semiconductor characterization, Parametric Test, Keithley Instruments

White Paper Describes Semiconductor Characterization and Parametric Test Challenges

News Release from: Keithley Instruments GmbH
24 March 2009

Keithley Instruments has published a white paper on how semiconductor characterization and parametric test solutions are evolving to keep pace with rapid changes in the semiconductor industry. The white paper, which can be downloaded at www.keithley.com/navigate, describes the emerging technology and business dynamics affecting the industry, including the growing need for vendor support.

It also addresses the emerging market forces that are shaping the test solutions Keithley is offering the industry, including the rising demand for non-volatile memory, larger data sets, increased device reliability testing, the interest in power conversion/efficiency devices, and the test requirements associated with new semiconductor materials.

The white paper also describes Keithley’s solutions for these semiconductor test challenges, including:

· Series 2600A System SourceMeter Instruments
· Model 4200-SCS Semiconductor Characterization Systems
· Automated Characterization Suite (ACS) Systems
· Other high-speed, high-accuracy instruments