Advantest, V93000, 100, ship, deliver
Advantest Ships 100th V93000 Smart Scale Test System in Product Line’s First 10 Months
News Release from:
Advantest Europe GmbH
31 May 2012
Just ten months after launching its Smart Scale generation of testers, Advantest Corporation has shipped its 100th V93000 Smart Scale system, capable of scalable, highly cost-efficient testing of IC designs for the 28 nm technology node and beyond.
The milestone tester, which is being installed at a customer’s facility in Asia, is equipped with Advantest’s smallest A-Class test head containing 512 pins as well as a Pin Scale 1600 digital card and a MB-AV8 PLUS analog card.
“The V93000 platform’s unmatched versatility and superior ability to lower the cost of test have made it the tool of choice for testing all types of semiconductor designs, including advanced SOCs, system-in-package devices, wafer-level chip-scale packages, RF-based semiconductors for mobile applications and 3D device architectures,” said Saebum Myung, Executive Vice President of Worldwide Sales at Advantest Corporation. “The V93000’s per-pin capabilities such as individual clock domain, high-accuracy DC and industry-leading digital performance can be further enhanced with the Pin Scale 1600 card, which offers the widest scale of capabilities on each digital channel.”
Advantest’s V93000 test platform and pin cards incorporate a universal per-pin architecture to provide the most cost-efficient test solution for advanced semiconductor designs. Equipped with the company’s Pin Scale 1600 digital channel cards, the scalable V93000 delivers maximum flexibility by performing any function needed by the device under test. The system’s innovative technology enables each pin to run with its own clock domain, providing full test coverage by matching the exact data rate requirements of the device under test. Coupled with other key features such as power supply modulation, jitter injection and protocol communication, the V93000 platform can perform system-like-stress testing at the ATE level, improving fault-model coverage.
For testing RF devices, the MB-AV8 PLUS analog card expands real-time analog bandwidth to cover emerging applications such as LTE Advanced for 4G wireless communications. It provides high throughput while maintaining compatibility with established MB-AV8 instruments.
In addition to the Smart Scale generation’s 2X performance stepping in almost all areas, these testers substantially reduce the cost of test for low-end devices by using higher CMOS integration to double the number of channels per board. Equipped with an A-Class test head, Pin Scale 1600 card and MB-AV8 PLUS card, the V93000 Smart Scale system offers the most economical test solutions for consumer devices.