure

IPETRONIK upgrades the second generation of its M-Series CAN modules by adding M-THERMO2, an 8-channel temperature measurement device connectable to K-Type Thermocouples (NiCr/NiAl). The redesigned M2-Series enclosure uses reduced dimensions of 106 mm x 30 mm x 50 mm (W x H x D) and is designed for use in the engine compartment supporting IP67 protection class, as well as the extended temperature range of -40 °C to +125 °C. A supply voltage in the range of 9 VDC to 36 VDC is required. Typical power consumption is 1.1 W.

Read full story

Chokes test appliance switches to international standards

Chokes test appliance switches to international standards

REO has designed and manufactured chokes for testing switches in domestic applications to the international BS EN 61058-2-1 and BS EN 60669-2-1 standards. BS EN 61058-2-1 applies to switches for appliances with particular requirements for cord switches, while BS EN 60669-2-1 covers switches for household and similar fixed electrical installations with particular requirements of electronic switches.

Read full story

GL Announces MFC-R2 Signaling Emulation

GL Communications announced today the release of its latest product MFC-R2 Signaling Emulation using its MAPS Platform. Speaking to reporters, Mr. Vijay Kulkarni CEO of the company said, "E1 Multi-Frequency Compelled R2 signaling is a Channel Associated Signaling protocol used over E1 signaling networks.

Read full story

Spirent Launches Performance Measurement System for HD Voice and Voice over LTE

Spirent Communications today announced the launch of Spirent Nomad HD call and voice measurement system. As VoLTE deployments ramp up, and early device support for the technology varies in implementation and performance, Nomad HD provides critical voice quality analysis for HD voice and VoLTE services on any device, across any network.

Read full story

Livingston Adds To Mobile Comms Test Armoury

Livingston has made a new move to establish itself as a One-Stop-Shop for all the items of hardware required when implementing mobile communication infrastructure. In addition to being a leading supplier for the rental of products like the Anritsu Site Master family, Narda personal radiation meters and Kaelus PIM testers, Livingston also offers its support in ensuring their on-going operation.

Read full story

PCB Piezotronics Announce Triax MEMS High-G Shock Accelerometer

PCB Piezotronics Announce Triax MEMS High-G Shock Accelerometer

PCB Piezotronics has launched a new state-of-the-art triax MEMS shock accelerometer capable of measuring up to 60,000g. Designed for shock testing, the new PCB series 3503A1060KG features three single-crystal silicon MEMS sensing elements and represents the state-of-the-art industry technology for miniature, high-amplitude, DC response acceleration sensors.

Read full story

GOEPEL unveils CION LX JTAG transceiver IC

GOEPEL unveils CION LX JTAG transceiver IC

GOEPEL electronic introduces CION LX, a new generation of JTAG transceiver ICs. The innovative chip provides ultra-low voltage characteristics, offering a tester-per-pin architecture based on diverse Boundary Scan standards such as IEEE 1149.1IEEE 1149.6 and IEEE 1149.8.1, in combination with additional digital and analogue test instruments.

Read full story

IPETRONIK now provides a new 4-Channel Analog Input Device for Voltage and Sensor based Measurements

IPETRONIK now provides a new 4-Channel Analog Input Device for Voltage and Sensor based Measurements

IPETRONIK upgrades the second generation of its proven M-Series by adding the new M-SENS2 a 4-channel analog input device with direct CAN bus output. The new module is compatible with the previous M-SENS and provides the same type and number of measurement ranges.

Read full story

Protocol Analyser Supports 16G Fibre Channel and 10Gbps Ethernet protocols

Protocol Analyser Supports 16G Fibre Channel and 10Gbps Ethernet protocols

Teledyne LeCroy has added the SierraNet M168 and its new FlexPort Technology to the SierraNet product family. The SierraNet M168 is an 8-port multi-protocol analyser and error injector supporting up to 16G Fibre Channel and 10Gbps Ethernet protocols. FlexPort and 40Gbps Ethernet analysis and error injection capabilities have been added to the SierraNet M408.

Read full story

Agilent Technologies Introduces OpenLAB Data Store for Mass Spectrometry

Agilent Technologies today announced OpenLAB Data Store for MS, a simple and affordable networked solution for compliant storage of mass spectral data acquired with Agilent's ICP-MS MassHunter system. The software is designed for medium to small laboratories measuring inorganic impurities in pharmaceutical products and ingredients in accordance with upcoming specifications from the United States Pharmacopoeia.

Read full story

Customised ATE Based on Programmable Power Supplies

National Instruments has announced its newest general-purpose programmable power supplies, which offer the highest power density available in PXI and form the foundation of automated test systems. The NI PXIe-4112 and NI PXIe-4113 modules provide high power density that saves rack space while simplifying design by eliminating the need to mix multiple instrumentation form factors.

Read full story

Jitter Analysis Option Enhances Oscilloscope Performance

Jitter measurements are important when developing circuits with serial high-speed data interfaces such as USB 2.0 and HDMI. One particular challenge is the signal's embedded clock that is used as a time reference. Rohde & Schwarz has addressed this requirement with new options for its R&S RTO high-performance oscilloscope.

Read full story

RF Signal Generator Tests Components to Latest Standards

RF Signal Generator Tests Components to Latest Standards

Aeroflex's new generation of wide bandwidth RF signal generators and analysers in PXI format with class-leading performance enable a high performance, flexible, and cost effective solution for RF component and wireless device testing to the latest standards, including WLAN 802.11ac. The PXI 3050A low noise RF signal generator and the PXI 3320 arbitrary waveform generator (AWG) are used together to provide a fully configurable RF signal generator with wide bandwidth vector modulation, low phase noise, and fast frequency and level settling.

