Anritsu Introduces High-Frequency Sampling Oscilloscope Probe
News Release from:
Anritsu EMEA Limited
14 July 2011
Anritsu Company introduced the J1512A Passive Probe for its BERTWave MP2100A BERT and EYE/Pulse Scope solution. Also compatible with GHz-band sampling oscilloscopes, the J1512A simplifies monitoring and confirming the signal levels and waveforms of mounted electronic devices without on-board coaxial connectors, such as SMA connectors, which allow engineers to more efficiently verify the designs of their high-speed digital communications equipment and devices.
Covering the DC to 7.5 GHz frequency band, the J1512A Passive Probe has low input capacitance of 0.5 pF (max.), so the probe supports monitoring of high-speed signal waveforms. In addition, the J1512A Passive Probe attenuation ratio can be switched between 10:1 and 20:1 by changing the resistance, to optimize the measurement condition. Accurate evaluation of high-frequency circuits is further assured by the short ground lead with excellent elasticity of the J1512A.
By adding this high-frequency probe to the MP2100A series, developers and manufacturers have a highly efficient and accurate test solution to verify the performance of high-speed equipment and devices used in Next Generation Networks (NGNs). The BERTWave MP2100A is an all-in-one instrument for BER, eye and pulse pattern measurements and analyses. Since it performs BER measurements and eye pattern analysis simultaneously, it greatly shortens measurement times. The single-instrument solution is ideal for both R&D and manufacturing tests because it increases efficiency and cuts measurement costs by eliminating time-consuming setup.