Aeroflex introduces LTE signal fading simulator for affordable, repeatable, reliable profiling of mobile handsets
News Release from:
Aeroflex Test Solutions
09 February 2010
To speed up real-world testing of mobile handsets for LTE networks ahead of network deployment, Aeroflex is introducing the first one-box test system for cell phone signal fading simulation. Integrated within the 7100 Series digital radio test set, the new fading simulator option offers RF engineers an inexpensive and reliable baseband tool for signal fading profiling, a requirement for LTE (Long Term Evolution) certification.
“Until now, testing and simulating LTE fading profiles meant buying and cabling together two separate test instruments. By integrating the LTE fading simulator into the 7100 Series, Aeroflex will save customers tens of thousands of euros in purchasing additional test equipment and circumvent potential calibration errors that cause faulty test results. In addition, confidence is boosted by the repeatability of the fading profiles,” said Phil Medd, product manager, Aeroflex Test Solutions.
Fading simulators, combined with noise generators, modify RF signals transmitted by the LTE system simulator (in this case the 7100 Series) and emulate degradations introduced into the radio channel by real-life obstacles such as buildings and foliage. For LTE developers who must profile signal fading on mobile handsets to meet 3GPP requirements before a network is available, the 7100 Series fading simulator allows engineers to perform realistic signal fading simulations in a reliable and repeatable lab environment.
LTE adoption driving demand for accurate fading profiles
As the world’s cellular network operators work towards adopting LTE, the demand is growing to meet all of the LTE requirements, including fading profiles specified by 3GPP in 36-521-1. The Aeroflex 7100 Series test platform provides fading simulation that meets or exceeds all 3GPP requirements, as well as an unprecedented degree of flexibility in allocating cells and fading taps for LTE user equipment (UE) without the need for manual reconfiguration. The fully repeatable test scenarios presented by the 7100 Series with the fading simulator include the emulation of dynamic environments and realistic and accurate testing of MIMO (multiple-input/multiple output) scenarios.
Supports LTE now and in the future
RF engineers, system integrators, and regression test engineers need to be ready to test new frequency allocations for LTE features at any time. With the LTE future in mind, the 7100 Series fading simulator supports all LTE bandwidths to 20 MHz with a frequency range up to 6 GHz. The Aeroflex fading simulator supports all 3GPP fading profiles, allowing users to determine if their device conforms to 3GPP test specifications.