GOEPEL to demonstrate Embedded System Access Technologies at ITC

GOEPEL electronics demonstrates Embedded System Access Technologies at ITC

News Release from: GOEPEL electronic
30 October 2012

At this year's International Test Conference (ITC) in Anaheim, CA, taking place November 4th to November 9th, GOEPEL electronics LLC will present its strategic realignment in regards to testing, programming, validation, and functional verification at chip, board, and system level, under the umbrella of Embedded System Access (ESA).

GOEPEL electronics demonstrates Embedded System Access Technologies at ITC At booth #304 the company will demonstrate a new class of tools and technologies for JTAG/Boundary Scan, chip-embedded instrumentation, in-system programming, and processor emulation tests, providing new opportunities to increase test coverage, diagnostics, and programming speed.

Innovative technologies such as VarioTAP and ChipVORX provide new means to support applications such as processor-assisted and FPGA-assisted test and programming, as well as future standards such as IEEE P1687 (IJTAG) and system JTAG (SJTAG). Compared to traditional test methodologies such as those based on nail probe access, embedded system access presents a paradigm shift and is GOEPEL electronics’ response to changing requirements on test and programming strategies and to reduced test access with traditional methodologies.

In addition, GOEPEL electronics announces joint developments with SiliconAid Solutions in the area of chip level debugging in board and system environments. GOEPEL electronics and SiliconAid personnel will be present during ITC exhibit hours at booth #304 to discuss details of these developments and the benefits of leveraging both technologies together.