Optimizing for Test Cell Throughput: Multitest’s MT2168 Fully Leverages Advanced Tester Capabilities
News Release from:
Multitest elektronische Systeme GmbH
13 June 2011
Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its MT2168 is designed for best tester utilization. Short index time (DUT exchange time), fast loading and sorting, and a high soak capacity support the handler to keep pace with the new tester generation.
Ideally, with no handler limitations, the enhanced tester capabilities allow the optimization of test cell throughput in two ways: shorter test times and the use of higher parallelism.
Current state-of-the-art handlers cannot follow enhanced tester capabilities even if they offer a corresponding number of contact sites. Thus, possible throughput advantages are capped by the maximum handler throughput determined by the speed for loading, soaking and sorting.
Increasing the number of contact sites (parallelism) will respond directly to the enhanced tester capability of testing more devices simultaneously. Increasing parallelism is sufficient only as long as the handler’s maximum capacity for loading and sorting is not reached. Otherwise, it will be offset by longer loading and sorting times. In any case, the handling speed needs to be improved to benefit from shorter test times. The same is true for the needed soaking capacity to fully leverage the higher parallelism and shorter test time.
The MT2168 is designed to fully leverage the tester’s capabilities. This next generation test handler is not only optimized for single parameters (parallelism and speed), but synchronized internally with respect to the number of contact sites, as well as the loading, soaking and sorting capacity.