Keithley Online Seminar Shows How to Test High Power Devices More Efficiently
News Release from:
Keithley Instruments GmbH
16 May 2012
Keithley Instruments, Inc. will webcast a free, online technical seminar titled "Fundamentals of High Power Semiconductor Device Testing" on Thursday, May 24 at 15:00 CEST. In recent years, there has been a surge of interest in the development of power semiconductor devices to meet the demands of more efficient, higher power end products.
To improve efficiency, researchers have focused on refining certain key device parameters, and accurate testing of these parameters is needed to enable continuous improvement in device design.
During this seminar, Keithley staff applications engineer Jennifer Cheney will present a broad overview of power devices and consider the motivation behind the swell in research concerning these devices, how the device parameters affect the efficiency of the end product, and what’s being done to serve the needs of power device designers and test engineers.
Participants of the seminar, which is recommended for device designers, test engineers, test engineering managers, and students who are facing the need to test power semiconductor discrete devices, will learn:
•How governmental standards and industrial compliance programs have spurred research in development of more efficient power semiconductors
•Devices that make up the building blocks of power management modules
•Key parameters of diodes, MOSFETs, and BJTs that determine end product efficiency
•Solutions for testing the key power device parameters
•The motivation for looking at advanced materials in the creation of power devices