Read full story

Teledyne LeCroy Announces Flexible Storage and Network Test Solutions for 8/16G Fibre Channel and 10/40G Ethernet

Teledyne LeCroy today announced the addition of the SierraNet M168 and its new FlexPort Technology to the SierraNet product family. The SierraNet M168 is an 8-port multi-protocol analyzer and error injector supporting up to 16G Fibre Channel and 10Gbps Ethernet protocols.

Read full story

LXI For Collider Signal Monitoring At CERN

LXI For Collider Signal Monitoring At CERN

The Large Hadron Collider at the European Organisation for Nuclear Research, known as CERN, has come to the forefront of public attention recently with the discovery of the Higgs boson – the so called God's particle. CERN operates a high energy collider 100m under the Swiss and French border near Geneva to explore the boundaries of high energy physics. It is high energy physics on a huge scale, matched by no other facility in the world.

Read full story

Serial-Bus Testing Added to Eight-Channel Oscilloscopes

Serial-Bus Testing Added to Eight-Channel Oscilloscopes

A number of new enhancements have been introduced to the Yokogawa DLM4000 Series of 8-channel mixed-signal oscilloscopes. These include the L16 option, which adds 16 extra channels of logic, plus upgraded firmware for power measurements and serial-bus testing.

Read full story

Agilent Technologies Announces Analysis Software for USB Protocol Analyzers

Agilent Technologies Announces Analysis Software for USB Protocol Analyzers

Agilent Technologies today announced a new analysis software suite for the U4611A, U4611B and U4612A family of USB protocol analyzers. The suite features the new MegaZoom technology, offering USB device designers quick and easy insight into their designs' behavior, and streamlining USB test and validation.

Read full story

The Threat Of Instability

The Threat Of Instability

Addressing one of the most difficult reliability challenges facing the semiconductor manufacturing community today. By Christopher L. Henderson, President of Semitracks Inc,. This ES Design magazine article is based on a white paper, with editorial contributions by Peter J. Hulbert and David W. Rose of Keithley Instruments.

Read full story

Seeking A Test Panacea

Seeking A Test Panacea

Testing electronic circuits has been a key topic in the industry since the first transistor was developed, and today it is as relevant as ever. But how close to the ideal solution can developers get? By Thomas Wenzel, Co-Founder and Managing Director GOEPEL electronic GmbH in Jena/Germany, and Heiko Ehrenberg, President, North American operations, GOEPEL electronics LLC in Austin, TX/USA.

Read full story

Improving Detection With Future Protection

Improving Detection With Future Protection

Delivering future-proof innovation to the most demanding customer-base requires the adoption of the best-in-class solutions. By Stephane Monboisset, Senior Manager, Processing Platforms Product Marketing for Xilinx, and Peter Stemer, R&D Section Manager System Control for Agilent Life Science.

Read full story

digitizerNETBOX – Ethernet/LXI digitizer solution

digitizerNETBOX – Ethernet/LXI digitizer solution

The digitizerNETBOX is the first model of the all-new product line easy instruments at Spectrum. These products are aimed at both industrial users, as well as users of research and development, which were to focus primarily on their measurement applications.

Read full story

PCI Express Protocol Analysis Costs Less Than €5,000

PCI Express Protocol Analysis Costs Less Than €5,000

Teledyne LeCroy announce its most cost-effective PCI Express protocol analyzer with interchangeable interposers for probing. The new compact but feature-packed Summit T24 Protocol Analyzer features a small chassis footprint while maintaining the same data analysis features found in the top-of-the-line Summit T3-16 protocol analyzer. The Summit T24 protocol analyzer supports PCIe data transmission rates up to 5 GT/s and data lane widths up to x4 in a single compact unit.

Read full story

Saelig Announce 6GHz Counter-Timer With Low Cost And High Resolution

Saelig Announce 6GHz Counter-Timer With Low Cost And High Resolution

Saelig unveil an economical 6GHz bench/portable frequency counter, the TF960. It features a high quality temperature compensated internal frequency reference which has a low ageing rate and is stable to within ±1ppm over the full temperature range. Its short warm-up time allows accurate measurements to be made even under portable battery powered conditions.

Read full story

New Flexible Resolution Oscilloscopes From Pico Technology

New Flexible Resolution Oscilloscopes From Pico Technology

For the first time in an oscilloscope, Pico Technology has used reconfigurable ADC technology to offer a choice of resolutions from 8 to 16 bits in a single product. Most digital oscilloscopes gain their high sampling rates by interleaving multiple 8-bit ADCs. Despite careful design, the interleaving process introduces errors that always make the dynamic performance worse than the performance of the individual ADC cores.

Read full story

Getting To The Heart Of The Problem

Getting To The Heart Of The Problem

In this article from ES Design Magazine, Daniel Ruebusch of Agilent asks: How do you test and debug a device with hundreds of thousands of internal logic cells and transceiver speeds up to 28Gbit/s? Such is the challenge facing designers employing today's industry leading FPGAs.

Read full story

Page  1 of 47  (First | Last)
Go To Page  1   11   21   31   41  
Page  1   2   3   4   5   6   7   8   9   10   11   12   13   14   15   16   17   18   19   20   21   22   23   24   25   26   27   28   29   30   31   32   33   34   35   36   37   38   39   40   41   42   43   44   45   46   47  
Powered by Rochester Electronics

Search for factory authorized mature and end-of-life semiconductors

Part Search:

© Copyright ElectronicSpecifier - Electronics News
Web Design Surrey, hosting & Technology: Strategies Group Plc